Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE4): Stockholm, Sweden, 11 - 15 June 2007
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| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Weinheim
Wiley-VCH
2008
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| Series: | Physica status solidi : C, Current topics in solid state physics
5,5 |
| Subjects: | |
| Online Access: | Inhaltsverzeichnis Inhaltsverzeichnis |
| Item Description: | Einzelaufnahme eines Zs.-Heftes |
| Physical Description: | S. 992 - 1445 Ill., graph. Darst. |
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| 245 | 1 | 0 | |a Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE4) |b Stockholm, Sweden, 11 - 15 June 2007 |c guest ed.: Hans Arwin ... |
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Record in the Search Index
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| adam_text | *HHSUE S WWW.PSS-C.COM CURRENT TOPICS IN SOLID STATE PHYSICS 0.0001 120 0
P (DEG) 60 40 45 6 R D (DEG) FAST NEAR-INFRA-RED SPECTROSCOPIC MUELLER
MATRIX ELLIPSOMETER BASED ON FERROELECTRIC LIQUID CRYSTAL RETARDERS (J.
LADSTEIN, F. STABO-EEG, E. GARCIA-CAUREL, AND M. KILDEMO, P. 1097) M
WITH CONTRIBUTIONS FROM THE 4TH INTERNATIONAL CONFERENCE ON
SPECTROSCOPIC ELLIPSOMETRY ^WILEY-VCH ISSN 1862-6351, PHYS. STAT. SOL.
(C) 5,NO.5,991-1446(2008) ^ CONTENTS PHYS. STAT. SOL. (C) 5, NO. 5,
991-999 (2008) / DOI 10.1002/PSSC.200860015 I-R * WILEY MTERSCIENCE D I
S C O V E R S O M E T H I N G GREAT FUELL TEXT ON OUR HOMEPAGE AT
WWW.PSS-C.COM PAPERS PRESENTED AT THE 4TH INTERNATIONAL CONFERENCE ON
SPECTROSCOPIC ELLIPSOMETRY (ICSE4) STOCKHOLM, SWEDEN, 11-15 JUNE 2007
GUEST EDITORS: HANS ARWIN, UWE BECK, AND MATHIAS SCHUBERT PAGE 1000 PAGE
1003-1006 PAGE 1007-1011 PAGE 1012-1015 PAGE 1016-1019 PAGE 1020-1022
PAGE 1023-1026 PAGE 1027-1030 PAGE 1031-1035 PAGE 1036-1040 PAGE
1041-1045 PREFACE K. BOUKHEDDADEN, E. D. LOUTETE-DANGUI, M. KOUBAA, AND
C. EYPERT FIRST-ORDER PHASE TRANSITIONS OF SPIN-CROSSOVER AND CHARGE
TRANSFER SOLIDS PROBED BY SPECTROSCOPIC ELLIPSOMETRY M. F. SAENGER, M.
HETTERICH, T. HOFMANN, R. D. KIRBY, D. J. SELLMYER, AND M. SCHUBERT
DIELECTRIC AND MAGNETIC BIREFRINGENCE IN LOW-CHLORINE-DOPED N-TYPE ZN,_
X MN X SE S. KAWABATA, T. MATSUMOTO, M. WAKAKI, AND J. CHEN APPLICATIONS
OF INTERFEROMETRIC ELLIPSOMETRY H. C. HSIEH, Z. C. JIAN, Y. L. CHEN, P.
J. HSIEH, AND D. C SU A METHOD FOR MEASURING TWO-DIMENSIONAL REFRACTIVE
INDEX DISTRIBUTION BY USING FRESNEL EQUATIONS AND PHASE-SHIFTING
INTERFEROMETRY JIUN-YOU LIN, JING-HENG CHEN, KUN-HUANG CHEN, AND
DER-CHIN SU A NEW TYPE OF LIQUID REFRACTOMETER KUN-HUANG CHEN, JING-HENG
CHEN, JIUN-YOU LIN, DER-CHIN SU, AND JUNG-CHIEH SU AN ALTERNATIVE METHOD
FOR SIMULTANEOUSLY MEASURING CELL PARAMETERS OF A TWISTED-NEMATIC LIQUID
CRYSTAL CELL G. PILLER, L. BRACH, AND L. JOHANN EXPERIMENTAL STUDY OF
THE SYSTEMATIC ERRORS FOR A MUELLER MATRIX DOUBLE ROTATING COMPENSATOR
ELLIPSOMETER BLAINE JOHS AND C M. HERZINGER QUANTIFYING THE ACCURACY OF
ELLIPSOMETER SYSTEMS L. BRACH AND L. JOHANN OPTIMIZING PRECISION OF
ROTATING COMPENSATOR ELLIPSOMETRY N. URIBE-PATARROYO, A.
