Noncontact atomic force microscopy: Volume 2
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2009
|
| Ausgabe: | 1. Aufl. |
| Schriftenreihe: | NanoScience and Technology
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XVIII, 401 S. Ill., graph. Darst. |
| ISBN: | 9783642014949 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV025564886 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 100417s2009 gw ad|| |||| 00||| eng d | ||
| 015 | |a 09,N23,2501 |2 dnb | ||
| 016 | 7 | |a 994394314 |2 DE-101 | |
| 020 | |a 9783642014949 |9 978-3-642-01494-9 | ||
| 024 | 3 | |a 9783642014949 | |
| 028 | 5 | 2 | |a 12279104 |
| 035 | |a (OCoLC)917561854 | ||
| 035 | |a (DE-599)BVBBV025564886 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c XA-DE-BE | ||
| 049 | |a DE-11 | ||
| 084 | |a UH 6320 |0 (DE-625)145762: |2 rvk | ||
| 245 | 1 | 0 | |a Noncontact atomic force microscopy |b Volume 2 |c Ed. Seizo Morita ... |
| 250 | |a 1. Aufl. | ||
| 264 | 1 | |a Berlin [u.a.] |b Springer |c 2009 | |
| 300 | |a XVIII, 401 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a NanoScience and Technology | |
| 650 | 0 | 7 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Morita, Seizo |4 edt | |
| 856 | 4 | 2 | |m DNB Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=020163908&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-020163908 | ||
Datensatz im Suchindex
| _version_ | 1804142741272133632 |
|---|---|
| adam_text | INTRODUCTION 31 CONTENTS 1 INTRODUCTION SEIZO MONTA 1 1.1 RAPIDLY
DEVELOPING HIGH PERFORMANCE AFM 1 1.1.1 PRESENT STATUS OF HIGH
PERFORMANCE AFM 4 1.2 FUTURE PROSPECTS FOR HIGH PERFORMANCE AFM 8 1.2.1
ATOMIC AND MOLECULAR IMAGING IN LIQUIDS 8 1.2.2 MAGNETIC EXCHANGE FORCE
MICROSCOPY 8 1.2.3 RAPID GROWTH OF TUNING FORK/QPLUS SENSOR 11 1.2.4
DIFFERENTIATION OF ATOMIC FORCE 11 1.2.5 ATOM-BY-ATOM ASSEMBLY OF
COMPLEX NANOSTRUCTURE AT RT 12 REFERENCES 13 2 METHOD FOR PRECISE FORCE
MEASUREMENTS MASAYUKI ABE AND KEN-ICHI MORITA 15 2.1 QUANTITATIVE FORCE
CALCULATION 15 2.2 THERMAL DRIFT 16 2.3 THREE-FOLD FEEDBACK FOR PRECISE
TIP-SAMPLE POSITIONING 16 2.3.1 PRINCIPLE OF ATOM-TRACKING 17 2.3.2
EXPERIMENTAL SETUP 18 2.3.3 SITE-SPECIFIC FORCE SPECTROSCOPY AT ROOM
TEMPERATURE.... 20 2.4 THERMAL DRIFT COMPENSATION FOR FORCE FIELD
MAPPING 23 2.4.1 CONCEPT OF FEEDFORWARD 23 2.4.2 FORCE MAPPING AT ROOM
TEMPERATURE WITH FEEDFORWARD ... 24 2.4.3 FORCE MAPPING WITH FEEDFORWARD
