Structural, syntactic, and statistical pattern recognition: joint IAPR international workshop, SSPR & SPR 2008, Orlando, USA, December 4 - 6, 2008 ; proceedings
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Berlin [u.a.] Springer 2008
Series:Lecture notes in computer science 5342
Subjects:
Online Access:Inhaltsverzeichnis
Item Description:Literaturangaben
Physical Description:XXIII, 1011 S. Ill., graph. Darst. 24 cm
ISBN:9783540896883

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