Fault injection techniques and tools for embedded systems reliability evaluation:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Boston
Kluwer Academic Publishers
2003
|
| Schriftenreihe: | Frontiers in electronic testing
23 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Includes bibliographical references (p. [231]-241) |
| Beschreibung: | 1 Online-Ressource Illustrationen 25 cm |
| ISBN: | 030648711X |
Internformat
MARC
| LEADER | 00000nmm a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV035413525 | ||
| 003 | DE-604 | ||
| 005 | 20210721 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 090403s2003 |||| o||u| ||||||eng d | ||
| 020 | |a 030648711X |c electronic bk. |9 0-306-48711-X | ||
| 035 | |a (OCoLC)645591498 | ||
| 035 | |a (DE-599)GBVNLM003527247 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-12 |a DE-384 |a DE-473 |a DE-824 |a DE-19 |a DE-91 |a DE-739 |a DE-355 |a DE-20 |a DE-706 |a DE-Aug4 |a DE-1046 |a DE-1102 |a DE-858 |a DE-1050 |a DE-1028 |a DE-573 |a DE-859 |a DE-M347 |a DE-1049 |a DE-92 |a DE-863 |a DE-37 |a DE-128 |a DE-22 |a DE-70 |a DE-Di1 |a DE-150 |a DE-210 |a DE-521 |a DE-522 |a DE-Eb1 |a DE-898 |a DE-860 |a DE-29 |a DE-703 |a DE-1043 |a DE-1047 |a DE-1051 |a DE-862 |a DE-634 |a DE-2070s |a DE-155 |a DE-83 |a DE-W89 |a DE-Re13 |a DE-523 | ||
| 050 | 0 | |a TK7895.E42 | |
| 082 | 0 | |a 004.256 | |
| 084 | |a ST 153 |0 (DE-625)143597: |2 rvk | ||
| 245 | 1 | 0 | |a Fault injection techniques and tools for embedded systems reliability evaluation |c edited by Alfredo Benso and Paolo Prinetto |
| 264 | 1 | |a Boston |b Kluwer Academic Publishers |c 2003 | |
| 300 | |a 1 Online-Ressource |b Illustrationen |c 25 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in electronic testing |v 23 | |
| 500 | |a Includes bibliographical references (p. [231]-241) | ||
| 533 | |a Online_Ausgabe |b Boulder, Colo |c NetLibrary |d 2004 |f E-Books von NetLibrary |n Sonstige Standardnummer des Gesamttitels: 22382847 |7 s2004 | ||
| 650 | 4 | |a Embedded computer systems - Reliability | |
| 650 | 4 | |a Embedded computer systems - Testing | |
| 650 | 4 | |a Fault location (Engineering) | |
| 650 | 4 | |a Embedded computer systems |x Reliability | |
| 650 | 4 | |a Embedded computer systems |x Testing | |
| 650 | 4 | |a Fault location (Engineering) | |
| 650 | 0 | 7 | |a Fehlersuche |0 (DE-588)4016615-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Eingebettetes System |0 (DE-588)4396978-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Reliabilität |0 (DE-588)4213628-3 |2 gnd |9 rswk-swf |
| 653 | |a Electronic books | ||
| 689 | 0 | 0 | |a Eingebettetes System |0 (DE-588)4396978-1 |D s |
| 689 | 0 | 1 | |a Fehlersuche |0 (DE-588)4016615-6 |D s |
| 689 | 0 | 2 | |a Reliabilität |0 (DE-588)4213628-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Benso, Alfredo |e Sonstige |4 oth | |
| 700 | 1 | |a Prinetto, Paolo |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Reproduktion von |t Fault injection techniques and tools for embedded systems reliability evaluation |d 2003 |
| 856 | 4 | 0 | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=121051 |3 Volltext |
| 912 | |a ZDB-1-NEL |a ZDB-4-NLEBK | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-017334050 | ||
Datensatz im Suchindex
| DE-BY-FWS_katkey | 342266 |
|---|---|
| _version_ | 1806177577920888832 |
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV035413525 |
| callnumber-first | T - Technology |
| callnumber-label | TK7895 |
| callnumber-raw | TK7895.E42 |
| callnumber-search | TK7895.E42 |
| callnumber-sort | TK 47895 E42 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 153 |
| collection | ZDB-1-NEL ZDB-4-NLEBK |
| ctrlnum | (OCoLC)645591498 (DE-599)GBVNLM003527247 |
| dewey-full | 004.256 |
| dewey-hundreds | 000 - Computer science, information, general works |
| dewey-ones | 004 - Computer science |
| dewey-raw | 004.256 |
| dewey-search | 004.256 |
| dewey-sort | 14.256 |
| dewey-tens | 000 - Computer science, information, general works |
