Electron Microscopy and Analysis 1979: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79)
Saved in:
| Other Authors: | |
|---|---|
| Format: | Book |
| Language: | Undetermined |
| Published: |
Bristol [u.a.]
IOP Publ.
1980
|
| Series: | Institute of Physics Conference Series
52 |
| Subjects: | |
| Physical Description: | XV, 472 S. |
| ISBN: | 0854981438 |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV025241641 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 100417s1980 |||| 00||| und d | ||
| 020 | |a 0854981438 |9 0-85498-143-8 | ||
| 035 | |a (OCoLC)916905630 | ||
| 035 | |a (DE-599)BVBBV025241641 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-11 | ||
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a UQ 5000 |0 (DE-625)146520: |2 rvk | ||
| 245 | 1 | 0 | |a Electron Microscopy and Analysis 1979 |b Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) |c ed. by T. Mulvey |
| 264 | 1 | |a Bristol [u.a.] |b IOP Publ. |c 1980 | |
| 300 | |a XV, 472 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Institute of Physics Conference Series |v 52 | |
| 650 | 0 | 7 | |a Mikroanalyse |0 (DE-588)4169804-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mineral |0 (DE-588)4074836-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Konferenz |0 (DE-588)4032055-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Material |0 (DE-588)4169078-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Mikroanalyse |0 (DE-588)4169804-6 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Mineral |0 (DE-588)4074836-4 |D s |
| 689 | 2 | |5 DE-604 | |
| 689 | 3 | 0 | |a Material |0 (DE-588)4169078-3 |D s |
| 689 | 3 | |5 DE-604 | |
| 689 | 4 | 0 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |D s |
| 689 | 4 | |5 DE-604 | |
| 689 | 5 | 0 | |a Konferenz |0 (DE-588)4032055-8 |D s |
| 689 | 5 | |5 DE-604 | |
| 700 | 1 | |a Mulvey, Thomas |4 edt | |
| 710 | 2 | |a Institute of Physics (London) |b Electron Microscopy and Analysis Group |e Sonstige |0 (DE-588)6908-5 |4 oth | |
| 810 | 2 | |a Institute of Physics <London> |t Institute of Physics Conference Series |v 52 |w (DE-604)BV002806317 |9 52 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-019879952 | ||
Record in the Search Index
| _version_ | 1804142297760137216 |
|---|---|
| any_adam_object | |
| author2 | Mulvey, Thomas |
| author2_role | edt |
| author2_variant | t m tm |
| author_facet | Mulvey, Thomas |
| building | Verbundindex |
| bvnumber | BV025241641 |
| classification_rvk | UH 6300 UQ 5000 |
| ctrlnum | (OCoLC)916905630 (DE-599)BVBBV025241641 |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02060nam a2200529 cb4500</leader><controlfield tag="001">BV025241641</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">100417s1980 |||| 00||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0854981438</subfield><subfield code="9">0-85498-143-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916905630</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV025241641</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 5000</subfield><subfield code="0">(DE-625)146520:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electron Microscopy and Analysis 1979</subfield><subfield code="b">Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79)</subfield><subfield code="c">ed. by T. Mulvey</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bristol [u.a.]</subfield><subfield code="b">IOP Publ.</subfield><subfield code="c">1980</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XV, 472 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Institute of Physics Conference Series</subfield><subfield code="v">52</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mineral</subfield><subfield code="0">(DE-588)4074836-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Konferenz</subfield><subfield code="0">(DE-588)4032055-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Material</subfield><subfield code="0">(DE-588)4169078-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Mineral</subfield><subfield code="0">(DE-588)4074836-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Material</subfield><subfield code="0">(DE-588)4169078-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Konferenz</subfield><subfield code="0">(DE-588)4032055-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Mulvey, Thomas</subfield><subfield code="4">edt</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Institute of Physics (London)</subfield><subfield code="b">Electron Microscopy and Analysis Group</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)6908-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">Institute of Physics <London></subfield><subfield code="t">Institute of Physics Conference Series</subfield><subfield code="v">52</subfield><subfield code="w">(DE-604)BV002806317</subfield><subfield code="9">52</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-019879952</subfield></datafield></record></collection> |
| id | DE-604.BV025241641 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T22:29:32Z |
| institution | BVB |
| institution_GND | (DE-588)6908-5 |
| isbn | 0854981438 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019879952 |
| oclc_num | 916905630 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | XV, 472 S. |
| publishDate | 1980 |
| publishDateSearch | 1980 |
| publishDateSort | 1980 |
| publisher | IOP Publ. |
| record_format | marc |
| series2 | Institute of Physics Conference Series |
| spelling | Electron Microscopy and Analysis 1979 Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) ed. by T. Mulvey Bristol [u.a.] IOP Publ. 1980 XV, 472 S. txt rdacontent n rdamedia nc rdacarrier Institute of Physics Conference Series 52 Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Mineral (DE-588)4074836-4 gnd rswk-swf Konferenz (DE-588)4032055-8 gnd rswk-swf Material (DE-588)4169078-3 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Mikroanalyse (DE-588)4169804-6 s Mineral (DE-588)4074836-4 s Material (DE-588)4169078-3 s Oberflächenanalyse (DE-588)4172243-7 s Konferenz (DE-588)4032055-8 s Mulvey, Thomas edt Institute of Physics (London) Electron Microscopy and Analysis Group Sonstige (DE-588)6908-5 oth Institute of Physics <London> Institute of Physics Conference Series 52 (DE-604)BV002806317 52 |
| spellingShingle | Electron Microscopy and Analysis 1979 Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) Mikroanalyse (DE-588)4169804-6 gnd Mineral (DE-588)4074836-4 gnd Konferenz (DE-588)4032055-8 gnd Material (DE-588)4169078-3 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4169804-6 (DE-588)4074836-4 (DE-588)4032055-8 (DE-588)4169078-3 (DE-588)4172243-7 (DE-588)4014327-2 |
| title | Electron Microscopy and Analysis 1979 Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) |
| title_auth | Electron Microscopy and Analysis 1979 Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) |
| title_exact_search | Electron Microscopy and Analysis 1979 Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) |
| title_full | Electron Microscopy and Analysis 1979 Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) ed. by T. Mulvey |
| title_fullStr | Electron Microscopy and Analysis 1979 Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) ed. by T. Mulvey |
| title_full_unstemmed | Electron Microscopy and Analysis 1979 Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) ed. by T. Mulvey |
| title_short | Electron Microscopy and Analysis 1979 |
| title_sort | electron microscopy and analysis 1979 proceedings of the institute of physics electron microscopy and analysis group conference held at the university of sussex brighton 3 6 september 1979 emag 79 |
| title_sub | Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) |
| topic | Mikroanalyse (DE-588)4169804-6 gnd Mineral (DE-588)4074836-4 gnd Konferenz (DE-588)4032055-8 gnd Material (DE-588)4169078-3 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Mikroanalyse Mineral Konferenz Material Oberflächenanalyse Elektronenmikroskopie |
| volume_link | (DE-604)BV002806317 |
| work_keys_str_mv | AT mulveythomas electronmicroscopyandanalysis1979proceedingsoftheinstituteofphysicselectronmicroscopyandanalysisgroupconferenceheldattheuniversityofsussexbrighton36september1979emag79 AT instituteofphysicslondonelectronmicroscopyandanalysisgroup electronmicroscopyandanalysis1979proceedingsoftheinstituteofphysicselectronmicroscopyandanalysisgroupconferenceheldattheuniversityofsussexbrighton36september1979emag79 |