26 2.5 SUMMARY 29 REFERENCES 29 3 FORCE SPECTROSCOPY ON SEMICONDUCTOR
SURFACES OSCAR CUSTANCE, NORIAKI OYABU, AND YOSHIAKI SUGIMOTO 31 3.1
BIBLIOGRAFISCHE INFORMATIONEN HTTP://D-NB.INFO/994394314 DIGITALISIERT
DURCH VIII CONTENTS 3.2 EXPERIMENTAL CONSIDERATIONS 33 3.2.1 EXTRACTION
OF THE SHORT-RANGE FORCE FROM THE FREQUENCY SHIFT 34 3.2.2 DETERMINATION
OF RELEVANT ACQUISITION PARAMETERS 36 3.3 ENERGY DISSIPATION AND FORCE
SPECTROSCOPY 38 3.3.1 TIP-APEX CHARACTERIZATION COMBINING FORCE
SPECTROSCOPY AND FIRST-PRINCIPLES CALCULATIONS 38 3.3.2 IDENTIFICATION
OF AN ENERGY DISSIPATION CHANNEL 42 3.3.3 SURFACE ADHESION MAPS AT
ATOMIC SCALE 45 3.3.4 SIGNATURES OF ENERGY DISSIPATION IN FREQUENCY
SHIFT AND FORCE CURVES 46 3.4 FORCE SPECTROSCOPY AND ATOMIC RELAXATIONS
48 3.5 SINGLE ATOM CHEMICAL IDENTIFICATION 53 3.6 FORCE SPECTROSCOPY
WITH HIGHER FLEXURAL MODES 61 3.7 SUMMARY 65 REFERENCES 66 4 TIP*SAMPLE
INTERACTIONS AS A FUNCTION OF DISTANCE ON INSULATING SURFACES REGINA
HOFFMANN 69 4.1 EXPERIMENTAL EVALUATION OF SHORT-RANGE FORCES 70 4.1.1
MEASUREMENT TECHNIQUES 70 4.1.2 CONVERSION OF FREQUENCY SHIFT TO FORCE
72 4.1.3 SEPARATION OF SHORT-RANGE AND LONG-RANGE FORCES 73 4.2
SHORT-RANGE FORCES ON INSULATING SURFACES 76 4.2.1 SIMPLE MODEL FOR
ELECTROSTATIC FORCES 76 4.2.2 RELAXATION AND REALISTIC ELECTROSTATIC
INTERACTIONS 78 4.2.3 INTERACTION OF A TIP WITH A WELL-KNOWN SURFACE 80
4.2.4 SUBLATTICE IDENTIFICATION ON ALKALI HALIDE SURFACES 82 4.2.5 FULL
THREE-DIMENSIONAL FORCE FIELD 83 4.2.6 ATOMIC JUMPS AND ENERGY
DISSIPATION 86 REFERENCE CONTENTS IX 5.3.2 FORCE VECTOR FIELDS ON KBR
110 5.4 TRUE 3D FORCE FIELD SPECTROSCOPY ON GRAPHITE 113 REFERENCES 117
6 PRINCIPLES AND APPLICATIONS OF THE QPLUS SENSOR FRANZ J. GIESSIBL 121
6.1 MOTIVATION: QPLUS VERSUS SI CANTILEVER 121 6.1.1 SPECIFICATIONS OF
AN ATOMIC FORCE PROBE 122 6.1.2 CANTILEVERS IN DYNAMIC FORCE MICROSCOPY
124 6.1.3 ADVANTAGES OF SMALL AMPLITUDE OPERATION 125 6.1.4 IDEAL
PHYSICAL PROPERTIES OF CANTILEVERS 128 6.2 THEORY OF QPLUS VERSUS TUNING
FORK SENSORS 128 6.2.1 QUARTZ TUNING FORKS 128 6.2.2 QPLUS SENSOR 131
6.2.3 MANUFACTURING HIGH QUALITY QPLUS SENSORS 132 6.2.4 PREAMPLIFIERS
FOR QPLUS SENSORS 134 6.3 APPLICATIONS 137 6.3.1 OWN RESULTS 137 6.3.2
EXTERNAL GROUPS 138 6.4 OUTLOOK 138 REFERENCES 140 7 STUDY OF THIN OXIDE
FILMS WITH NC-AFM: ATOMICALLY RESOLVED IMAGING AND BEYOND M. HEYDE, G.H.
