Noncontact atomic force microscopy: 2
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| Other Authors: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin [u.a.]
Springer
(2009)
|
| Series: | Nanoscience and technology
Nanoscience and technology Physics and astronomy online library |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | XVIII, 401 S. Ill., graph. Darst. |
| ISBN: | 9783642014949 |
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MARC
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| 020 | |a 9783642014949 |9 978-3-642-01494-9 | ||
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| 245 | 1 | 0 | |a Noncontact atomic force microscopy |n 2 |c S. Morita ... (ed.) |
| 264 | 1 | |a Berlin [u.a.] |b Springer |c (2009) | |
| 300 | |a XVIII, 401 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Nanoscience and technology | |
| 490 | 0 | |a Nanoscience and technology | |
| 490 | 0 | |a Physics and astronomy online library | |
| 700 | 1 | |a Morita, Seizō |d 1948- |0 (DE-588)123650178 |4 edt | |
| 773 | 0 | 8 | |w (DE-604)BV035787028 |g 2 |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-3-642-01945-6 |
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-018646443 | ||
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| _version_ | 1804140725631188992 |
|---|---|
| adam_text | Contents
1
Introduction
Seizo Monta
.................................................... 1
1.1
Rapidly Developing High Performance AFM
.................... 1
1.1.1
Present Status of High Performance AFM
............... 4
1.2
Future Prospects for High Performance AFM
................... 8
1.2.1
Atomic and Molecular Imaging in Liquids
............... 8
1.2.2
Magnetic Exchange Force Microscopy
.................. 8
1.2.3
Rapid Growth of Tuning Fork/qPlus Sensor
............. 11
1.2.4
Differentiation of Atomic Force
......................... 11
1.2.5
Atom-by-Atom Assembly of Complex Nanostructure at RT
12
References
...................................................... 13
2
Method for Precise Force Measurements
Masayuki Abe and Ken-ichi
Monta
................................. 15
2.1
Quantitative Force Calculation
............................... 15
2.2
Thermal Drift
.............................................. 16
2.3
Three-Fold Feedback for Precise Tip-Sample Positioning
......... 16
2.3.1
Principle of Atom-Tracking
............................ 17
2.3.2
Experimental Setup
................................... 18
2.3.3
Site-Specific Force Spectroscopy at Room Temperature
.... 20
2.4
Thermal Drift Compensation
for Force Field Mapping
..................................... 23
2.4.1
Concept of Feedforward
............................... 23
2.4.2
Force Mapping at Room Temperature with Feedforward
... 24
2.4.3
Force Mapping with Feedforward
....................... 26
2.5
Summary
.................................................. 29
References
...................................................... 29
3
Force Spectroscopy on Semiconductor Surfaces
Oscar distance, Noriaki Oyabu, and Yoshiaki Sugimoto
.............. 31
3.1
Introduction
................................................ 31
VIII Contents
3.2
Experimental
Considerations
................................. 33
3.2.1
Extraction of the Short-Range Force
from the Frequency Shift
.............................. 34
3.2.2
Determination of Relevant Acquisition Parameters
........ 36
3.3
Energy Dissipation and Force Spectroscopy
..................... 38
3.3.1
Tip-Apex Characterization Combining Force Spectroscopy
and First-Principles Calculations
....................... 38
3.3.2
Identification of an Energy Dissipation Channel
.......... 42
3.3.3
Surface Adhesion Maps at Atomic Scale
................. 45
3.3.4
Signatures of Energy Dissipation in Frequency Shift
and Force Curves
..................................... 46
3.4
Force Spectroscopy and Atomic Relaxations
.................... 48
3.5
Single Atom Chemical Identification
........................... 53
3.6
Force Spectroscopy with Higher Flexural Modes
................ 61
3.7
Summary
.................................................. 65
References
...................................................... 66
4
Tip—Sample Interactions as a Function of Distance
on Insulating Surfaces
Regina
Hoffmann
................................................ 69
4.1
Experimental Evaluation of Short-range Forces
................. 70
4.1.1
Measurement Techniques
.............................. 70
4.1.2
Conversion of Frequency Shift to Force
.................. 72
4.1.3
Separation of Short-range and Long-range Forces
......... 73
4.2
Short-range Forces on Insulating Surfaces
...................... 76
4.2.1
Simple Model for Electrostatic Forces
................... 76
4.2.2
Relaxation and Realistic Electrostatic Interactions
........ 78
4.2.3
Interaction of a Tip with a Well-known Surface
.......... 80
4.2.4
Sublattice
Identification on Alkali Halide Surfaces
........ 82
4.2.5
Full Three-Dimensional Force Field
..................... 83
4.2.6
Atomic Jumps and Energy Dissipation
.................. 86
References
...................................................... 92
5
Force Field Spectroscopy in Three Dimensions
André
Schirmeisen, Hendrik Hölscher, and Udo
D.