ALVAREZ-HERRERO, R. L. HEREDERO, J. C. DEL TORA INIESTA, A. C LOPEZ
JIMENEZ, V. DOMINGO, J. L. GASENT, L. JOCHUM, V. MARTINEZ PILLET, AND
THE IMAXTEAM IMAX: A POLARIMETER BASED ON LIQUID CRYSTAL VARIABLE
RETARDERS FOR AN AEROSPACE MISSION *;-*» INTERSCIENCE ) 2008 WILEY-VCH
VERLAG GMBH & CO. KGAA, WEINHEIM 992 PAGE 1046-1049. PAGE 1050-1053,
PAGE 1054-1058 PAGE 1059-1063, PAGE 1064-1067, PAGE 1068-1072 PAGE
1073-1076 PAGE 1077-1080, PAGE 1081-1084 , PAGE 1085-1088, PAGE
1089-1092 PAGE 1093-1096 PAGE 1097-1100. PAGE 1101-1104. Y. H. MENG, S.
CHEN, AND G. JIN AN AUTO-FOCUSING METHOD FOR IMAGING ELLIPSOMETRY SYSTEM
Y. H. MENG, Y. Y. CHEN, C. QI, L. LIU, AND G. JIN AN AUTOMATIC IMAGING
SPECTROSCOPIC ELLIPSOMETER FOR CHARACTERIZATION OF NANO-FILM PATTERN ON
SOLID SUBSTRATE G. G. TSUTSUMANOVA, A. N. TZONEV, AND S. C RUSSEV
POLYNOMIAL INVERSION OF THE SINGLE TRANSPARENT LAYER PROBLEM IN
ELLIPSOMETRY IN CASE OF MULTIPLE MEASUREMENTS R. OSSIKOVSKI, E.
GARCIA-CAUREL, AND A. DE MARTINO PRODUCT DECOMPOSITIONS OF
EXPERIMENTALLY DETERMINED NON-DEPOLARIZING MUELLER MATRICES P. MARSIKAND
J. HUMLICEK MULTI-PLATE MISALIGNMENT ARTIFACTS IN ROTATING-COMPENSATOR
ELLIPSOMETRY: ANALYSIS AND DATA TREATMENT 0. S. DRON RANDOM ERRORS AND
OPTIMUM ESTIMATION OF MEASUREMENTS PHOTOMETRIE ELLIPSOMETERS A. SEIFTER
AND D. C. SWIFT A NEW SUB-NANOSECOND SPECTRAL ELLIPSOMETER FOR SHOCK
PHYSICS APPLICATIONS C. MAJOR, G. JUHAESZ, Z. HORVAETH, 0. POLGAR, AND M.
FRIED WIDE ANGLE BEAM ELLIPSOMETRY FOR EXTREMELY LARGE SAMPLES G.
JUHAESZ, Z. HORVAETH, C. MAJOR, P. PETRIK, 0. POLGAER, AND M. FRIED
NON-COLLIMATED BEAM ELLIPSOMETRY R. A. SYNOWICKI SUPPRESSION OF BACKSIDE
REFLECTIONS FROM TRANSPARENT SUBSTRATES C AEKERLIND, A. JAENIS, H. KARIIS,
H. ARWIN, AND K. JAERRENDAHL SPECTROSCOPIC ELLIPSOMETRY AND VECTOR
NETWORK ANALYSIS FOR DETERMINATION OF THE ELECTROMAGNETIC RESPONSE IN
TWO WAVELENGTH REGIONS F. STABO-EEG, J. LADSTEIN, AND M. KILDEMO PRODUCT
DECOMPOSITION OF MEASURED MUELLER MATRICES FROM THE FLC BASED NIR
MUELLER MATRIX ELLIPSOMETER J. LADSTEIN, F. STABO-EEG, E. GARCIA-CAUREL,
AND M. KILDEMO FAST NEAR-INFRA-RED SPECTROSCOPIC MUELLER MATRIX
ELLIPSOMETER BASED ON FERROELECTRIC LIQUID CRYSTAL RETARDERS S. N.
SVITASHEVA, V. A. GRITSENKO, AND B. A. KOLESOV OPTICAL PROPERTIES OF TI0
2 FILMS MADE BY AIR OXIDATION OF TI 2008 WILEY-VCH VERLAG GMBH & CO.
KGAA, WEINHEIM WWW.PSS-C.COM CONTENTS PHYS. STAT. SOL. (C) 5, NO. 5
(2008) 993 PAGE 1105-1108 Y. YAMADA, K. TAJIMA, M. OKADA, S. BAO, M.
TAZAWA, K. YOSHIMURA, AND A. ROOS CONTROL OF THE CONCENTRATION OF
PROTONS INTERCALATED INTO TUNGSTEN OXIDE THIN FILMS DURING DEPOSITION
PAGE 1109-1112 S. OUKASSI, X. GAGNARD, R. SALOT, D. ZAHORSKI, J. L.
STEHLE, J. P. PIEL, AND J. P. PEREIRA-RAMOS A SPECTROSCOPIC ELLIPSOMETRY
INVESTIGATION OF RF-SPUTTERED CRYSTALLINE VANADIUM PENTOXIDE THIN FILMS
PAGE 1113-1116 W. R. FOLKS, J. GINN, D. SHELTON, J. THARP, AND G.