SIMON, AND T. KOENIG 143 7.1 INTRODUCTION 143 7.2 METHODS AND
EXPERIMENTAL SETUP 145 7.2.1 QUARTZ TUNING FORK-BASED SENSOR FOR
DUAL-MODE NC-AFM/STM 145 7.2.2 CONCEPTS FOR FORCE AND ENERGY EXTRACTION
AND SENSOR CHARACTERIZATION 148 7.3 ATOMIC RESOLUTION IMAGING 150 7.4
BEYOND IMAGING: SPECTROSCOPY 156 7.4.1 Z-SPECTROSCOPY ON SPECIFIC ATOMIC
SITES 157 7.4.2 WORK FUNCTION SHIFT MEASUREMENTS 160 7.5 CONCLUSION 165
REFERENCE X CONTENTS 8.7 INTERCHANGE VERTICAL ATOM MANIPULATION 184 8.8
SUMMARY 188 REFERENCES 189 9 ATOMIC MANIPULATION ON METAL SURFACES
MARKUS TERNES, CHRISTOPHER P. LUTZ, AND ANDREAS J. HEINRICH 191 9.1
INTRODUCTION 192 9.2 MODES OF MANIPULATION 193 9.3 INSTRUMENTATION 195
9.3.1 DETECTED SIGNALS 197 9.4 FORCES DURING ADSORBATE MANIPULATING 199
9.4.1 MANIPULATING A SMALL MOLECULE: CO ON CU(LLL) 206 9.5 MODELING
FORCES AND CONDUCTANCE 207 9.6 MAPPING THE ENERGY LANDSCAPE 209 9.7
SUMMARY 213 REFERENCES 213 10 ATOMIC MANIPULATION ON AN INSULATOR
SURFACE SABINE HIRTH, FRANK OSTENDORF, AND MICHAEL REICHLING 217 10.1
INTRODUCTION 218 10.2 BASIC PRINCIPLES 218 10.2.1 EXPERIMENTAL
PROCEDURES 218 10.2.2 SURFACE CHARACTERIZATION 219 10.3 EXPERIMENTAL
RESULTS 221 10.3.1 DEFECT PREPARATION AND CONTRAST FORMATION 221 10.3.2
MANIPULATION OF MOBILE DEFECTS 223 10.3.3 VELOCITY DEPENDENCE OF
MANIPULATION 225 10.4 CONCLUSIONS 225 REFERENCES 226 11 BASIC MECHANISMS
FOR SINGLE ATOM MANIPULATION IN SEMICONDUCTOR SYSTEMS WITH THE FM-AFM
PABLO ***, PAVEL JELINEK, AND RUBEN PEREZ 227 11.1 INTRODUCTION 227 11.2
THEORETICAL APPROACH: FIRST-PRINCIPLES SIMULATION CONTENTS XI 12
MULTI-SCALE MODELLING OF NC-AFM IMAGING AND MANIPULATION AT INSULATING
SURFACES T. TREVETHAN, N. MARTSINOVICH, L. KANTOROVICH, AND A.L. SHLUGER
251 12.1 INTRODUCTION 251 12.2 METHODS 253 12.2.1 MODELLING THE
INSTRUMENT 253 12.2.2 MODELLING THE TIP-SURFACE JUNCTION 254 12.2.3
KINETIC MONTE CARLO 256 12.3 APPLICATIONS 258 12.3.1 PD ADATOM ON MGO
(001) 258 12.3.2 H 2 O ADSORBATE ON CEO 2 (111) 263 12.3.3 C 60 ON SI
(001) 265 12.4 DISCUSSION 270 REFERENCES 272 13 MAGNETIC EXCHANGE FORCE
MICROSCOPY ALEXANDER SCHWARZ, UWE KAISER, RENE SCHMIDT, AND ROLAND
WIESENDANGER 275 13.1 INTRODUCTION 275 13.2 TIP PREPARATION 277 13.3
NIO(OOL) 278 13.4 FE/W(001) 282 13.5 FUTURE PERSPECTIVES 285 REFERENCES
285 14 FIRST-PRINCIPLES SIMULATION OF MAGNETIC EXCHANGE FORCE MICROSCOPY
ON FE/W(001) CESAR LAZO, HENDRIK HOELSCHER, VASILE CADUC, AND STEFAN
HEINZE 287 14.1 INTRODUCTION 287 14.2 COMPUTATIONAL METHOD 289 14.3
ANALYSIS OF THE MAGNETIC EXCHANGE FORCES 291 14.3.1 UNRELAXED TIP AND
SAMPLE 291 14.3.2 INFLUENCE OF STRUCTURAL RELAXATIONS 293 14.3.3
ELECTRONIC AND MAGNETIC STRUCTURE CHANGES DU XII CONTENTS 15.2.1 VISCOUS
DAMPING OF CANTILEVER IN FLUID 304 15.2.2 ELECTRIC DOUBLE LAYER FORCE
[11] 307 15.3 FREQUENCY NOISE IN FREQUENCY MODULATION ATOMIC FORCE
MICROSCOPY [12] 308 15.3.1 BASICS OF FREQUENCY MODULATION 308 15.3.2
