Gao, W. (2010). Precision nanometrology: Sensors and measuring systems for nanomanufacturing. Springer. https://doi.org/10.1007/978-1-84996-254-4
Chicago Style (17th ed.) CitationGao, Wei. Precision Nanometrology: Sensors and Measuring Systems for Nanomanufacturing. London [u.a.]: Springer, 2010. https://doi.org/10.1007/978-1-84996-254-4.
MLA (9th ed.) CitationGao, Wei. Precision Nanometrology: Sensors and Measuring Systems for Nanomanufacturing. Springer, 2010. https://doi.org/10.1007/978-1-84996-254-4.
Warning: These citations may not always be 100% accurate.