Oxidationsuntersuchungen an Einkristalloberflächen von Halbleitern und Metallen:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | German |
| Veröffentlicht: |
Berlin
1983
|
| Schlagworte: | |
| Beschreibung: | Berlin, Techn. Univ., Diss., 1982 |
| Beschreibung: | 160 S. Ill., graph. Darst. |
Internformat
MARC
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| 245 | 1 | 0 | |a Oxidationsuntersuchungen an Einkristalloberflächen von Halbleitern und Metallen |
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| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
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| 650 | 0 | 7 | |a Sauerstoff |0 (DE-588)4051803-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Oxidation |0 (DE-588)4137187-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Metalloberfläche |0 (DE-588)4169612-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiteroberfläche |0 (DE-588)4137418-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Metall |0 (DE-588)4038860-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Adsorption |0 (DE-588)4000536-7 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Sauerstoff |0 (DE-588)4051803-6 |D s |
| 689 | 0 | 1 | |a Adsorption |0 (DE-588)4000536-7 |D s |
| 689 | 0 | 2 | |a Metall |0 (DE-588)4038860-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Sauerstoff |0 (DE-588)4051803-6 |D s |
| 689 | 1 | 1 | |a Adsorption |0 (DE-588)4000536-7 |D s |
| 689 | 1 | 2 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Metall |0 (DE-588)4038860-8 |D s |
| 689 | 2 | 1 | |a Kristallfläche |0 (DE-588)4151344-7 |D s |
| 689 | 2 | 2 | |a Oxidation |0 (DE-588)4137187-2 |D s |
| 689 | 2 | |8 1\p |5 DE-604 | |
| 689 | 3 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 3 | 1 | |a Kristallfläche |0 (DE-588)4151344-7 |D s |
| 689 | 3 | 2 | |a Oxidation |0 (DE-588)4137187-2 |D s |
| 689 | 3 | |8 2\p |5 DE-604 | |
| 689 | 4 | 0 | |a Halbleiteroberfläche |0 (DE-588)4137418-6 |D s |
| 689 | 4 | 1 | |a Oxidation |0 (DE-588)4137187-2 |D s |
| 689 | 4 | |8 3\p |5 DE-604 | |
| 689 | 5 | 0 | |a Metalloberfläche |0 (DE-588)4169612-8 |D s |
| 689 | 5 | 1 | |a Oxidation |0 (DE-588)4137187-2 |D s |
| 689 | 5 | |8 4\p |5 DE-604 | |
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Datensatz im Suchindex
| _version_ | 1804143447266820097 |
|---|---|
| any_adam_object | |
| author | Hachicha, Samir |
| author_facet | Hachicha, Samir |
| author_role | aut |
| author_sort | Hachicha, Samir |
| author_variant | s h sh |
| building | Verbundindex |
| bvnumber | BV036774735 |
| classification_tum | PHY 656d |
| ctrlnum | (OCoLC)721006371 (DE-599)BVBBV036774735 |
| discipline | Physik |
| format | Book |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV036774735 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:47:48Z |
| institution | BVB |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020691510 |
| oclc_num | 721006371 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | 160 S. Ill., graph. Darst. |
| publishDate | 1983 |
| publishDateSearch | 1983 |
| publishDateSort | 1983 |
| record_format | marc |
| spelling | Hachicha, Samir Verfasser aut Oxidationsuntersuchungen an Einkristalloberflächen von Halbleitern und Metallen Berlin 1983 160 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Berlin, Techn. Univ., Diss., 1982 Halbleiter (DE-588)4022993-2 gnd rswk-swf Kristallfläche (DE-588)4151344-7 gnd rswk-swf Sauerstoff (DE-588)4051803-6 gnd rswk-swf Oxidation (DE-588)4137187-2 gnd rswk-swf Metalloberfläche (DE-588)4169612-8 gnd rswk-swf Halbleiteroberfläche (DE-588)4137418-6 gnd rswk-swf Metall (DE-588)4038860-8 gnd rswk-swf Adsorption (DE-588)4000536-7 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Sauerstoff (DE-588)4051803-6 s Adsorption (DE-588)4000536-7 s Metall (DE-588)4038860-8 s DE-604 Halbleiter (DE-588)4022993-2 s Kristallfläche (DE-588)4151344-7 s Oxidation (DE-588)4137187-2 s 1\p DE-604 2\p DE-604 Halbleiteroberfläche (DE-588)4137418-6 s 3\p DE-604 Metalloberfläche (DE-588)4169612-8 s 4\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Hachicha, Samir Oxidationsuntersuchungen an Einkristalloberflächen von Halbleitern und Metallen Halbleiter (DE-588)4022993-2 gnd Kristallfläche (DE-588)4151344-7 gnd Sauerstoff (DE-588)4051803-6 gnd Oxidation (DE-588)4137187-2 gnd Metalloberfläche (DE-588)4169612-8 gnd Halbleiteroberfläche (DE-588)4137418-6 gnd Metall (DE-588)4038860-8 gnd Adsorption (DE-588)4000536-7 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4151344-7 (DE-588)4051803-6 (DE-588)4137187-2 (DE-588)4169612-8 (DE-588)4137418-6 (DE-588)4038860-8 (DE-588)4000536-7 (DE-588)4113937-9 |
| title | Oxidationsuntersuchungen an Einkristalloberflächen von Halbleitern und Metallen |
| title_auth | Oxidationsuntersuchungen an Einkristalloberflächen von Halbleitern und Metallen |
| title_exact_search | Oxidationsuntersuchungen an Einkristalloberflächen von Halbleitern und Metallen |
| title_full | Oxidationsuntersuchungen an Einkristalloberflächen von Halbleitern und Metallen |
| title_fullStr | Oxidationsuntersuchungen an Einkristalloberflächen von Halbleitern und Metallen |
| title_full_unstemmed | Oxidationsuntersuchungen an Einkristalloberflächen von Halbleitern und Metallen |
| title_short | Oxidationsuntersuchungen an Einkristalloberflächen von Halbleitern und Metallen |
| title_sort | oxidationsuntersuchungen an einkristalloberflachen von halbleitern und metallen |
| topic | Halbleiter (DE-588)4022993-2 gnd Kristallfläche (DE-588)4151344-7 gnd Sauerstoff (DE-588)4051803-6 gnd Oxidation (DE-588)4137187-2 gnd Metalloberfläche (DE-588)4169612-8 gnd Halbleiteroberfläche (DE-588)4137418-6 gnd Metall (DE-588)4038860-8 gnd Adsorption (DE-588)4000536-7 gnd |
| topic_facet | Halbleiter Kristallfläche Sauerstoff Oxidation Metalloberfläche Halbleiteroberfläche Metall Adsorption Hochschulschrift |
| work_keys_str_mv | AT hachichasamir oxidationsuntersuchungenaneinkristalloberflachenvonhalbleiternundmetallen |