Microelectronics failure analysis: desk reference
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
Materials Park, Ohio
ASM International
2011
|
| Edition: | 6. ed. |
| Subjects: | |
| Online Access: | Volltext |
| Item Description: | Includes bibliographical references and index. |
| Physical Description: | 1 Online-Ressource (677 S.) ill. |
| ISBN: | 9781613447598 9781615037254 161503725X |
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MARC
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| 245 | 1 | 0 | |a Microelectronics failure analysis |b desk reference |c ed. by Richard J. Ross |
| 250 | |a 6. ed. | ||
| 264 | 1 | |a Materials Park, Ohio |b ASM International |c 2011 | |
| 300 | |a 1 Online-Ressource (677 S.) |b ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index. | ||
| 650 | 4 | |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Microelectronics |x Materials |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Microelectronics |x Materials |x Defects |v Handbooks, manuals, etc | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Semiconductors |x Defects |v Handbooks, manuals, etc | |
| 700 | 1 | |a Ross, Richard J. |e Sonstige |4 oth | |
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Record in the Search Index
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| bvnumber | BV040096562 |
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| callnumber-sort | TK 47871 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| collection | ZDB-10-ESC ZDB-10-NNT |
| ctrlnum | (OCoLC)873905783 (DE-599)BVBBV040096562 |
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| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 6. ed. |
| format | Electronic eBook |
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| id | DE-604.BV040096562 |
| illustrated | Illustrated |
| indexdate | 2024-07-31T01:14:34Z |
| institution | BVB |
| isbn | 9781613447598 9781615037254 161503725X |
| language | English |
| lccn | 2012359075 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-024953224 |
| oclc_num | 873905783 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 1 Online-Ressource (677 S.) ill. |
| psigel | ZDB-10-ESC ZDB-10-NNT |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | ASM International |
| record_format | marc |
| spelling | Microelectronics failure analysis desk reference ed. by Richard J. Ross 6. ed. Materials Park, Ohio ASM International 2011 1 Online-Ressource (677 S.) ill. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index. Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc Ross, Richard J. Sonstige oth http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=4859 Volltext |
| spellingShingle | Microelectronics failure analysis desk reference Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| title | Microelectronics failure analysis desk reference |
| title_auth | Microelectronics failure analysis desk reference |
| title_exact_search | Microelectronics failure analysis desk reference |
| title_full | Microelectronics failure analysis desk reference ed. by Richard J. Ross |
| title_fullStr | Microelectronics failure analysis desk reference ed. by Richard J. Ross |
| title_full_unstemmed | Microelectronics failure analysis desk reference ed. by Richard J. Ross |
| title_short | Microelectronics failure analysis |
| title_sort | microelectronics failure analysis desk reference |
| title_sub | desk reference |
| topic | Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| topic_facet | Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| url | http://www.knovel.com/web/portal/browse/display?_EXT_KNOVEL_DISPLAY_bookid=4859 |
| work_keys_str_mv | AT rossrichardj microelectronicsfailureanalysisdeskreference |