BOREMAN SPECTROSCOPIC ELLIPSOMETRY OF MATERIALS FOR INFRARED
MICRO-DEVICE FABRICATION PAGE 1117-1120 NAOHIKO KATO, HIROYUKI MORI, AND
NAOKO TAKAHASHI SPECTROSCOPIC ELLIPSOMETRY OF SILICON-CONTAINING
DIAMOND-LIKE CARBON (DLC-SI) FILMS PAGE 1121-1124 Y. SHIM, Y. NISHIMOTO,
W. OKADA, K. WAKITA, AND N. MAMEDOV TEMPERATURE-DEPENDENT
SPECTRO-ELLIPSOMETRIC STUDIES OF OPTICAL TRANSITIONS NEAR ABSORPTION
EDGE OF TLLNS 2 PAGE 1125-1128 L. MIAO, T. JIANG, S. TANEMURA, M.
TANEMURA, N. NABATOVA-GABAIN, AND G. XU SPECTROSCOPIC ELLIPSOMETRY
ANALYSIS OF MULTILAYERED TI0 2 -AG THIN FILMS FOR PHOTOCHROMIC
APPLICATION PAGE 1129-1132 T. TSURU AND M. YAMAMOTO PRECISE
DETERMINATION OF LAYER STRUCTURE WITH EUV ELLIPSOMETRY DATA OBTAINED BY
MULTILAYER POLARIZING ELEMENTS PAGE 1133-1136 I. GEREIGE, S. ROBERT, M.
STCHAKOVSKY, D. JAMON, F. CELLE, S. REYNAUD, J. C. POMMIER, AND Y.
JOURLIN ELLIPSOMETRIC CHARACTERIZATION OF PHOTO-RESIST GRATINGS USING
ARTIFICIAL NEURAL NETWORK PAGE 1137-1140 M. VAUPEL AND M. VINNICHENKO
PLASMA FLOW INDUCED LOCAL VARIATION OF DISPERSION CONSTANTS OF ITO-FILMS
OBSERVED WITH SPECTROSCOPIC IMAGING ELLIPSOMETRY PAGE 1141-1144 A. A.
WRONKOWSKA, H. ARWIN, A. BUKALUK, T. SKOWROHSKI, M. TRZCINSKI, K.
OKULEWICZ, AND A. WRONKOWSKI IR-VIS-UV ELLIPSOMETRY, XRD AND AES
INVESTIGATION OF IN/CU AND IN/PD THIN FILMS PAGE 1145-1149 NORA
DAHMOUCHENE, MICHEL VOUE, JEAN-LOUIS STEHLE, CHRISTOPHE DEFRANOUX,
CORINNE NOUVELLON, AND JOEL DE CONINCK OPTICAL PROPERTIES OF NICRO X
THIN FILMS PAGE 1150-1155 ALEXEI NABOK, ANNA TSARGORODSKAYA, AND
SURYAJAYA ELLIPSOMETRY STUDY OF ULTRA THIN LAYERS OF EVAPORATED GOLD
PAGE 1156-1159 G. G. TSUTSUMANOVA AND S. C. RUSSEV SPECTROSCOPIC
ELLIPSOMETRY OF SI0 2 /TI0 2 MULTILAYER PERIODIC STRUCTURE SUITABLE FOR
*F STANDARD WWW.PSS-C.COM 2008 WILEY-VCH VERLAG GMBH & CO. KGAA,
WEINHEIM CONTENTS PAGE 1160-1163 PAGE 1164-1167. PAGE 1168-1171. PAGE
1172-1175 PAGE 1176-1179. PAGE 1180-1183 PAGE 1184-1186 PAGE 1187-1189.
PAGE 1190-1193. PAGE 1194-1197. PAGE 1198-1201. PAGE 1202-1205. PAGE
1206-1209. PAGE 1210-1214. PAGE 1215-1218. ALBERTO ALVAREZ-HERRERO,
DANIEL GARRANZO, ROSARIO PARDO, MARCOS ZAYAT, AND DAVID LEVY TEMPERATURE
DEPENDENCE OF THE OPTICAL AND KINETIC PROPERTIES OF PHOTOCHROMIC
SPIROOXAZINE DERIVATIVES IN SOL-GEL THIN FILMS M. FERNAENDEZ-RODRIGUEZ,
V. J. RICO, A. R. GONZAELEZ-ELIPE, AND A. ALVAREZ-HERRERO UV IRRADIATION
EFFECTS ON TI0 2 THIN FILMS E. NOLOT, A. LEFEVRE, AND J. N. HILFIKER
ELLIPSOMETRY CHARACTERIZATION OF BULK ACOUSTIC WAVE FILTERS KAI BARTEL,
WERNER FREYLAND, AND DETLEF NATTLAND SURFACE SOLIDIFICATION IN LIQUID
GA-TL ALLOYS A. NEBOJSA, 0. FIKAROVAE ZRZAVECKAE, K. NAVRAETIL, AND J.
