Atomic force microscopy: understanding basic modes and advanced applications
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Hoboken, NJ
Wiley
2012
|
| Subjects: | |
| Online Access: | Publisher description |
| Item Description: | Includes bibliographical references |
| Physical Description: | XXII, 464 S. Ill., graph. Darst. |
| ISBN: | 9780470638828 |
Staff View
MARC
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Record in the Search Index
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| isbn | 9780470638828 |
| language | English |
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| spelling | Haugstad, Greg 1963- Verfasser (DE-588)1027424546 aut Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad Hoboken, NJ Wiley 2012 XXII, 464 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Includes bibliographical references Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Erscheint auch als Online-Ausgabe Atomic force microscopy (DE-604)BV040766016 http://www.loc.gov/catdir/enhancements/fy1210/2012003429-d.html Publisher description |
| spellingShingle | Haugstad, Greg 1963- Atomic force microscopy understanding basic modes and advanced applications Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 |
| title | Atomic force microscopy understanding basic modes and advanced applications |
| title_auth | Atomic force microscopy understanding basic modes and advanced applications |
| title_exact_search | Atomic force microscopy understanding basic modes and advanced applications |
| title_full | Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad |
| title_fullStr | Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad |
| title_full_unstemmed | Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad |
| title_short | Atomic force microscopy |
| title_sort | atomic force microscopy understanding basic modes and advanced applications |
| title_sub | understanding basic modes and advanced applications |
| topic | Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Atomic force microscopy Rasterkraftmikroskopie |
| url | http://www.loc.gov/catdir/enhancements/fy1210/2012003429-d.html |
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