FREQUENCY NOISE ANALYSIS IN HIGH-Q ENVIRONMENT 310 15.3.3 FREQUENCY
NOISE ANALYSIS IN LOW-Q ENVIRONMENT 314 15.4 IMPROVEMENT OF FM-AFM FOR
LIQUID ENVIRONMENT 316 15.4.1 OPTIMIZATION OF OPTICAL BEAM DEFLECTION
SENSOR 316 15.4.2 REDUCTION OF COHERENCE LENGTH OF LASER 318 15.4.3
REDUCTION OF OSCILLATION AMPLITUDE 320 15.5 HIGH-RESOLUTION IMAGING BY
FM-AFM IN LIQUID 321 15.5.1 MUSCOVITE MICA [22] 321 15.5.2 PURPLE
MEMBRANE PROTEINS [23] 323 15.5.3 ISOLATED PROTEIN MOLECULES [23] 323
15.5.4 MEASUREMENT OF LOCAL HYDRATION STRCUTRES 325 15.6 SUMMARY AND
OUTLOOK 326 REFERENCES 327 16 BIOLOGICAL APPLICATIONS OF FM-AFM IN
LIQUID ENVIRONMENT TAKESHI FUKUMA AND SUZANNE P. JARVIS 329 16.1
QUANTITATIVE FORCE MEASUREMENTS 329 16.1.1 CALCULATING FORCE FROM
FREQUENCY SHIFT 329 16.1.2 CANTILEVER EXCITATION IN LIQUID 330 16.1.3
SINGLE MOLECULE SPECTROSCOPY 332 16.2 SUBNANOMETER-RESOLUTION IMAGING
333 16.2.1 OVERVIEW 333 16.2.2 TECHNICAL PROGRESSES 336 16.2.3
BIOLOGICAL APPLICATIONS 338 16.3 FUTURE PROSPECTS 343 REFERENCES 344 17
HIGH-FREQUENCY LOW AMPLITUDE ATOMIC FORCE MICROSCOPY HIDEKI CONTENTS **
18 CANTILEVER DYNAMICS AND NONLINEAR EFFECTS IN ATOMIC FORCE MICROSCOPY
A. RAMAN, R. REIFENBERGER, J. MELCHER, AND R. TUNG 361 18.1 INTRODUCTION
361 18.2 EIGENMODES OF AFM CANTILEVERS 363 18.2.1 EIGENMODES OF TIPLESS
MICROCANTILEVERS 363 18.2.2 INFLUENCE OF TIP MASS ON AFM CANTILEVER
EIGENMODES .... 365 18.2.3 EIGENMODES OF TRIANGULAR AFM MICROCANTILEVERS
366 18.3 CANTILEVER DYNAMICS IN AM-AFM 368 18.3.1 MATHEMATICAL
SIMULATIONS OF CANTILEVER DYNAMICS 368 18.3.2 SINGLE MODE NONLINEAR
PHENOMENA IN DAFM: BIFURCATIONS, HIGHER HARMONICS, AND CHAOS 370 18.3.3
MULTIMODE NONLINEAR DYNAMICS IN DAFM 375 18.3.4 CANTILEVER DYNAMICS IN
LIQUIDS 376 18.4 CANTILEVER DYNAMICS IN FM-AFM 379 18.4.1 ORIGINS OF
FREQUENCY SHIFT AND ITS MEASUREMENT 380 18.4.2 SELECTING PROBES FOR
FM-AFM 383 18.4.3 DYNAMIC CHARACTERISTICS OF HIGH FREQUENCY CANTILEVERS
AND TUNING FORKS 385 18.4.4 HIGHER HARMONICS IN FM-AFM 388 18.4.5 FM-AFM
UNDER LIQUIDS 389 18.5 OUTLOOK 389 REFERENCES 391 INDEX 397
|
| any_adam_object | 1 |
| author2 | Morita, Seizo |
| author2_role | edt |
| author2_variant | s m sm |
| author_facet | Morita, Seizo |
| building | Verbundindex |
| bvnumber | BV025564886 |
| classification_rvk | UH 6320 |
| ctrlnum | (OCoLC)917561854 (DE-599)BVBBV025564886 |
| discipline | Physik |
| edition | 1. Aufl. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01389nam a2200397 c 4500</leader><controlfield tag="001">BV025564886</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">100417s2009 gw ad|| |||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">09,N23,2501</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">994394314</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783642014949</subfield><subfield