HUMLFCEK TEMPERATURE DEPENDENCE OF ELLIPSOMETRIC SPECTRA OF FE AND
CRNIAL STEEL V. ION, A. C. GAELCAE, N. D. SCAERISOREANU, M. FILIPESCU, AND
M. DINESCU SPECTROSCOPIC ELLIPSOMETRY STUDY OF AMORPHOUS SR X BA,. X NB
2 0 6 THIN FILMS OBTAINED BY PULSED LASER DEPOSITION R. GREEF AND J. G.
FREY THE WATER-LIKE FILM ON WATER R. GREEF, J. G. FREY, J. ROBINSON, AND
L DANOS ADSORPTION OF RHODAMINE 6G AT THE WATER-AIR INTERFACE A. ZIMMER,
N. STEIN, H. TERRYN, L. JOHANN, AND C. BOULANGER ANALYSIS OF CARRIER
PARAMETERS AND BANDGAP OF ELECTROPLATED BI 2 TE 3 FILMS BY INFRARED
SPECTROSCOPIC ELLIPSOMETRY YIA-CHUNG CHANG, SHIH-HSIN HSU, PEI-KUEN WEI,
AND YOUNG DONG KIM OPTICAL NANOMETROLOGY OF AU NANOPARTICIES ON A
MULTILAYER FILM D. K. RAI, DEBJIT DATTA, RAJEEV GUPTA, AND SATYENDRA
KUMAR ELLIPSOMETRIC STUDIES OF DIAMOND LIKE CARBON FILMS PREPARED BY
PECVD USING PULSED DC POWER SUPPLY MICHAEL FRONK, BJOERN BRAEUER, DIETRICH
ZAHN, AND GEORGETA SALVAN TEMPERATURE DEPENDENT REFLECTION ANISOTROPY
SPECTROSCOPY INVESTIGATIONS OF VANADYL PHTHALOCYANINE FILMS V. EDON, M.
GAILLET, M.C. HUGON, C. EYPERT, 0. DURAND, AND C CARDINAUD
41LANTHANUM-BASED DIELECTRIC FILMS ANALYZED BY SPECTROSCOPIC
ELLIPSOMETRY, X-RAY REFLECTOMETRY AND X-RAY PHOTOELECTRON SPECTROSCOPY
NORA DAHMOUCHENE, SEVERINE COPPEE, MICHEL VOUE, AND JOEL DE CONINCK
SILVER NANOPARTICIES EMBEDDED IN POLYMER MATRICES - A FTIR-SE STUDY H.
AEGUAS, R. J. C SILVA, M. VIEGAS, L. PEREIRA, E. FORTUNATO, AND R.
MARTINS STUDY OF ENVIRONMENTAL DEGRADATION OF SILVER SURFACE 2008
WILEY-VCH VERLAG GMBH & CO. KGAA, WEINHEIM WWW.PSS-C.COM CONTENTS PHYS.
STAT. SOL. (C) 5, NO. 5 (2008) 995 PAGE 1219-1222 E. KONDOH, E. UKAI,
AND S. ARUGA CONDENSATION AND CLEANING OF AN ORGANOMETALLIC COPPER
COMPOUND TO/FROM POROUS LOW-DIELECTRIC CONSTANT THIN FILMS IN
SUPERCRITICAL CARBON DIOXIDE PAGE 1223-1226 J. BUDAI AND Z. TOTH OPTICAL
PHASE DIAGRAM OF AMORPHOUS CARBON FILMS DETERMINED BY SPECTROSCOPIC
ELLIPSOMETRY PAGE 1227-1230 M. FRIED, N. Q. KHANH, AND P. PETRIK DEFECT
PROFILING BY ELLIPSOMETRY USING ION IMPLANTATION THROUGH WEDGE MASKS
PAGE 1231-1234 G. ROEDER, C MANKE, P. K. BAUMANN, S. PETERSEN, V. YANEV,
A. GSCHWANDTNER, G. RUHL, P. PETRIK, M. SCHELLENBERGER, L. PFITZNER, AND
H. RYSSEL CHARACTERIZATION OF RU AND RU0 2 THIN FILMS PREPARED BY PULSED
METAL ORGANIC CHEMICAL VAPOR DEPOSITION PAGE 1235-1239 S. ULRICH, A.
PFLUG, K. SCHIFFMANN, AND B. SZYSZKA OPTICAL MODELING AND XRR/AFM
CHARACTERIZATION OF HIGHLY CONDUCTIVE THIN AG LAYERS PAGE 1240-1243 J.
SELLMANN, CH. STURM, R. SCHMIDT-GRUND, CH. CZEKALLA, J. LENZNER, H.
HOCHMUTH, B. RHEINLAENDER, M. LORENZ, AND M. GRUNDMANN STRUCTURAL AND
OPTICAL PROPERTIES OF ZR0 2 AND AL 2 0 3 THIN FILMS AND BRAGG REFLECTORS
GROWN BY PULSED LASER DEPOSITION PAGE 1244-1248 S. MARSILLAC, N.
BARREAU, H. KHATRI, J. LI, D. SAINJU, A. PARIKH, N. J. PODRAZA, AND R.
