High performance memory testing: design principles, fault modeling, and self-test
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Boston
Kluwer Academic
2003
|
| Series: | Frontiers in electronic testing
|
| Subjects: | |
| Online Access: | Publisher description Table of contents only |
| Item Description: | Includes bibliographical references (p. [229]-239) and index Includes bibliographical references (p. [229]-239) and index |
| Physical Description: | xiii, 246 p. graph. Darst. 25 cm |
| ISBN: | 9781402072550 |
Staff View
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV035026013 | ||
| 003 | DE-604 | ||
| 005 | 20081006 | ||
| 007 | t | ||
| 008 | 080827s2003 xxud||| |||| 00||| eng d | ||
| 010 | |a 2002034049 | ||
| 020 | |a 9781402072550 |c alk. paper |9 978-1-4020-7255-0 | ||
| 035 | |a (OCoLC)635777125 | ||
| 035 | |a (DE-599)BVBBV035026013 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c US | ||
| 049 | |a DE-Aug4 | ||
| 050 | 0 | |a TK7895.M4 | |
| 082 | 0 | |a 621.39/732 | |
| 084 | |a ST 175 |0 (DE-625)143603: |2 rvk | ||
| 100 | 1 | |a Adams, R. Dean |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a High performance memory testing |b design principles, fault modeling, and self-test |c R. Dean Adams |
| 264 | 1 | |a Boston |b Kluwer Academic |c 2003 | |
| 300 | |a xiii, 246 p. |b graph. Darst. |c 25 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in electronic testing | |
| 500 | |a Includes bibliographical references (p. [229]-239) and index | ||
| 500 | |a Includes bibliographical references (p. [229]-239) and index | ||
| 650 | 4 | |a Semiconductor storage devices |x Testing | |
| 650 | 4 | |a Computer storage devices |x Testing | |
| 856 | 4 | |u http://www.loc.gov/catdir/enhancements/fy0821/2002034049-d.html |3 Publisher description | |
| 856 | 4 | |u http://www.loc.gov/catdir/enhancements/fy0821/2002034049-t.html |3 Table of contents only | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-016695058 | ||
Record in the Search Index
| _version_ | 1804137954150449152 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Adams, R. Dean |
| author_facet | Adams, R. Dean |
| author_role | aut |
| author_sort | Adams, R. Dean |
| author_variant | r d a rd rda |
| building | Verbundindex |
| bvnumber | BV035026013 |
| callnumber-first | T - Technology |
| callnumber-label | TK7895 |
| callnumber-raw | TK7895.M4 |
| callnumber-search | TK7895.M4 |
| callnumber-sort | TK 47895 M4 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 175 |
| ctrlnum | (OCoLC)635777125 (DE-599)BVBBV035026013 |
| dewey-full | 621.39/732 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/732 |
| dewey-search | 621.39/732 |
| dewey-sort | 3621.39 3732 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01440nam a2200397zc 4500</leader><controlfield tag="001">BV035026013</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20081006 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">080827s2003 xxud||| |||| 00||| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2002034049</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781402072550</subfield><subfield code="c">alk. paper</subfield><subfield code="9">978-1-4020-7255-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)635777125</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV035026013</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-Aug4</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7895.M4</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/732</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 175</subfield><subfield code="0">(DE-625)143603:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Adams, R. Dean</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">High performance memory testing</subfield><subfield code="b">design principles, fault modeling, and self-test</subfield><subfield code="c">R. Dean Adams</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston</subfield><subfield code="b">Kluwer Academic</subfield><subfield code="c">2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiii, 246 p.</subfield><subfield code="b">graph. Darst.</subfield><subfield code="c">25 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Frontiers in electronic testing</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (p. [229]-239) and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (p. [229]-239) and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductor storage devices</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer storage devices</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="856" ind1="4" ind2=" "><subfield code="u">http://www.loc.gov/catdir/enhancements/fy0821/2002034049-d.html</subfield><subfield code="3">Publisher description</subfield></datafield><datafield tag="856" ind1="4" ind2=" "><subfield code="u">http://www.loc.gov/catdir/enhancements/fy0821/2002034049-t.html</subfield><subfield code="3">Table of contents only</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-016695058</subfield></datafield></record></collection> |
| id | DE-604.BV035026013 |
| illustrated | Illustrated |
| index_date | 2024-07-02T21:47:54Z |
| indexdate | 2024-07-09T21:20:30Z |
| institution | BVB |
| isbn | 9781402072550 |
| language | English |
| lccn | 2002034049 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016695058 |
| oclc_num | 635777125 |
| open_access_boolean | |
| owner | DE-Aug4 |
| owner_facet | DE-Aug4 |
| physical | xiii, 246 p. graph. Darst. 25 cm |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Kluwer Academic |
| record_format | marc |
| series2 | Frontiers in electronic testing |
| spelling | Adams, R. Dean Verfasser aut High performance memory testing design principles, fault modeling, and self-test R. Dean Adams Boston Kluwer Academic 2003 xiii, 246 p. graph. Darst. 25 cm txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing Includes bibliographical references (p. [229]-239) and index Semiconductor storage devices Testing Computer storage devices Testing http://www.loc.gov/catdir/enhancements/fy0821/2002034049-d.html Publisher description http://www.loc.gov/catdir/enhancements/fy0821/2002034049-t.html Table of contents only |
| spellingShingle | Adams, R. Dean High performance memory testing design principles, fault modeling, and self-test Semiconductor storage devices Testing Computer storage devices Testing |
| title | High performance memory testing design principles, fault modeling, and self-test |
| title_auth | High performance memory testing design principles, fault modeling, and self-test |
| title_exact_search | High performance memory testing design principles, fault modeling, and self-test |
| title_exact_search_txtP | High performance memory testing design principles, fault modeling, and self-test |
| title_full | High performance memory testing design principles, fault modeling, and self-test R. Dean Adams |
| title_fullStr | High performance memory testing design principles, fault modeling, and self-test R. Dean Adams |
| title_full_unstemmed | High performance memory testing design principles, fault modeling, and self-test R. Dean Adams |
| title_short | High performance memory testing |
| title_sort | high performance memory testing design principles fault modeling and self test |
| title_sub | design principles, fault modeling, and self-test |
| topic | Semiconductor storage devices Testing Computer storage devices Testing |
| topic_facet | Semiconductor storage devices Testing Computer storage devices Testing |
| url | http://www.loc.gov/catdir/enhancements/fy0821/2002034049-d.html http://www.loc.gov/catdir/enhancements/fy0821/2002034049-t.html |
| work_keys_str_mv | AT adamsrdean highperformancememorytestingdesignprinciplesfaultmodelingandselftest |