APA (7th ed.) Citation

Entner, R. (2010). Modeling and simulation of negative bias temperature instability: Degradation of field-effect transistors. VDM Verlag Dr. Müller.

Chicago Style (17th ed.) Citation

Entner, Robert. Modeling and Simulation of Negative Bias Temperature Instability: Degradation of Field-effect Transistors. Saarbrücken: VDM Verlag Dr. Müller, 2010.

MLA (9th ed.) Citation

Entner, Robert. Modeling and Simulation of Negative Bias Temperature Instability: Degradation of Field-effect Transistors. VDM Verlag Dr. Müller, 2010.