W. COLLINS SPECTROSCOPIC ELLIPSOMETRY STUDIES OF LN 2 S 3 TOP WINDOW AND
MO BACK CONTACTS IN CHALCOPYRITE PHOTOVOLTAICS TECHNOLOGY PAGE 1249-1252
T. BERLIND, G. K. PRIBIL, D. THOMPSON, J. A. WOOLLAM, AND H. ARWIN
EFFECTS OF ION CONCENTRATION ON REFRACTIVE INDICES OF FLUIDS MEASURED BY
THE MINIMUM DEVIATION TECHNIQUE PAGE 1253-1256 P. MARSIK, P. VERDONCK,
D. SCHNEIDER, D. DE ROEST, S. KANEKO, AND M. R. BAKLANOV SPECTROSCOPIC
ELLIPSOMETRY AND ELLIPSOMETRIC POROSIMETRY STUDIES OF CVD LOW-K
DIELECTRIC FILMS PAGE 1257-1260 C VENA, C. VERSACE, G. STRANGI, ST.
D ELIA, AND R. BARTOLINO FREEDERICKSZ TRANSITION IN HOMEOTROPICALLY
ALIGNED LIQUID CRYSTALS: A PHOTOPOLARIMETRIC CHARACTERIZATION PAGE
1261-1264 0. FIKAROVAE ZRZAVECKAE, A. NEBOJSA, K. NAVRAETIL, S. NESPUEREK,
AND J. HUMLICEK DYNAMICS OF UV DEGRADATION OF PMPSI IN VACUUM AND IN THE
AIR USING IN-SITU ELLIPSOMETRY PAGE 1265-1269 S. LOGOTHETIDIS, A.
LASKARAKIS, D. GEORGIOU, S. AMBERG-SCHWAB, AND U. WEBER INVESTIGATION OF
THE OPTICAL PROPERTIES OF ORGANIC-INORGANIC HYBRID POLYMERS BY IR TO
VIS-FUV SPECTROSCOPIC ELLIPSOMETRY WWW.PSS-C.COM 2008 WILEY-VCH VERLAG
GMBH 8. CO. KGAA, WEINHEIM 996 CONTENTS PAGE 1270-1273 PAGE 1274-1277
PAGE 1278-1282 PAGE 1283-1286. PAGE 1287-1289. PAGE 1290-1294. PAGE
1295-1299. PAGE 1300-1303 PAGE 1304-1307 PAGE 1308-1311 PAGE 1312-1315
PAGE 1316-1319. M. CAMPOY-QUILES, J. NELSON, P. G. ETCHEGOIN, D. D. C.
BRADLEY, V. ZHOKHAVETS, G. GOBSCH, H. VAUGHAN, A. MONKMAN, 0. INGAENAS,
IM. K. PERSSON, H. ARWIN, M. GARRIGA, M. I. ALONSO, G. HERRMANN, M.
BECKER, W. SCHOLDEI, M. JAHJA, AND C. BUBECK ON THE DETERMINATION OF
ANISOTROPY IN POLYMER THIN FILMS: A COMPARATIVE STUDY OF OPTICAL
TECHNIQUES IRYNA VALYUKH, HANS ARWIN, VLADIMIR CHIGRINOV, AND SERGIY
VALYUKH UV-INDUCED IN-PLANE ANISOTROPY IN LAYERS OF MIXTURE OF THE
AZO-DYES SD-1/SDA-2 CHARACTERIZED BY SPECTROSCOPIC ELLIPSOMETRY C
LICITRA, F. BERTIN, M. DARNON, T. CHEVOLLEAU, C GUEDJ, S. CETRE, H.
FONTAINE, A. ZENASNI, AND L. L. CHAPELON EVALUATION OF ELLIPSOMETRIC
POROSIMETRY FOR IN-LINE CHARACTERIZATION OF ULTRA IOW-K DIELECTRICS Y.
MURAKAMI, M. WAKAKI, AND S. KAWABATA IN-SITU OBSERVATION OF PHOTODOPING
PHENOMENA IN CHALCOGENIDE GLASS BY SPECTROSCOPIC ELLIPSOMETRY V. A.
