Particle beam microanalysis: fundamentals, methods and applications
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Weinheim [u. a.]
VCH Verl.-Ges.
1990
|
| Subjects: | |
| Physical Description: | XVIII, 507 S. Ill. |
| ISBN: | 3527268847 0895735059 |
Staff View
MARC
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| author | Fuchs, Ekkehard Oppolzer, Helmut Rehme, Hans |
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| author_sort | Fuchs, Ekkehard |
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| bvnumber | BV025857639 |
| classification_rvk | UX 1380 ZQ 3500 |
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| discipline | Physik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
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| id | DE-604.BV025857639 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:13:50Z |
| institution | BVB |
| isbn | 3527268847 0895735059 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019105489 |
| oclc_num | 246929806 |
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| owner | DE-11 |
| owner_facet | DE-11 |
| physical | XVIII, 507 S. Ill. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | VCH Verl.-Ges. |
| record_format | marc |
| spelling | Fuchs, Ekkehard Verfasser (DE-588)105898066 aut Particle beam microanalysis fundamentals, methods and applications E. Fuchs ; H. Oppolzer ; H. Rehme Weinheim [u. a.] VCH Verl.-Ges. 1990 XVIII, 507 S. Ill. txt rdacontent n rdamedia nc rdacarrier Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Teilchenstrahl (DE-588)4165339-7 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Elektronenstrahltesten (DE-588)4130208-4 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Elektronenmikroskopie (DE-588)4014327-2 s Elektronenstrahltesten (DE-588)4130208-4 s Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Mikroanalyse (DE-588)4169804-6 s Teilchenstrahl (DE-588)4165339-7 s Oppolzer, Helmut Verfasser (DE-588)110577000 aut Rehme, Hans Verfasser (DE-588)106864009 aut |
| spellingShingle | Fuchs, Ekkehard Oppolzer, Helmut Rehme, Hans Particle beam microanalysis fundamentals, methods and applications Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Teilchenstrahl (DE-588)4165339-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Elektronenstrahltesten (DE-588)4130208-4 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Mikroanalyse (DE-588)4169804-6 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)4165339-7 (DE-588)4151898-6 (DE-588)4130208-4 (DE-588)4014327-2 (DE-588)4169804-6 |
| title | Particle beam microanalysis fundamentals, methods and applications |
| title_auth | Particle beam microanalysis fundamentals, methods and applications |
| title_exact_search | Particle beam microanalysis fundamentals, methods and applications |
| title_full | Particle beam microanalysis fundamentals, methods and applications E. Fuchs ; H. Oppolzer ; H. Rehme |
| title_fullStr | Particle beam microanalysis fundamentals, methods and applications E. Fuchs ; H. Oppolzer ; H. Rehme |
| title_full_unstemmed | Particle beam microanalysis fundamentals, methods and applications E. Fuchs ; H. Oppolzer ; H. Rehme |
| title_short | Particle beam microanalysis |
| title_sort | particle beam microanalysis fundamentals methods and applications |
| title_sub | fundamentals, methods and applications |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Teilchenstrahl (DE-588)4165339-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Elektronenstrahltesten (DE-588)4130208-4 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Mikroanalyse (DE-588)4169804-6 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie Teilchenstrahl Elektronenstrahlmikroanalyse Elektronenstrahltesten Elektronenmikroskopie Mikroanalyse |
| work_keys_str_mv | AT fuchsekkehard particlebeammicroanalysisfundamentalsmethodsandapplications AT oppolzerhelmut particlebeammicroanalysisfundamentalsmethodsandapplications AT rehmehans particlebeammicroanalysisfundamentalsmethodsandapplications |