(2008). Software process and product measurement: International conferences, IWSM 2008, MetriKon 2008, and Mensura 2008, Munich, Germany, November 18 - 19, 2008 ; proceedings. Springer.
Chicago-Zitierstil (17. Ausg.)Software Process and Product Measurement: International Conferences, IWSM 2008, MetriKon 2008, and Mensura 2008, Munich, Germany, November 18 - 19, 2008 ; Proceedings. Berlin [u.a.]: Springer, 2008.
MLA-Zitierstil (9. Ausg.)Software Process and Product Measurement: International Conferences, IWSM 2008, MetriKon 2008, and Mensura 2008, Munich, Germany, November 18 - 19, 2008 ; Proceedings. Springer, 2008.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.