Secondary ion mass spectrometry SIMS II: Proceedings of the second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Ca., USA, August 27-31, 1979
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Berlin [u.a.]
Springer
1979
|
| Schriftenreihe: | Springer series in chemical physics
9 |
| Schlagworte: | |
| Beschreibung: | XIII, 295 S.: Ill. |
| ISBN: | 3540098437 0387098437 |
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Datensatz im Suchindex
| _version_ | 1804142295163863040 |
|---|---|
| any_adam_object | |
| author2 | Benninghoven, Alfred |
| author2_role | edt |
| author2_variant | a b ab |
| author_facet | Benninghoven, Alfred |
| building | Verbundindex |
| bvnumber | BV025239626 |
| classification_rvk | VG 9808 |
| ctrlnum | (OCoLC)630834521 (DE-599)BVBBV025239626 |
| discipline | Chemie / Pharmazie |
| format | Conference Proceeding Book |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-09T22:29:30Z |
| institution | BVB |
| institution_GND | (DE-588)2061206-0 |
| isbn | 3540098437 0387098437 |
| language | Undetermined |
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| owner_facet | DE-11 |
| physical | XIII, 295 S.: Ill. |
| publishDate | 1979 |
| publishDateSearch | 1979 |
| publishDateSort | 1979 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in chemical physics |
| series2 | Springer series in chemical physics |
| spelling | Secondary ion mass spectrometry SIMS II Proceedings of the second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Ca., USA, August 27-31, 1979 Eds.: A. Benninghoven; C.A. Evans ... Berlin [u.a.] Springer 1979 XIII, 295 S.: Ill. txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics 9 Halbleiter (DE-588)4022993-2 gnd rswk-swf Massenspektrometrie (DE-588)4037882-2 gnd rswk-swf Ion (DE-588)4027597-8 gnd rswk-swf Festkörper (DE-588)4016918-2 gnd rswk-swf Analytische Chemie (DE-588)4129906-1 gnd rswk-swf Metall (DE-588)4038860-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Analytische Chemie (DE-588)4129906-1 s DE-604 Massenspektrometrie (DE-588)4037882-2 s Ion (DE-588)4027597-8 s Halbleiter (DE-588)4022993-2 s Metall (DE-588)4038860-8 s Festkörper (DE-588)4016918-2 s Benninghoven, Alfred edt SIMS 2 1979 Stanford, Calif. Sonstige (DE-588)2061206-0 oth Springer series in chemical physics 9 (DE-604)BV000000670 9 |
| spellingShingle | Secondary ion mass spectrometry SIMS II Proceedings of the second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Ca., USA, August 27-31, 1979 Springer series in chemical physics Halbleiter (DE-588)4022993-2 gnd Massenspektrometrie (DE-588)4037882-2 gnd Ion (DE-588)4027597-8 gnd Festkörper (DE-588)4016918-2 gnd Analytische Chemie (DE-588)4129906-1 gnd Metall (DE-588)4038860-8 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4037882-2 (DE-588)4027597-8 (DE-588)4016918-2 (DE-588)4129906-1 (DE-588)4038860-8 (DE-588)1071861417 |
| title | Secondary ion mass spectrometry SIMS II Proceedings of the second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Ca., USA, August 27-31, 1979 |
| title_auth | Secondary ion mass spectrometry SIMS II Proceedings of the second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Ca., USA, August 27-31, 1979 |
| title_exact_search | Secondary ion mass spectrometry SIMS II Proceedings of the second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Ca., USA, August 27-31, 1979 |
| title_full | Secondary ion mass spectrometry SIMS II Proceedings of the second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Ca., USA, August 27-31, 1979 Eds.: A. Benninghoven; C.A. Evans ... |
| title_fullStr | Secondary ion mass spectrometry SIMS II Proceedings of the second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Ca., USA, August 27-31, 1979 Eds.: A. Benninghoven; C.A. Evans ... |
| title_full_unstemmed | Secondary ion mass spectrometry SIMS II Proceedings of the second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Ca., USA, August 27-31, 1979 Eds.: A. Benninghoven; C.A. Evans ... |
| title_short | Secondary ion mass spectrometry SIMS II |
| title_sort | secondary ion mass spectrometry sims ii proceedings of the second international conference on secondary ion mass spectrometry sims ii stanford university ca usa august 27 31 1979 |
| title_sub | Proceedings of the second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Ca., USA, August 27-31, 1979 |
| topic | Halbleiter (DE-588)4022993-2 gnd Massenspektrometrie (DE-588)4037882-2 gnd Ion (DE-588)4027597-8 gnd Festkörper (DE-588)4016918-2 gnd Analytische Chemie (DE-588)4129906-1 gnd Metall (DE-588)4038860-8 gnd |
| topic_facet | Halbleiter Massenspektrometrie Ion Festkörper Analytische Chemie Metall Konferenzschrift |
| volume_link | (DE-604)BV000000670 |
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