High resolution x-ray scattering: from thin films to lateral nanostructures
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Bibliographic Details
Main Authors: Pietsch, Ullrich (Author), Holý, Václav 1953- (Author), Baumbach, Tilo 1961- (Author)
Format: Book
Language:English
Published: New York, NY [u.a.] Springer 2004
Edition:2nd. ed.
Subjects:
Item Description:1. Aufl. u.d.T.: High resolution x-ray scattering from thin films and multilayers
Physical Description:XVI, 408 S. Ill., graph. Darst.
ISBN:9780387400921
0387400923

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