Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York, NY
Springer
2009
|
| Subjects: | |
| Online Access: | Inhaltsverzeichnis Klappentext |
| Item Description: | Literaturverz. S. 317 - 322 |
| Physical Description: | XI, 330 S. zahlr. Ill., graph. Darst. |
| ISBN: | 9780387857305 0387857303 |
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MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV035275776 | ||
| 003 | DE-604 | ||
| 005 | 20180328 | ||
| 007 | t | ||
| 008 | 090128s2009 ad|| |||| 00||| eng d | ||
| 015 | |a GBA8A7212 |2 dnb | ||
| 020 | |a 9780387857305 |9 978-0-387-85730-5 | ||
| 020 | |a 0387857303 |9 0-387-85730-3 | ||
| 035 | |a (OCoLC)248979308 | ||
| 035 | |a (DE-599)HBZTT050330101 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 |a DE-11 |a DE-29T |a DE-29 |a DE-19 | ||
| 050 | 0 | |a QH212.S3 | |
| 082 | 0 | |a 502.285 |2 22 | |
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a UH 6310 |0 (DE-625)159500: |2 rvk | ||
| 100 | 1 | |a Echlin, Patrick |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |c Patrick Echlin |
| 264 | 1 | |a New York, NY |b Springer |c 2009 | |
| 300 | |a XI, 330 S. |b zahlr. Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturverz. S. 317 - 322 | ||
| 650 | 4 | |a Scanning electron microscopy | |
| 650 | 4 | |a X-ray microanalysis | |
| 650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
| 689 | 1 | |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-0-387-85731-2 |
| 856 | 4 | 2 | |m Digitalisierung UB Bayreuth |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017081073&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 856 | 4 | 2 | |m Digitalisierung UB Bayreuth |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017081073&sequence=000004&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |3 Klappentext |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-017081073 | ||
Record in the Search Index
| _version_ | 1804138565517443072 |
|---|---|
| adam_text | Contents
Acknowledgments
........................................................................ ix
Chapter
1
Introduction
............................................................ 1
Chapter
2
Sample Collection and Selection
....................... 11
Chapter
3
Sample Preparation Tools
.................................... 19
Chapter
4
Sample Support
..................................................... 31
Chapters Sample Embedding and Mounting
................... 47
Chapter
6
Sample Exposure
................................................... 65
Chapter
7
Sample Dehydration
............................................. 97
Chapter
8
Sample Stabilization for Imaging
in the
SEM............................................................... 137
Chapter
9
Sample Stabilization to Preserve
Chemical Identity
.................................................. 185
Chapter
10
Sample Cleaning
................................................... 235
Chapter
11
Sample Surface Charge Elimination
.................. 247
Chapter
12
Sample Artifacts and Damage
............................ 299
Chapter
13
Additional Sources of
Inf ormation
.................... 307
References
....................................................................................... 317
Index
................................................................................................ 323
Xl
Handbook of Sample Preparation for Scanning
Electron Microscopy and
Х
-Ray Microanalysis
Patrick Echlin
This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron micro¬
scope and x-ray microanalyzers. Specimens range from inorganic, organic, biological, and geological samples
to materials such as metals, polymers, and semiconductors which can exist as solids, liquids and gases. While
the Handbook complements the best-selling textbook,
Sanning
Electron Microscopy and
Х
-Roy Microanalysis,
Third Edition, by Goldstein,
et al.,
it is entirely self-contained and describes what is needed up to the point the
sample is put into the instrument. Photomicrographs of each specimen complement the many sample prepa¬
ration recipes. Additional chapters describe the general features of specimen preparation in relation to the
different needs of scanning electron microscopes and x-ray microanalyzers, and an appendix covers chemicals
and equipment applicable to any of the recipes. This practical Handbook is an essential reference for anyone
who uses these instruments. It assumes only an elementary knowledge of preparation techniques but
also serves as an authoritative guide for more experienced microscopists.
|
| any_adam_object | 1 |
| author | Echlin, Patrick |
| author_facet | Echlin, Patrick |
| author_role | aut |
| author_sort | Echlin, Patrick |
| author_variant | p e pe |
| building | Verbundindex |
| bvnumber | BV035275776 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.S3 |
| callnumber-search | QH212.S3 |
| callnumber-sort | QH 3212 S3 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 6300 UH 6310 |
| ctrlnum | (OCoLC)248979308 (DE-599)HBZTT050330101 |
| dewey-full | 502.285 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.285 |
| dewey-search | 502.285 |
| dewey-sort | 3502.285 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02054nam a2200469 c 4500</leader><controlfield tag="001">BV035275776</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180328 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">090128s2009 ad|| |||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">GBA8A7212</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780387857305</subfield><subfield code="9">978-0-387-85730-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0387857303</subfield><subfield code="9">0-387-85730-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)248979308</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)HBZTT050330101</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-11</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-19</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QH212.S3</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502.285</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6310</subfield><subfield code="0">(DE-625)159500:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Echlin, Patrick</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis</subfield><subfield code="c">Patrick Echlin</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Springer</subfield><subfield code="c">2009</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XI, 330 S.</subfield><subfield code="b">zahlr. Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturverz. S. 317 - 322</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">X-ray microanalysis</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="z">978-0-387-85731-2</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung UB Bayreuth</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017081073&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung UB Bayreuth</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017081073&sequence=000004&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Klappentext</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-017081073</subfield></datafield></record></collection> |
| id | DE-604.BV035275776 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:30:13Z |
| institution | BVB |
| isbn | 9780387857305 0387857303 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017081073 |
| oclc_num | 248979308 |
| open_access_boolean | |
| owner | DE-703 DE-11 DE-29T DE-29 DE-19 DE-BY-UBM |
| owner_facet | DE-703 DE-11 DE-29T DE-29 DE-19 DE-BY-UBM |
| physical | XI, 330 S. zahlr. Ill., graph. Darst. |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | Springer |
| record_format | marc |
| spelling | Echlin, Patrick Verfasser aut Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin New York, NY Springer 2009 XI, 330 S. zahlr. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturverz. S. 317 - 322 Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Erscheint auch als Online-Ausgabe 978-0-387-85731-2 Digitalisierung UB Bayreuth application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017081073&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis Digitalisierung UB Bayreuth application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017081073&sequence=000004&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA Klappentext |
| spellingShingle | Echlin, Patrick Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4151898-6 (DE-588)4048455-5 |
| title | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
| title_auth | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
| title_exact_search | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
| title_full | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin |
| title_fullStr | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin |
| title_full_unstemmed | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin |
| title_short | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
| title_sort | handbook of sample preparation for scanning electron microscopy and x ray microanalysis |
| topic | Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Scanning electron microscopy X-ray microanalysis Elektronenstrahlmikroanalyse Rasterelektronenmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017081073&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017081073&sequence=000004&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT echlinpatrick handbookofsamplepreparationforscanningelectronmicroscopyandxraymicroanalysis |