Introduction to Mixed-Signal IC Test and Measurement:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Oxford [u.a.]
Oxford Univ. Press
2012
|
Ausgabe: | 2. ed. |
Schriftenreihe: | The Oxford series in electrical and computer engineering
|
Schlagworte: | |
Beschreibung: | 1. ed. u.d.T.: Burns, Mark: An introduction to mixed signal IC test and measurement, 2001 |
Beschreibung: | 861 S. graph. Darst. |
ISBN: | 9780199796212 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV040611915 | ||
003 | DE-604 | ||
005 | 20240622 | ||
007 | t | ||
008 | 121206s2012 d||| |||| 00||| eng d | ||
020 | |a 9780199796212 |9 978-0-19-979621-2 | ||
035 | |a (OCoLC)874158191 | ||
035 | |a (DE-599)BVBBV040611915 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 1 | |a eng | |
049 | |a DE-861 |a DE-29T |a DE-92 | ||
050 | 0 | |a TK7874 | |
082 | 0 | |a 621.3815 | |
084 | |a ZN 4030 |0 (DE-625)157339: |2 rvk | ||
084 | |a ELT 359f |2 stub | ||
245 | 1 | 0 | |a Introduction to Mixed-Signal IC Test and Measurement |c Gordon W. Roberts ; Friedrich Taenzler ; Mark Burns |
250 | |a 2. ed. | ||
264 | 1 | |a Oxford [u.a.] |b Oxford Univ. Press |c 2012 | |
300 | |a 861 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a The Oxford series in electrical and computer engineering | |
500 | |a 1. ed. u.d.T.: Burns, Mark: An introduction to mixed signal IC test and measurement, 2001 | ||
650 | 4 | |a Integrated circuits -- Testing | |
650 | 4 | |a Mixed signal circuits -- Testing | |
650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
689 | 0 | 1 | |a Testen |0 (DE-588)4367264-4 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Roberts, Gordon W. |d 1959- |e Sonstige |0 (DE-588)17410829X |4 oth | |
700 | 1 | |a Taenzler, Friedrich J. |d 1960- |e Sonstige |0 (DE-588)172773296 |4 oth | |
700 | 1 | |a Burns, Mark |e Sonstige |4 oth |
Datensatz im Suchindex
_version_ | 1805078496301547520 |
---|---|
adam_text | |
any_adam_object | |
author_GND | (DE-588)17410829X (DE-588)172773296 |
building | Verbundindex |
bvnumber | BV040611915 |
callnumber-first | T - Technology |
callnumber-label | TK7874 |
callnumber-raw | TK7874 |
callnumber-search | TK7874 |
callnumber-sort | TK 47874 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | ZN 4030 |
classification_tum | ELT 359f |
ctrlnum | (OCoLC)874158191 (DE-599)BVBBV040611915 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | 2. ed. |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV040611915</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20240622</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">121206s2012 d||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780199796212</subfield><subfield code="9">978-0-19-979621-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)874158191</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV040611915</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="1" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-861</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-92</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 359f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Introduction to Mixed-Signal IC Test and Measurement</subfield><subfield code="c">Gordon W. Roberts ; Friedrich Taenzler ; Mark Burns</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Oxford [u.a.]</subfield><subfield code="b">Oxford Univ. Press</subfield><subfield code="c">2012</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">861 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">The Oxford series in electrical and computer engineering</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">1. ed. u.d.T.: Burns, Mark: An introduction to mixed signal IC test and measurement, 2001</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits -- Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mixed signal circuits -- Testing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Roberts, Gordon W.</subfield><subfield code="d">1959-</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)17410829X</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Taenzler, Friedrich J.</subfield><subfield code="d">1960-</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)172773296</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Burns, Mark</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield></record></collection> |
id | DE-604.BV040611915 |
illustrated | Illustrated |
indexdate | 2024-07-20T06:30:00Z |
institution | BVB |
isbn | 9780199796212 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-025439464 |
oclc_num | 874158191 |
open_access_boolean | |
owner | DE-861 DE-29T DE-92 |
owner_facet | DE-861 DE-29T DE-92 |
physical | 861 S. graph. Darst. |
publishDate | 2012 |
publishDateSearch | 2012 |
publishDateSort | 2012 |
publisher | Oxford Univ. Press |
record_format | marc |
series2 | The Oxford series in electrical and computer engineering |
spelling | Introduction to Mixed-Signal IC Test and Measurement Gordon W. Roberts ; Friedrich Taenzler ; Mark Burns 2. ed. Oxford [u.a.] Oxford Univ. Press 2012 861 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier The Oxford series in electrical and computer engineering 1. ed. u.d.T.: Burns, Mark: An introduction to mixed signal IC test and measurement, 2001 Integrated circuits -- Testing Mixed signal circuits -- Testing Testen (DE-588)4367264-4 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s Testen (DE-588)4367264-4 s DE-604 Roberts, Gordon W. 1959- Sonstige (DE-588)17410829X oth Taenzler, Friedrich J. 1960- Sonstige (DE-588)172773296 oth Burns, Mark Sonstige oth |
spellingShingle | Introduction to Mixed-Signal IC Test and Measurement Integrated circuits -- Testing Mixed signal circuits -- Testing Testen (DE-588)4367264-4 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
subject_GND | (DE-588)4367264-4 (DE-588)4027242-4 |
title | Introduction to Mixed-Signal IC Test and Measurement |
title_auth | Introduction to Mixed-Signal IC Test and Measurement |
title_exact_search | Introduction to Mixed-Signal IC Test and Measurement |
title_full | Introduction to Mixed-Signal IC Test and Measurement Gordon W. Roberts ; Friedrich Taenzler ; Mark Burns |
title_fullStr | Introduction to Mixed-Signal IC Test and Measurement Gordon W. Roberts ; Friedrich Taenzler ; Mark Burns |
title_full_unstemmed | Introduction to Mixed-Signal IC Test and Measurement Gordon W. Roberts ; Friedrich Taenzler ; Mark Burns |
title_short | Introduction to Mixed-Signal IC Test and Measurement |
title_sort | introduction to mixed signal ic test and measurement |
topic | Integrated circuits -- Testing Mixed signal circuits -- Testing Testen (DE-588)4367264-4 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
topic_facet | Integrated circuits -- Testing Mixed signal circuits -- Testing Testen Integrierte Schaltung |
work_keys_str_mv | AT robertsgordonw introductiontomixedsignalictestandmeasurement AT taenzlerfriedrichj introductiontomixedsignalictestandmeasurement AT burnsmark introductiontomixedsignalictestandmeasurement |