| discipline | Informatik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02606nmm a2200541 cb4500</leader><controlfield tag="001">BV035413525</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20210721 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">090403s2003 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">030648711X</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">0-306-48711-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)645591498</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVNLM003527247</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-473</subfield><subfield code="a">DE-824</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-20</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-1102</subfield><subfield code="a">DE-858</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-1028</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-1049</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-37</subfield><subfield code="a">DE-128</subfield><subfield code="a">DE-22</subfield><subfield code="a">DE-70</subfield><subfield code="a">DE-Di1</subfield><subfield code="a">DE-150</subfield><subfield code="a">DE-210</subfield><subfield code="a">DE-521</subfield><subfield code="a">DE-522</subfield><subfield code="a">DE-Eb1</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-860</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-1047</subfield><subfield code="a">DE-1051</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-2070s</subfield><subfield code="a">DE-155</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-W89</subfield><subfield code="a">DE-Re13</subfield><subfield code="a">DE-523</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7895.E42</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">004.256</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 153</subfield><subfield code="0">(DE-625)143597:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Fault injection techniques and tools for embedded systems reliability evaluation</subfield><subfield code="c">edited by Alfredo Benso and Paolo Prinetto</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston</subfield><subfield code="b">Kluwer Academic Publishers</subfield><subfield code="c">2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield><subfield code="b">Illustrationen</subfield><subfield code="c">25 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Frontiers in electronic testing</subfield><subfield code="v">23</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (p. [231]-241)</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="a">Online_Ausgabe</subfield><subfield code="b">Boulder, Colo</subfield><subfield code="c">NetLibrary</subfield><subfield code="d">2004</subfield><subfield code="f">E-Books von NetLibrary</subfield><subfield code="n">Sonstige Standardnummer des Gesamttitels: 22382847</subfield><subfield code="7">s2004</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Embedded computer systems - Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Embedded computer systems - Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Fault location (Engineering)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Embedded computer systems</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Embedded computer systems</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Fault location (Engineering)</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlersuche</subfield><subfield code="0">(DE-588)4016615-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Eingebettetes System</subfield><subfield code="0">(DE-588)4396978-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Reliabilität</subfield><subfield code="0">(DE-588)4213628-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Electronic books</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Eingebettetes System</subfield><subfield code="0">(DE-588)4396978-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Fehlersuche</subfield><subfield code="0">(DE-588)4016615-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Reliabilität</subfield><subfield code="0">(DE-588)4213628-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Benso, Alfredo</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Prinetto, Paolo</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Reproduktion von</subfield><subfield code="t">Fault injection techniques and tools for embedded systems reliability evaluation</subfield><subfield code="d">2003</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=121051</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-1-NEL</subfield><subfield code="a">ZDB-4-NLEBK</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-017334050</subfield></datafield></record></collection> |