SHVETS, I. E. TYSCHENKO, S. I. CHIKICHEV, AND V. YU. PROKOPIEV REAL-TIME
ELLIPSOMETRIC STUDY OF GE + ION IMPLANTED SI0 2 LAYERS DURING FAST
ANNEALING B. HAJ IBRAHIM, R. BOTHA, P. BULKIN, AND B. DREVILLON
MULTILAYER OPTICAL FILTERS CONTROL BY MULTI-CHANNEL KINETIC ELLIPSOMETRY
S. LOUSINIAN AND S. LOGOTHETIDIS REAL-TIME SPECTROSCOPIC ELLIPSOMETRY
FOR PROTEIN ADSORPTION STUDY AND PH EFFECT D. GEORGIOU, S. LOGOTHETIDIS,
C KOIDIS, AND A. LASKARAKIS IN-SITU AND REAL-TIME MONITORING OF HIGH
BARRIER LAYERS GROWTH ONTO POLYMERIE SUBSTRATES MIRKO PRATO, ANTONIO
GUSSONI, MARCO PANIZZA, ORNELLA CAVALLERI, LORENZO MATTERA, AND MAURIZIO
CANEPA CU UNDERPOTENTIAL DEPOSITION ON AU CONTROLLED BY IN SITU
SPECTROSCOPIC ELLIPSOMETRY LINGJIE LI, JINGLEI LEI, SHENGHAI YU, DONGHAI
HE, WEIJUAN QU, AND FUSHENG PAN IN SITU ELLIPSOMETRIC STUDIES OF
FORMATION KINETICS OF RARE EARTH METAL CONVERSION COATINGS ON MAGNESIUM
AILOY X. LIU, L.-K. KIM, AND D. E. ASPNES INVESTIGATION OF HETEROEPITAXY
ON NANOSCOPICALLY ROUGHENED (001 )SI BY REAL-TIME SPECTROSCOPIC
POLARIMETRY K. POSTAVA, Y. Z. GAO, X. Y. GONG, L. HALAGACKA, J. PISTORA,
A. NAKAOKA, AND T. YAMAGUCHI SPECTROSCOPIC ELLIPSOMETRY OF ANODIZED
LAYER ON SINGLE CRYSTAL INASSB LAYER GROWN BY MELT EPITAXY 2008
WILEY-VCH VERLAG GMBH & CO. KGAA, WEINHEIM WWW.PSS-C.COM V-UIIIEIN.3
PHYS. STAT. SOL. (C) 5, NO. 5 (2008) 997 PAGE 1320-1323 DAVI D NECAS,
VRATISLAV PERINA, DANIEL FRANTA, IVAN OHIIDAL, AND JOSEF ZEMEK OPTICAL
CHARACTERIZATION OF NON-STOICHIOMETRIC SILICON NITRIDE FILMS PAGE
1324-1327 DANIEL FRANTA, MARTIN HRDLICKA, DAVID NECAS, MILOSLAV FRUMAR,
IVAN OHIIDAL, AND MARTIN PAVIISTA OPTICAL CHARACTERIZATION OF PHASE
CHANGING GE 2 SB 2 TE 5 CHALCOGENIDE FILMS PAGE 1328-1331 V. M. VOORA,
T. HOFMANN, M. BRANDT, M. LORENZ, M. GRUNDMANN, AND M. SCHUBERT
ELECTROOPTIC ELLIPSOMETRY STUDY OF PIEZOELECTRIC BATI0 3 -ZNO
HETEROSTRUCTURES PAGE 1332-1336 P. BASA, P. PETRIK, M. FRIED, A. DANA,
A. AYDINLI, S. FOSS, AND T. G. FINSTAD SPECTROSCOPIC ELLIPSOMETRIC STUDY
OF GE NANOCRYSTALS EMBEDDED IN SI0 2 USING PARAMETRIC MODEIS PAGE
1337-1340 T. LOHNER, A. PONGRAECZ, N. Q. KHAENH, 0. H. KRAFCSIK, K. V.
JOSEPOVITS, AND P. DEAEK COMPARATIVE INVESTIGATION OF THE SI/SI0 2
INTERFACE LAYER CONTAINING SIC CRYSTALLITES USING SPECTROSCOPIC
ELLIPSOMETRY, ION BEAM ANALYSIS AND XPS PAGE 1341-1345 PETE I. KLIMECKY
AND FRED L. TERRY, JR. A MULTI-SENSOR STUDY OF CL 2 ETCHING OF
POLYCRYSTALLINE SI PAGE 1346-134 9 JATINDRA K. RATH, RUUD E. I. SCHROPP,
AND PERE ROCA I CABAROCAS STRUCTURAL ORDER OF THIN FILM SILICON MADE AT
100 C PAGE 1350-1353 C STURM, T. CHAVDAROV, R. SCHMIDT-GRUND, B.
RHEINLAENDER, C. BUNDESMANN, H. HOCHMUTH, M. LORENZ, M. SCHUBERT, AND M.
GRUNDMANN INVESTIGATION OF THE FREE CHARGE CARRIER PROPERTIES AT THE
ZNO-SAPPHIRE INTERFACE IN A-PLANE ZNO FILMS STUDIED BY GENERALIZED
INFRARED ELLIPSOMETRY PAGE 1354-1357 0. POLGAER, M. FRIED, N. KHANH, P.
PETRIK, AND I. BAERSONY DETERMINATION OF ION TRACK AND SHAPES WITH DAMAGE
SIMULATIONS ON THE BASE OF ELLIPSOMETRIC AND BACKSCATTERING
SPECTROMETRIC MEASUREMENTS PAGE 1358-1361 P. PETRIK, N. Q. KHAENH, JIAN
LI, JIE CHEN, R. W. COLLINS, M. FRIED, G. Z. RADNOECZI, T. LOHNER, AND J.
