Combinatorial pattern matching: 21st Annual Symposium, CPM 2010, New York, NY, USA, June 21 - 23, 2010 ; proceedings
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Bibliographic Details
Format: Electronic Conference Proceeding eBook
Language:English
Published: Berlin [u.a.] Springer 2010
Series:Lecture Notes in Computer Science 6129
Subjects:
Online Access:Volltext
Physical Description:1 Online-Ressource (XIII, 362 S.) Ill., graph. Darst.
ISBN:9783642135088
9783642135095
DOI:10.1007/978-3-642-13509-5

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