APA (7th ed.) Citation

(2007). Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale. Springer Science+Business Media, LLC. https://doi.org/10.1007/978-0-387-28668-6

Chicago Style (17th ed.) Citation

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale. New York, NY: Springer Science+Business Media, LLC, 2007. https://doi.org/10.1007/978-0-387-28668-6.

MLA (9th ed.) Citation

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale. Springer Science+Business Media, LLC, 2007. https://doi.org/10.1007/978-0-387-28668-6.