APA (7th ed.) Citation

(2006). Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Springer-Verlag Berlin Heidelberg. https://doi.org/10.1007/978-3-540-28472-7

Chicago Style (17th ed.) Citation

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Berlin, Heidelberg: Springer-Verlag Berlin Heidelberg, 2006. https://doi.org/10.1007/978-3-540-28472-7.

MLA (9th ed.) Citation

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Springer-Verlag Berlin Heidelberg, 2006. https://doi.org/10.1007/978-3-540-28472-7.