EMF risk assessment: exposure assessment and compliance testing in complex environments
Saved in:
Bibliographic Details
Main Author: Kühn, Sven 1979- (Author)
Format: Thesis Book
Language:English
Published: Konstanz Hartung-Gorre 2010
Edition:1. ed.
Series:Series in microelectronics 205
Subjects:
Online Access:Kurzbeschreibung
Inhaltsverzeichnis
Physical Description:XXIII, 240 S. Ill., graph. Darst.
ISBN:9783866283091
3866283091

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Indexes