(2008). Structural, syntactic, and statistical pattern recognition: Joint IAPR international workshop, SSPR & SPR 2008, Orlando, USA, December 4 - 6, 2008 ; proceedings. Springer. https://doi.org/10.1007/978-3-540-89689-0
Chicago Style (17th ed.) CitationStructural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4 - 6, 2008 ; Proceedings. Berlin [u.a.]: Springer, 2008. https://doi.org/10.1007/978-3-540-89689-0.
MLA (9th ed.) CitationStructural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4 - 6, 2008 ; Proceedings. Springer, 2008. https://doi.org/10.1007/978-3-540-89689-0.
Warning: These citations may not always be 100% accurate.