ISTFA 2008: conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA
Gespeichert in:
Körperschaft: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Materials Park, OH
Asm International
c2008
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Schlagworte: | |
Beschreibung: | Includes bibliographical references and index |
Beschreibung: | 1 Online-Ressource (xx, 528 p.) |
ISBN: | 0871707144 9780871707147 |
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245 | 1 | 0 | |a ISTFA 2008 |b conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International |
246 | 1 | 3 | |a Proceedings of the 34th International Symposium for Testing and Failure Analysis |
246 | 1 | 3 | |a 34th International Symposium for Testing and Failure Analysis |
246 | 1 | 3 | |a Thirty-fourth International Symposium for Testing and Failure Analysis |
264 | 1 | |a Materials Park, OH |b Asm International |c c2008 | |
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500 | |a Includes bibliographical references and index | ||
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650 | 4 | |a Electronics / Materials / Testing / Congresses | |
650 | 4 | |a Electronic apparatus and appliances / Testing / Congresses | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
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Datensatz im Suchindex
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any_adam_object | |
author_corporate | International Symposium for Testing and Failure Analysis < 2008, Portland, Or.> |
author_corporate_role | aut |
author_facet | International Symposium for Testing and Failure Analysis < 2008, Portland, Or.> |
author_sort | International Symposium for Testing and Failure Analysis < 2008, Portland, Or.> |
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bvnumber | BV040886004 |
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ctrlnum | (OCoLC)503446669 (DE-599)BVBBV040886004 |
dewey-full | 621.381 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.381 |
dewey-search | 621.381 |
dewey-sort | 3621.381 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Electronic eBook |
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institution | BVB |
isbn | 0871707144 9780871707147 |
language | English |
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spelling | International Symposium for Testing and Failure Analysis < 2008, Portland, Or.> Verfasser aut ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International Proceedings of the 34th International Symposium for Testing and Failure Analysis 34th International Symposium for Testing and Failure Analysis Thirty-fourth International Symposium for Testing and Failure Analysis Materials Park, OH Asm International c2008 1 Online-Ressource (xx, 528 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Online-Ausgabe Available via World Wide Web Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth ebrary, Inc Sonstige oth Reproduktion von International Symposium for Testing and Failure Analysis < 2008, Portland, Or.>, ISTFA 2008 c2008 |
spellingShingle | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses |
subject_GND | (DE-588)1071861417 |
title | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA |
title_alt | Proceedings of the 34th International Symposium for Testing and Failure Analysis 34th International Symposium for Testing and Failure Analysis Thirty-fourth International Symposium for Testing and Failure Analysis |
title_auth | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA |
title_exact_search | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA |
title_full | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International |
title_fullStr | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International |
title_full_unstemmed | ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International |
title_short | ISTFA 2008 |
title_sort | istfa 2008 conference proceedings from the 34th international symposium for testing and failure analysis november 2 6 2008 oregon convention center portland oregon usa |
title_sub | conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA |
topic | Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses |
topic_facet | Electronics / Materials / Testing / Congresses Electronic apparatus and appliances / Testing / Congresses Konferenzschrift |
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