Schachtner, R. (2010). Extensions of non-negative matrix factorization and their application to the analysis of wafer test data.
Chicago-Zitierstil (17. Ausg.)Schachtner, Reinhard. Extensions of Non-negative Matrix Factorization and Their Application to the Analysis of Wafer Test Data. 2010.
MLA-Zitierstil (9. Ausg.)Schachtner, Reinhard. Extensions of Non-negative Matrix Factorization and Their Application to the Analysis of Wafer Test Data. 2010.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.