code="9">978-3-642-01494-9</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9783642014949</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">12279104</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)917561854</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV025564886</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6320</subfield><subfield code="0">(DE-625)145762:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Noncontact atomic force microscopy</subfield><subfield code="b">Volume 2</subfield><subfield code="c">Ed. Seizo Morita ...</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. Aufl.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">2009</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVIII, 401 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">NanoScience and Technology</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Morita, Seizo</subfield><subfield code="4">edt</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">DNB Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=020163908&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-020163908</subfield></datafield></record></collection> |
| id | DE-604.BV025564886 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:36:35Z |
| institution | BVB |
| isbn | 9783642014949 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020163908 |
| oclc_num | 917561854 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | XVIII, 401 S. Ill., graph. Darst. |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | Springer |
| record_format | marc |
| series2 | NanoScience and Technology |
| spelling | Noncontact atomic force microscopy Volume 2 Ed. Seizo Morita ... 1. Aufl. Berlin [u.a.] Springer 2009 XVIII, 401 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier NanoScience and Technology Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Morita, Seizo edt DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=020163908&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Noncontact atomic force microscopy Volume 2 Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 |
| title | Noncontact atomic force microscopy Volume 2 |
| title_auth | Noncontact atomic force microscopy Volume 2 |
| title_exact_search | Noncontact atomic force microscopy Volume 2 |
| title_full | Noncontact atomic force microscopy Volume 2 Ed. Seizo Morita ... |
| title_fullStr | Noncontact atomic force microscopy Volume 2 Ed. Seizo Morita ... |
| title_full_unstemmed | Noncontact atomic force microscopy Volume 2 Ed. Seizo Morita ... |
| title_short | Noncontact atomic force microscopy |
| title_sort | noncontact atomic force microscopy volume 2 |
| title_sub | Volume 2 |
| topic | Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Rasterkraftmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=020163908&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT moritaseizo noncontactatomicforcemicroscopyvolume2 |