Scanning electron microscope optics and spectrometers:
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Singapore
World Scientific Pub. Co.
2011
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Schlagworte: | |
Online-Zugang: | TUM01 Volltext |
Beschreibung: | Includes bibliographical references and index |
Beschreibung: | 1 Online-Ressource (xiii, 402 p.) |
ISBN: | 9781283143554 |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
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001 | BV040798568 | ||
003 | DE-604 | ||
005 | 20160624 | ||
007 | cr|uuu---uuuuu | ||
008 | 130305s2011 |||| o||u| ||||||eng d | ||
020 | |a 9781283143554 |c ebook |9 9781283143554 | ||
035 | |a (OCoLC)934986250 | ||
035 | |a (DE-599)BVBBV040798568 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-91 | ||
084 | |a PHY 135f |2 stub | ||
100 | 1 | |a Khursheed, Anjam |e Verfasser |4 aut | |
245 | 1 | 0 | |a Scanning electron microscope optics and spectrometers |c Anjam Khursheed |
264 | 1 | |a Singapore |b World Scientific Pub. Co. |c 2011 | |
300 | |a 1 Online-Ressource (xiii, 402 p.) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
500 | |a Includes bibliographical references and index | ||
650 | 4 | |a Scanning electron microscopes | |
650 | 4 | |a Optical spectrometers | |
650 | 0 | 7 | |a Rasterelektronenmikroskop |0 (DE-588)4124024-8 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Rasterelektronenmikroskop |0 (DE-588)4124024-8 |D s |
689 | 0 | |5 DE-604 | |
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Datensatz im Suchindex
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any_adam_object | |
author | Khursheed, Anjam |
author_facet | Khursheed, Anjam |
author_role | aut |
author_sort | Khursheed, Anjam |
author_variant | a k ak |
building | Verbundindex |
bvnumber | BV040798568 |
classification_tum | PHY 135f |
collection | ZDB-26-MYL |
ctrlnum | (OCoLC)934986250 (DE-599)BVBBV040798568 |
discipline | Physik |
format | Electronic eBook |
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id | DE-604.BV040798568 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T00:34:07Z |
institution | BVB |
isbn | 9781283143554 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025778714 |
oclc_num | 934986250 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | 1 Online-Ressource (xiii, 402 p.) |
psigel | ZDB-26-MYL |
publishDate | 2011 |
publishDateSearch | 2011 |
publishDateSort | 2011 |
publisher | World Scientific Pub. Co. |
record_format | marc |
spelling | Khursheed, Anjam Verfasser aut Scanning electron microscope optics and spectrometers Anjam Khursheed Singapore World Scientific Pub. Co. 2011 1 Online-Ressource (xiii, 402 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Scanning electron microscopes Optical spectrometers Rasterelektronenmikroskop (DE-588)4124024-8 gnd rswk-swf Rasterelektronenmikroskop (DE-588)4124024-8 s DE-604 https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=731284 Aggregator Volltext |
spellingShingle | Khursheed, Anjam Scanning electron microscope optics and spectrometers Scanning electron microscopes Optical spectrometers Rasterelektronenmikroskop (DE-588)4124024-8 gnd |
subject_GND | (DE-588)4124024-8 |
title | Scanning electron microscope optics and spectrometers |
title_auth | Scanning electron microscope optics and spectrometers |
title_exact_search | Scanning electron microscope optics and spectrometers |
title_full | Scanning electron microscope optics and spectrometers Anjam Khursheed |
title_fullStr | Scanning electron microscope optics and spectrometers Anjam Khursheed |
title_full_unstemmed | Scanning electron microscope optics and spectrometers Anjam Khursheed |
title_short | Scanning electron microscope optics and spectrometers |
title_sort | scanning electron microscope optics and spectrometers |
topic | Scanning electron microscopes Optical spectrometers Rasterelektronenmikroskop (DE-588)4124024-8 gnd |
topic_facet | Scanning electron microscopes Optical spectrometers Rasterelektronenmikroskop |
url | https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=731284 |
work_keys_str_mv | AT khursheedanjam scanningelectronmicroscopeopticsandspectrometers |