Schwarz........... 95
5.1
Introduction
................................................ 95
5.2 Three-Dimensional Force
Field
Spectroscopy:
The Technique
................................. 97
5.2.1
Experimental Set-up
.................................. 97
5.2.2
The Interrelation Between Frequency Shift
and Tip-Sample Forces
............................... 100
5.2.3
Extending Dynamic Force Spectroscopy
to Three Dimensions
..................................102
5.3
Force Field Spectroscopy on Ionic Crystals
..................... 104
5.3.1
Force Fields and Energy Dissipation on NaCl
............104
Contents
IX
5.3.2 Force
Vector
Fields on KBr
...........................110
5.4
True
3D
Force Field Spectroscopy on Graphite
.................113
References
......................................................117
6
Principles and Applications of the qPlus Sensor
Franz J. Giessibl
.................................................121
6.1
Motivation: qPlus Versus Si Cantilever
.........................121
6.1.1
Specifications of an Atomic Force Probe
.................122
6.1.2
Cantilevers in Dynamic Force Microscopy
................124
6.1.3
Advantages of Small Amplitude Operation
...............125
6.1.4
Ideal Physical Properties of Cantilevers
.................128
6.2
Theory of qPlus Versus Tuning Fork Sensors
...................128
6.2.1
Quartz Tuning Forks
..................................128
6.2.2
qPlus Sensor
........................................131
6.2.3
Manufacturing High Quality qPlus Sensors
..............132
6.2.4
Preamplifiers for qPlus Sensors
........................134
6.3
Applications
................................................137
6.3.1
Own Results
.........................................137
6.3.2
External Groups
.....................................138
6.4
Outlook
...................................................138
References
......................................................140
7
Study of Thin Oxide Films with NC-AFM:
Atomically Resolved Imaging and Beyond
M. Heyde, G.H. Simon, and T.
König..............................143
7.1
Introduction
................................................143
7.2
Methods and Experimental Setup
.............................145
7.2.1
Quartz Tuning Fork-based Sensor for Dual-Mode
NC-AFM/STM
......................................145
7.2.2
Concepts for Force and Energy Extraction and Sensor
Characterization
.....................................148
7.3
Atomic Resolution Imaging
...................................150
7.4
Beyond Imaging: Spectroscopy
................................156
7.4.1
^-Spectroscopy on Specific Atomic Sites
.................157
7.4.2
Work Function Shift Measurements
.....................160
7.5
Conclusion
.................................................165
References
......................................................165
8
Atom Manipulation on Semiconductor Surfaces
Yoshiaki Sugimoto
...............................................169
8.1
Introduction
................................................169
8.2
Experimental
...............................................171
8.3
Vertical Atom Manipulation
..................................172
8.4
Lateral Atom Manipulation at Low Temperature
................173
8.5
Interchange Lateral Atom Manipulation
.......................175
8.6
Lateral Atom Manipulation at Room Temperature
..............179
X
Contents
8.7
Interchange Vertical Atom Manipulation
......................184
8.8
Summary
..................................................188
References
......................................................189
9
Atomic Manipulation on Metal Surfaces
Markus
Ternes,
Christopher P.
Lutz,
and Andreas J.
Heinrich.........191
9.1
Introduction
................................................192
9.2
Modes of Manipulation
......................................193
9.3
Instrumentation
............................................195
9.3.1
Detected Signals
.....................................197
9.4
Forces During
Adsórbate
Manipulating
........................199
9.4.1
Manipulating a Small Molecule: CO on Cu(lll)
..........206
9.5
Modeling Forces and Conductance
............................207
9.6
Mapping the Energy Landscape
...............................209
9.7
Summary
..................................................213
References
......................................................213
10
Atomic Manipulation on an Insulator Surface
Sabine Hirth,
Frank
Ostendorf,
and Michael
Reichling................217
10.1
Introduction
................................................218
10.2
Basic Principles
.............................................218
10.2.1
Experimental Procedures
..............................218
10.2.2
Surface Characterization
..............................219
10.3
Experimental Results
........................................221
10.3.1
Defect Preparation and Contrast Formation
.............221
10.3.2
Manipulation of Mobile Defects
........................223
10.3.3
Velocity Dependence of Manipulation
...................225
10.4
Conclusions
................................................225
References
......................................................226
11
Basic Mechanisms for Single Atom Manipulation
in Semiconductor Systems with the PM-AFM
Pablo
Рои,
Pavel
Jelínek,
and
Rubén Pérez..........................
