The path checking method applied to multiple fault analysis of switching circuits:
Gespeichert in:
1. Verfasser: | |
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Format: | Abschlussarbeit Mikrofilm Buch |
Sprache: | English |
Veröffentlicht: |
1976
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Ausgabe: | [Mikrofiche-Ausg.] |
Schlagworte: | |
Beschreibung: | Bibliography: leaves 202-205 |
Beschreibung: | [2], VIII, 205 [i.e. 206] leaves graph. Darst. |
Internformat
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500 | |a Bibliography: leaves 202-205 | ||
502 | |a East Lansing, Mich., Univ., Diss., 1976 | ||
533 | |a Mikroform-Ausgabe |b Ann Arbor, Mich. |c Univ. Microfilms Internat. |d 1977 |e 3 Mikrofiches | ||
650 | 4 | |a Electric fault location | |
650 | 4 | |a Switching circuits | |
650 | 4 | |a Electric fault location | |
650 | 4 | |a Switching circuits | |
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999 | |a oai:aleph.bib-bvb.de:BVB01-016684071 |
Datensatz im Suchindex
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adam_txt | |
any_adam_object | |
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author | Chen, Tze Tzong |
author_facet | Chen, Tze Tzong |
author_role | aut |
author_sort | Chen, Tze Tzong |
author_variant | t t c tt ttc |
building | Verbundindex |
bvnumber | BV035014885 |
ctrlnum | (OCoLC)3495411 (DE-599)BVBBV035014885 |
dewey-full | 621.38153 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.38153 |
dewey-search | 621.38153 |
dewey-sort | 3621.38153 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | [Mikrofiche-Ausg.] |
format | Thesis Microfilm Book |
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genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
genre_facet | Hochschulschrift |
id | DE-604.BV035014885 |
illustrated | Illustrated |
index_date | 2024-07-02T21:45:06Z |
indexdate | 2024-07-09T21:20:14Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016684071 |
oclc_num | 3495411 |
open_access_boolean | |
owner | DE-706 |
owner_facet | DE-706 |
physical | [2], VIII, 205 [i.e. 206] leaves graph. Darst. |
publishDate | 1976 |
publishDateSearch | 1976 |
publishDateSort | 1976 |
record_format | marc |
spelling | Chen, Tze Tzong Verfasser aut The path checking method applied to multiple fault analysis of switching circuits by Tze Tzong Chen [Mikrofiche-Ausg.] 1976 [2], VIII, 205 [i.e. 206] leaves graph. Darst. txt rdacontent h rdamedia he rdacarrier Bibliography: leaves 202-205 East Lansing, Mich., Univ., Diss., 1976 Mikroform-Ausgabe Ann Arbor, Mich. Univ. Microfilms Internat. 1977 3 Mikrofiches Electric fault location Switching circuits (DE-588)4113937-9 Hochschulschrift gnd-content Reproduktion von Chen, Tze Tzong The path checking method applied to multiple fault analysis of switching circuits 1976 |
spellingShingle | Chen, Tze Tzong The path checking method applied to multiple fault analysis of switching circuits Electric fault location Switching circuits |
subject_GND | (DE-588)4113937-9 |
title | The path checking method applied to multiple fault analysis of switching circuits |
title_auth | The path checking method applied to multiple fault analysis of switching circuits |
title_exact_search | The path checking method applied to multiple fault analysis of switching circuits |
title_exact_search_txtP | The path checking method applied to multiple fault analysis of switching circuits |
title_full | The path checking method applied to multiple fault analysis of switching circuits by Tze Tzong Chen |
title_fullStr | The path checking method applied to multiple fault analysis of switching circuits by Tze Tzong Chen |
title_full_unstemmed | The path checking method applied to multiple fault analysis of switching circuits by Tze Tzong Chen |
title_short | The path checking method applied to multiple fault analysis of switching circuits |
title_sort | the path checking method applied to multiple fault analysis of switching circuits |
topic | Electric fault location Switching circuits |
topic_facet | Electric fault location Switching circuits Hochschulschrift |
work_keys_str_mv | AT chentzetzong thepathcheckingmethodappliedtomultiplefaultanalysisofswitchingcircuits |