GYULAI ION IMPLANTATION INDUCED DISORDER IN SINGLE-CRYSTAL AND
SPUTTER-DEPOSITED POLYCRYSTALLINE CDTE CHARACTERIZED BY ELLIPSOMETRY AND
BACKSCATTERING SPECTROMETRY PAGE 1362-1365 D. CHVOSTOVAE, L. PAJASOVAE,
AND V. ZELEZNY OPTICAL PROPERTIES OF PZT THIN FILMS BY SPECTROSCOPIC
ELLIPSOMETRY AND OPTICAL REFLECTIVITY PAGE 1366-1369 C KOIDIS, S.
LOGOTHETIDIS, D. GEORGIOU, AND A. LASKARAKIS LN-SITU AND REAL-TIME
INVESTIGATION OF ZNO THIN FILMS GROWTH ONTO RIGID AND FLEXIBLE
SUBSTRATES WWW.PSS-C.COM 2008 WILEY-VCH VERLAG GMBH & CO. KGAA, WEINHEIM
998 CONTENTS PAGE 1370-1373 PAGE 1374-1377 PAGE 1378-1381. PAGE
1382-1385. PAGE 1386-1390, PAGE 1391-1394 PAGE 1395-1398 PAGE 1399-1402
PAGE 1403-1406 PAGE 1407-1410 PAGE 1411-1413 PAGE 1414-1418 PAGE
1419-1422 PAGE 1423-1426 0. FURSENKO, D. BOLZE, I. COSTINA, P. ZAUMSEIL,
T. HUELSMANN, J. NIESS, AND W. LERCH CHARACTERIZATION OF SILICIDE STACKS
BY COMBINATION OF SPECTROSCOPIC ELLIPSOMETRY AND REFLECTOMETRY T.
LOHNER, Z. ZOLNAI, P. PETRIK, G. BATTISTIG, J. GARCIA LOPEZ, Y. MORULA,
A. KOOES, Z. OSVAETH, AND M. FRIED COMPLEX DIELECTRIC FUNCTION OF ION
IMPLANTATION AMORPHIZED SIC DETERMINED BY SPECTROSCOPIC ELLIPSOMETRY U.
ROSSOW, D. FUHRMANN, H. JONEN, AND A. HANGLEITER INVESTIGATIONS OF DEEP
LYING WIDE BANDGAP GAN AND INGAN QUANTUM WELL STRUCTURES: A CHALLENGE
FOR ELLIPSOMETRIC METHODS M. KILDEMO, I. S. NERB0, E. S0NDERGAERD, L.
HOLT, I. SIMONSEN, AND M. STCHAKOVSKY OPTICAL RESPONSE OF NANOSTRUCTURED
GASB T. HOFMANN, C. VON MIDDENDORFF, V. GOTTSCHALCH, AND M. SCHUBERT
OPTICAL HALL EFFECT STUDIES ON MODULATION-DOPED ALGA^ASISI/GAAS QUANTUM
WELLS A. REZA, R. TAMASEVICIUS, J. BABONAS, Z. BALEVICIUS, V.
VAICIKAUSKAS, V. GOLUBEV, AND D. KURDYUKOV ELLIPSOMETRIC STUDIES OF OPAL
CRYSTALS DANIEL FRANTA, IVAN OHLIDAL, AND DAVID NECAS OPTICAL QUANTITIES
OF ROUGH FILMS CAICULATED BY RAYLEIGH-RICE THEORY IVAN OHLIDAL, DAVID
NECAS, AND DANIEL FRANTA SPECTROSCOPIC ELLIPSOMETRY AND REFLECTOMETRY OF
STATISTICALLY ROUGH SURFACES EXHIBITING WIDE INTERVALS OF SPATIAL
FREQUENCIES S. SCHUTZMANN, P. PROSPOSITO, M. CASALBONI, I. VENDITTI, AND
M. V. RUSSO SPECTROSCOPIC ELLIPSOMETRY ON PHOTONIC CRYSTALS MADE BY
SELF-ASSEMBLED DYE-DOPED P(S/HEMA) NANOSPHERES L. DANOS, G. JONES, R.
GREEF, AND T. MARKVART ULTRA-THIN SILICON SOLAR CELL: MODELLING AND
CHARACTERISATION H. C WEI, C H. HSIEH, C. C TSAI, L. P. YU, AND C. CHOU
DETERMINATION OF LINEAR BIREFRINGENCE OF A MULTIPLE-ORDER WAVE PLATE
USING A PHASE-SENSITIVE ELLIPSOMETER H. JEONG, H. CHEON, J. KYOUNG, H.
OH, AND I. AN APPLICATION OF ELLIPSOMETRY IN IMMERSION LITHOGRAPHY Z.
BALEVICIUS, V. VAICIKAUSKAS, G. VALINCIUS, AND I. IGNATJEV ANALYSIS OF
T. LANUGINOSUS LIPASE GROWTH ON OCTADECANTHIOL USING SURFACE PLASMON
RESONANCE ELLIPSOMETRY M. ANASTASIADOU, A. DE MARTINO, D. CLEMENT, F.
