Beiträge zur Interferenzmikroskopie:
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Book |
| Language: | Undetermined |
| Published: |
Berlin
Akademie-Verl.
1961
|
| Subjects: | |
| Physical Description: | IX, 352 S. Ill. |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV025937942 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 100417s1961 a||| |||| 00||| und d | ||
| 035 | |a (OCoLC)603527738 | ||
| 035 | |a (DE-599)BVBBV025937942 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-11 | ||
| 084 | |a UH 6700 |0 (DE-625)145770: |2 rvk | ||
| 100 | 1 | |a Krug, Wolfgang |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Beiträge zur Interferenzmikroskopie |c von Wolfgang ; Joachim Rienitz ; Günter Schulz |
| 264 | 1 | |a Berlin |b Akademie-Verl. |c 1961 | |
| 300 | |a IX, 352 S. |b Ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Strahlung |0 (DE-588)4057849-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Messtechnik |0 (DE-588)4114575-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Wellenfront |0 (DE-588)4189546-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Anwendung |0 (DE-588)4196864-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroskop |0 (DE-588)4039237-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Interferenzmikroskopie |0 (DE-588)4162004-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Interferenzmikroskopie |0 (DE-588)4162004-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Mikroskop |0 (DE-588)4039237-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Wellenfront |0 (DE-588)4189546-0 |D s |
| 689 | 2 | |5 DE-604 | |
| 689 | 3 | 0 | |a Strahlung |0 (DE-588)4057849-5 |D s |
| 689 | 3 | |5 DE-604 | |
| 689 | 4 | 0 | |a Messtechnik |0 (DE-588)4114575-6 |D s |
| 689 | 4 | |5 DE-604 | |
| 689 | 5 | 0 | |a Anwendung |0 (DE-588)4196864-5 |D s |
| 689 | 5 | |5 DE-604 | |
| 700 | 1 | |a Rienitz, Joachim |e Verfasser |4 aut | |
| 700 | 1 | |a Schulz, Günter |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-019182108 | ||
Record in the Search Index
| _version_ | 1804141400207392768 |
|---|---|
| any_adam_object | |
| author | Krug, Wolfgang Rienitz, Joachim Schulz, Günter |
| author_facet | Krug, Wolfgang Rienitz, Joachim Schulz, Günter |
| author_role | aut aut aut |
| author_sort | Krug, Wolfgang |
| author_variant | w k wk j r jr g s gs |
| building | Verbundindex |
| bvnumber | BV025937942 |
| classification_rvk | UH 6700 |
| ctrlnum | (OCoLC)603527738 (DE-599)BVBBV025937942 |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01648nam a2200493 c 4500</leader><controlfield tag="001">BV025937942</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">100417s1961 a||| |||| 00||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)603527738</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV025937942</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6700</subfield><subfield code="0">(DE-625)145770:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Krug, Wolfgang</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Beiträge zur Interferenzmikroskopie</subfield><subfield code="c">von Wolfgang ; Joachim Rienitz ; Günter Schulz</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin</subfield><subfield code="b">Akademie-Verl.</subfield><subfield code="c">1961</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 352 S.</subfield><subfield code="b">Ill.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Strahlung</subfield><subfield code="0">(DE-588)4057849-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Messtechnik</subfield><subfield code="0">(DE-588)4114575-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Wellenfront</subfield><subfield code="0">(DE-588)4189546-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Anwendung</subfield><subfield code="0">(DE-588)4196864-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroskop</subfield><subfield code="0">(DE-588)4039237-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Interferenzmikroskopie</subfield><subfield code="0">(DE-588)4162004-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Interferenzmikroskopie</subfield><subfield code="0">(DE-588)4162004-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Mikroskop</subfield><subfield code="0">(DE-588)4039237-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Wellenfront</subfield><subfield code="0">(DE-588)4189546-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Strahlung</subfield><subfield code="0">(DE-588)4057849-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Messtechnik</subfield><subfield code="0">(DE-588)4114575-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Anwendung</subfield><subfield code="0">(DE-588)4196864-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Rienitz, Joachim</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Schulz, Günter</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-019182108</subfield></datafield></record></collection> |
| id | DE-604.BV025937942 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:15:16Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019182108 |
| oclc_num | 603527738 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | IX, 352 S. Ill. |
| publishDate | 1961 |
| publishDateSearch | 1961 |
| publishDateSort | 1961 |
| publisher | Akademie-Verl. |
| record_format | marc |
| spelling | Krug, Wolfgang Verfasser aut Beiträge zur Interferenzmikroskopie von Wolfgang ; Joachim Rienitz ; Günter Schulz Berlin Akademie-Verl. 1961 IX, 352 S. Ill. txt rdacontent n rdamedia nc rdacarrier Strahlung (DE-588)4057849-5 gnd rswk-swf Messtechnik (DE-588)4114575-6 gnd rswk-swf Wellenfront (DE-588)4189546-0 gnd rswk-swf Anwendung (DE-588)4196864-5 gnd rswk-swf Mikroskop (DE-588)4039237-5 gnd rswk-swf Interferenzmikroskopie (DE-588)4162004-5 gnd rswk-swf Interferenzmikroskopie (DE-588)4162004-5 s DE-604 Mikroskop (DE-588)4039237-5 s Wellenfront (DE-588)4189546-0 s Strahlung (DE-588)4057849-5 s Messtechnik (DE-588)4114575-6 s Anwendung (DE-588)4196864-5 s Rienitz, Joachim Verfasser aut Schulz, Günter Verfasser aut |
| spellingShingle | Krug, Wolfgang Rienitz, Joachim Schulz, Günter Beiträge zur Interferenzmikroskopie Strahlung (DE-588)4057849-5 gnd Messtechnik (DE-588)4114575-6 gnd Wellenfront (DE-588)4189546-0 gnd Anwendung (DE-588)4196864-5 gnd Mikroskop (DE-588)4039237-5 gnd Interferenzmikroskopie (DE-588)4162004-5 gnd |
| subject_GND | (DE-588)4057849-5 (DE-588)4114575-6 (DE-588)4189546-0 (DE-588)4196864-5 (DE-588)4039237-5 (DE-588)4162004-5 |
| title | Beiträge zur Interferenzmikroskopie |
| title_auth | Beiträge zur Interferenzmikroskopie |
| title_exact_search | Beiträge zur Interferenzmikroskopie |
| title_full | Beiträge zur Interferenzmikroskopie von Wolfgang ; Joachim Rienitz ; Günter Schulz |
| title_fullStr | Beiträge zur Interferenzmikroskopie von Wolfgang ; Joachim Rienitz ; Günter Schulz |
| title_full_unstemmed | Beiträge zur Interferenzmikroskopie von Wolfgang ; Joachim Rienitz ; Günter Schulz |
| title_short | Beiträge zur Interferenzmikroskopie |
| title_sort | beitrage zur interferenzmikroskopie |
| topic | Strahlung (DE-588)4057849-5 gnd Messtechnik (DE-588)4114575-6 gnd Wellenfront (DE-588)4189546-0 gnd Anwendung (DE-588)4196864-5 gnd Mikroskop (DE-588)4039237-5 gnd Interferenzmikroskopie (DE-588)4162004-5 gnd |
| topic_facet | Strahlung Messtechnik Wellenfront Anwendung Mikroskop Interferenzmikroskopie |
| work_keys_str_mv | AT krugwolfgang beitragezurinterferenzmikroskopie AT rienitzjoachim beitragezurinterferenzmikroskopie AT schulzgunter beitragezurinterferenzmikroskopie |