Modeling nanoscale imaging in electron microscopy:
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Bibliographic Details
Other Authors: Vogt, Thomas (Editor)
Format: Book
Language:English
Published: New York [u.a.] Springer 2012
Series:Nanostructure science and technology
Subjects:
Online Access:Inhaltsverzeichnis
Physical Description:IX, 182 S. Ill., graph. Darst.
ISBN:9781461421900
9781461421917
146142190X

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