LIEGE, B. LAUDE-BOULESTEIX, N. QUANG, J. DREYFUSS, B. HUYNH, A. NAZAC,
L. SCHWARTZ, AND H. COHEN POLARIMETRIE IMAGING FOR THE DIAGNOSIS OF
CERVICAL CANCER ) 2008 WILEY-VCH VERLAG GMBH & CO. KGAA, WEINHEIM
WWW.PSS-C.COM _UIIL CII13 PHYS. STAT. SOL. (C) 5, NO. 5 (2008) 999 PAGE
1427-1430 PAGE 1431-1433 PAGE 1434-1437 PAGE 1438-1441 PAGE 1444-1445 P.
KOZMA, N. NAGY, S. KURUNCZI, P. PETRIK, A. HAEMORI, A. MUSKOTAEL, F.
VONDERVISZT, M. FRIED, AND I. BAERSONY ELLIPSOMETRIC CHARACTERIZATION OF
FLAGELLIN FILMS FOR BIOSENSOR APPLICATIONS J. W. P. BAKKER, H. ARWIN, I.
LUNDSTROEM, AND D. FILIPPINI IMMUNODETECTION USING COMPUTER SCREEN
PHOTO-ASSISTED ELLIPSOMETRY Z. MONTIEL-GONZAELEZ, G. LUNA-BAERCENAS, AND
A. MENDOZA-GALVAEN THERMAL BEHAVIOUR OF CHITOSAN AND CHITIN THIN FILMS
STUDIED BY SPECTROSCOPIC ELLIPSOMETRY H. ARWIN, A. ASKENDAHL, P.
TENGVALL, D. W. THOMPSON, AND J. A. WOOLLAM INFRARED ELLIPSOMETRY
STUDIES OF THERMAL STABILITY OF PROTEIN MONOLAYERS AND MULTILAYERS
INFORMATION FOR AUTHORS PHYSICA STATUS SOLIDI (C) IS INDEXED IN
CAMBRIDGE SCIENTIFIC ABSTRACTS; CSA TECHNOLOGY RESEARCH DATABASE
(CSA/CIG); CHEMICAL ABSTRACTS SERVICE/SCIFINDER (ACS); COMPENDEX
(ELSEVIER); FIZ KARLSRUHE DATABASES (FIZ KARLSRUHE); GOOGLE SCHOLAR;
INSPEC; PHYSICS ABSTRACTS (IET); ISI INDEX TO SCIENTIFIC & TECHNICAL
PROCEEDINGS; PASCAL DATABASE (INIST/CNRS); SCOPUS (ELSEVIER); VINITI
(ALL-RUSSIAN INSTITUTE OF SCIENCE & TECHNOLOGICAL INFORMATION).
WWW.PSS-C.COM 2008 WILEY-VCH VERLAG GMBH S CO. KGAA, WEINHEIM
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| spelling | International Conference on Spectroscopic Ellipsometry 4 2007 Stockholm Verfasser (DE-588)10204205-6 aut Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE4) Stockholm, Sweden, 11 - 15 June 2007 guest ed.: Hans Arwin ... Weinheim Wiley-VCH 2008 S. 992 - 1445 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Physica status solidi : C, Current topics in solid state physics 5,5 Einzelaufnahme eines Zs.-Heftes Spektroskopie (DE-588)4056138-0 gnd rswk-swf Ellipsometrie (DE-588)4152025-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Ellipsometrie (DE-588)4152025-7 s Spektroskopie (DE-588)4056138-0 s DE-604 Arwin, Hans Sonstige oth http://www.gbv.de/dms/ilmenau/toc/566122332.PDF lizenzfrei Inhaltsverzeichnis GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017709128&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE4) Stockholm, Sweden, 11 - 15 June 2007 Spektroskopie (DE-588)4056138-0 gnd Ellipsometrie (DE-588)4152025-7 gnd |
| subject_GND | (DE-588)4056138-0 (DE-588)4152025-7 (DE-588)1071861417 |
| title | Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE4) Stockholm, Sweden, 11 - 15 June 2007 |
| title_auth | Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE4) Stockholm, Sweden, 11 - 15 June 2007 |
| title_exact_search | Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE4) Stockholm, Sweden, 11 - 15 June 2007 |
| title_full | Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE4) Stockholm, Sweden, 11 - 15 June 2007 guest ed.: Hans Arwin ... |
| title_fullStr | Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE4) Stockholm, Sweden, 11 - 15 June 2007 guest ed.: Hans Arwin ... |
| title_full_unstemmed | Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE4) Stockholm, Sweden, 11 - 15 June 2007 guest ed.: Hans Arwin ... |
| title_short | Papers presented at the 4th International Conference on Spectroscopic Ellipsometry (ICSE4) |
| title_sort | papers presented at the 4th international conference on spectroscopic ellipsometry icse4 stockholm sweden 11 15 june 2007 |
| title_sub | Stockholm, Sweden, 11 - 15 June 2007 |
| topic | Spektroskopie (DE-588)4056138-0 gnd Ellipsometrie (DE-588)4152025-7 gnd |
| topic_facet | Spektroskopie Ellipsometrie Konferenzschrift |
| url | http://www.gbv.de/dms/ilmenau/toc/566122332.PDF http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017709128&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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