227
11.1
Introduction
................................................227
11.2
Theoretical Approach: First-Principles
Simulations
................................................229
11.3
The Short Range Chemical Interaction Between Tip and Sample
.. 230
11.4
Manipulation in the Attractive Regime: Vacancies
in the Si(lll)-(7
χ
7)
Reconstruction
..........................232
11.5
Manipulation in the Repulsive Tip-Surface Interaction Regime
... 237
11.5.1
A Complex Phase Space Under Strong Tip-Surface
Interactions
..........................................237
11.5.2
Dip-Pen Atomic Lithography: Vertical Atom
Interchange Between the Tip and the Surface
in the a-Sn/Si(lll)-( /3
χ
лД)
Surface
..................240
11.6
Conclusion
.................................................247
References
......................................................248
Contents
XI
12
Multi-Scale Modelling of NC-AFM Imaging
and Manipulation at Insulating Surfaces
T. Trevethan,
N.
Martsinovich, L. Kantorovich, and A.L. Shluger
......251
12.1
Introduction
................................................251
12.2
Methods
...................................................253
12.2.1
Modelling the Instrument
.............................253
12.2.2
Modelling the Tip-Surface Junction
....................254
12.2.3
Kinetic Monte Carlo
..................................256
12.3
Applications
................................................258
12.3.1
Pd
Adatom
on MgO
(001).............................258
12.3.2
H2O
Adsórbate
on CeO2 (111)
.........................263
12.3.3
C60 on Si
(001) ......................................265
12.4
Discussion
.................................................270
References
......................................................272
13
Magnetic Exchange Force Microscopy
Alexander
Schwarz, Uwe
Kaiser, Rene Schmidt,
and Roland Wiesendanger
.........................................275
13.1
Introduction
................................................275
13.2
Tip Preparation
............................................277
13.3
NiO(OOl)
..................................................278
13.4
Fe/W(001)
.................................................282
13.5
Future Perspectives
.........................................285
References
......................................................285
14
First-Principles Simulation of Magnetic Exchange Force
Microscopy on Fe/W(001)
Cesar
Lazo,
Hendrik Hölscher,
Vasile
Caduc,
and Stefan Heinze
.......287
14.1
Introduction
................................................287
14.2
Computational Method
......................................289
14.3
Analysis of the Magnetic Exchange Forces
......................291
14.3.1
Unrelated Tip and Sample
............................291
14.3.2
Influence of Structural Relaxations
.....................293
14.3.3
Electronic and Magnetic Structure Changes
due to Tip-Sample Interaction
............294
14.3.4
Influence of Tip Size
..................................295
14.4
Simulation of MExFM Images
................................297
14.5
Summary
..................................................299
References
......................................................300
15
Frequency Modulation Atomic Force Microscopy in
Liquids
Kei Kobayashi
and Hirofumi Yamada
...............................303
15.1
Brief Overview
.............................................303
15.2
Problems of Frequency Modulation AFM
in Liquids
..................................................304
XII Contents
15.2.1
Viscous Damping of Cantilever in Fluid
.................304
15.2.2
Electric Double Layer Force
[11]........................307
15.3
Frequency Noise in Frequency Modulation
Atomic Force Microscopy
[12].................................308
15.3.1
Basics of Frequency Modulation
........................308
15.3.2
Frequency Noise Analysis in High-Q Environment
........310
15.3.3
Frequency Noise Analysis in Low-Q Environment
.........314
15.4
Improvement of FM-AFM for Liquid Environment
..............316
15.4.1
Optimization of Optical Beam Deflection Sensor
..........316
15.4.2
Reduction of Coherence Length of Laser
.................318
15.4.3
Reduction of Oscillation Amplitude
.....................320
15.5
High-Resolution Imaging by FM-AFM in Liquid
................321
15.5.1
Muscovite Mica
[22] ..................................321
15.5.2
Purple Membrane Proteins
[23].........................323
15.5.3
Isolated Protein Molecules
[23].........................323
15.5.4
Measurement of Local
Hydration Strcutres ..............325
15.6
Summary and Outlook
......................................326
References
......................................................327
16
Biological Applications of FM-AFM
in Liquid Environment
Takeshi Fukuma and Suzanne P. Jarvis
.............................329