| id | DE-604.BV035413525 |
| illustrated | Not Illustrated |
| indexdate | 2024-08-01T11:39:26Z |
| institution | BVB |
| isbn | 030648711X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017334050 |
| oclc_num | 645591498 |
| open_access_boolean | |
| owner | DE-12 DE-384 DE-473 DE-BY-UBG DE-824 DE-19 DE-BY-UBM DE-91 DE-BY-TUM DE-739 DE-355 DE-BY-UBR DE-20 DE-706 DE-Aug4 DE-1046 DE-1102 DE-858 DE-1050 DE-1028 DE-573 DE-859 DE-M347 DE-1049 DE-92 DE-863 DE-BY-FWS DE-37 DE-128 DE-22 DE-BY-UBG DE-70 DE-Di1 DE-150 DE-210 DE-521 DE-522 DE-Eb1 DE-898 DE-BY-UBR DE-860 DE-29 DE-703 DE-1043 DE-1047 DE-1051 DE-862 DE-BY-FWS DE-634 DE-2070s DE-155 DE-BY-UBR DE-83 DE-W89 DE-Re13 DE-BY-UBR DE-523 |
| owner_facet | DE-12 DE-384 DE-473 DE-BY-UBG DE-824 DE-19 DE-BY-UBM DE-91 DE-BY-TUM DE-739 DE-355 DE-BY-UBR DE-20 DE-706 DE-Aug4 DE-1046 DE-1102 DE-858 DE-1050 DE-1028 DE-573 DE-859 DE-M347 DE-1049 DE-92 DE-863 DE-BY-FWS DE-37 DE-128 DE-22 DE-BY-UBG DE-70 DE-Di1 DE-150 DE-210 DE-521 DE-522 DE-Eb1 DE-898 DE-BY-UBR DE-860 DE-29 DE-703 DE-1043 DE-1047 DE-1051 DE-862 DE-BY-FWS DE-634 DE-2070s DE-155 DE-BY-UBR DE-83 DE-W89 DE-Re13 DE-BY-UBR DE-523 |
| physical | 1 Online-Ressource Illustrationen 25 cm |
| psigel | ZDB-1-NEL ZDB-4-NLEBK |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Kluwer Academic Publishers |
| record_format | marc |
| series2 | Frontiers in electronic testing |
| spellingShingle | Fault injection techniques and tools for embedded systems reliability evaluation Embedded computer systems - Reliability Embedded computer systems - Testing Fault location (Engineering) Embedded computer systems Reliability Embedded computer systems Testing Fehlersuche (DE-588)4016615-6 gnd Eingebettetes System (DE-588)4396978-1 gnd Reliabilität (DE-588)4213628-3 gnd |
| subject_GND | (DE-588)4016615-6 (DE-588)4396978-1 (DE-588)4213628-3 |
| title | Fault injection techniques and tools for embedded systems reliability evaluation |
| title_auth | Fault injection techniques and tools for embedded systems reliability evaluation |
| title_exact_search | Fault injection techniques and tools for embedded systems reliability evaluation |
| title_full | Fault injection techniques and tools for embedded systems reliability evaluation edited by Alfredo Benso and Paolo Prinetto |
| title_fullStr | Fault injection techniques and tools for embedded systems reliability evaluation edited by Alfredo Benso and Paolo Prinetto |
| title_full_unstemmed | Fault injection techniques and tools for embedded systems reliability evaluation edited by Alfredo Benso and Paolo Prinetto |
| title_short | Fault injection techniques and tools for embedded systems reliability evaluation |
| title_sort | fault injection techniques and tools for embedded systems reliability evaluation |
| topic | Embedded computer systems - Reliability Embedded computer systems - Testing Fault location (Engineering) Embedded computer systems Reliability Embedded computer systems Testing Fehlersuche (DE-588)4016615-6 gnd Eingebettetes System (DE-588)4396978-1 gnd Reliabilität (DE-588)4213628-3 gnd |
| topic_facet | Embedded computer systems - Reliability Embedded computer systems - Testing Fault location (Engineering) Embedded computer systems Reliability Embedded computer systems Testing Fehlersuche Eingebettetes System Reliabilität |
| url | http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=121051 |
| work_keys_str_mv | AT bensoalfredo faultinjectiontechniquesandtoolsforembeddedsystemsreliabilityevaluation AT prinettopaolo faultinjectiontechniquesandtoolsforembeddedsystemsreliabilityevaluation |