APA-Zitierstil (7. Ausg.)

(2012). Process Variations and Probabilistic Integrated Circuit Design. Springer New York. https://doi.org/10.1007/978-1-4419-6621-6

Chicago-Zitierstil (17. Ausg.)

Process Variations and Probabilistic Integrated Circuit Design. New York, NY: Springer New York, 2012. https://doi.org/10.1007/978-1-4419-6621-6.

MLA-Zitierstil (9. Ausg.)

Process Variations and Probabilistic Integrated Circuit Design. Springer New York, 2012. https://doi.org/10.1007/978-1-4419-6621-6.