16.1
Quantitative Force Measurements
.............................329
16.1.1
Calculating Force from Frequency Shift
.................329
16.1.2
Cantilever Excitation in Liquid
.........................330
16.1.3
Single Molecule Spectroscopy
..........................332
16.2
Subnanometer-Resolution Imaging
............................333
16.2.1
Overview
............................................333
16.2.2
Technical Progresses
..................................336
16.2.3
Biological Applications
................................338
16.3
Future Prospects
............................................343
References
......................................................344
17
High-Frequency Low Amplitude Atomic Force Microscopy
Hideki Kawakatsu, Shuhei Nishida, Dai Kobayashi, Kazuhisa Nakagawa,
and Shigeki Kawai
...............................................347
17.1
Cantilever
..................................................347
17.2
Cantilever Vibration Excitation
...............................348
17.3
Cantilever Vibration Detection
...............................351
17.4
AFM Head
.................................................352
17.5
Control Scheme
.............................................354
17.6
Imaging with Small Amplitude of Drive
........................355
17.7
Lateral Dynamic Force Microscopy
............................356
17.8
Summary
..................................................358
References
......................................................359
Contents XIII
18
Cantilever Dynamics and Nonlinear Effects
in Atomic Force Microscopy
A. Raman, R. Reifenberger, J. Melcher, and R. Tung
.................361
18.1
Introduction
................................................361
18.2
Eigenmodes of AFM Cantilevers
..............................363
18.2.1
Eigenmodes of Tipless Microcantilevers
.................363
18.2.2
Influence of Tip Mass on AFM Cantilever Eigenmodes
.... 365
18.2.3
Eigenmodes of Triangular AFM Microcantilevers
.........366
18.3
Cantilever Dynamics in AM-AFM
............................368
18.3.1
Mathematical Simulations of Cantilever Dynamics
........368
18.3.2
Single Mode Nonlinear Phenomena in dAFM:
Bifurcations, Higher Harmonics, and Chaos
..............370
18.3.3
Multimode Nonlinear Dynamics in dAFM
...............375
18.3.4
Cantilever Dynamics in Liquids
........................376
18.4
Cantilever Dynamics in FM-AFM
.............................379
18.4.1
Origins of Frequency Shift and Its Measurement
..........380
18.4.2
Selecting Probes for FM-AFM
.........................383
18.4.3
Dynamic Characteristics of High Frequency
Cantilevers and Tuning Forks
..........................385
18.4.4
Higher Harmonics in FM-AFM
.........................388
18.4.5
FM-AFM Under Liquids
..............................389
18.5
Outlook
...................................................389
References
......................................................391
Index
..........................................................397
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| id | DE-604.BV035787043 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:04:33Z |
| institution | BVB |
| isbn | 9783642014949 |
| language | English |
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| physical | XVIII, 401 S. Ill., graph. Darst. |
| publishDate | 2009 |
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| publishDateSort | 2009 |
| publisher | Springer |
| record_format | marc |
| series2 | Nanoscience and technology Physics and astronomy online library |
| spelling | Noncontact atomic force microscopy 2 S. Morita ... (ed.) Berlin [u.a.] Springer (2009) XVIII, 401 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Nanoscience and technology Physics and astronomy online library Morita, Seizō 1948- (DE-588)123650178 edt (DE-604)BV035787028 2 Erscheint auch als Online-Ausgabe 978-3-642-01945-6 Digitalisierung UB Regensburg application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018646443&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Noncontact atomic force microscopy |
| title | Noncontact atomic force microscopy |
| title_auth | Noncontact atomic force microscopy |
| title_exact_search | Noncontact atomic force microscopy |
| title_full | Noncontact atomic force microscopy 2 S. Morita ... (ed.) |
| title_fullStr | Noncontact atomic force microscopy 2 S. Morita ... (ed.) |
| title_full_unstemmed | Noncontact atomic force microscopy 2 S. Morita ... (ed.) |
| title_short | Noncontact atomic force microscopy |
| title_sort | noncontact atomic force microscopy |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018646443&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV035787028 |
| work_keys_str_mv | AT moritaseizo noncontactatomicforcemicroscopy2 |