VLSI testing:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Amsterdam <<[u.a.]>>
North Holland
1986
|
| Schriftenreihe: | Advances in CAD for VLSI
5 |
| Schlagworte: | |
| Beschreibung: | IX, 275 S. Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV024648038 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 090924s1986 ad|| |||| 00||| und d | ||
| 035 | |a (OCoLC)636765825 | ||
| 035 | |a (DE-599)BVBBV024648038 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 084 | |a ST 190 |0 (DE-625)143607: |2 rvk | ||
| 084 | |a ST 195 |0 (DE-625)143608: |2 rvk | ||
| 245 | 1 | 0 | |a VLSI testing |c ed. by T. W. Williams |
| 264 | 1 | |a Amsterdam <<[u.a.]>> |b North Holland |c 1986 | |
| 300 | |a IX, 275 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Advances in CAD for VLSI |v 5 | |
| 650 | 0 | 7 | |a CAD |0 (DE-588)4069794-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Test |0 (DE-588)4059549-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 1 | 1 | |a Test |0 (DE-588)4059549-3 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 2 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 2 | 2 | |a CAD |0 (DE-588)4069794-0 |D s |
| 689 | 2 | |5 DE-604 | |
| 700 | 1 | |a Williams, T. W. |4 edt | |
| 830 | 0 | |a Advances in CAD for VLSI |v 5 |w (DE-604)BV001897464 |9 5 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018059636 | ||
Datensatz im Suchindex
| _version_ | 1804140062278942720 |
|---|---|
| any_adam_object | |
| author2 | Williams, T. W. |
| author2_role | edt |
| author2_variant | t w w tw tww |
| author_facet | Williams, T. W. |
| building | Verbundindex |
| bvnumber | BV024648038 |
| classification_rvk | ST 190 ST 195 |
| ctrlnum | (OCoLC)636765825 (DE-599)BVBBV024648038 |
| discipline | Informatik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01467nam a2200457 cb4500</leader><controlfield tag="001">BV024648038</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">090924s1986 ad|| |||| 00||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)636765825</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024648038</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 190</subfield><subfield code="0">(DE-625)143607:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 195</subfield><subfield code="0">(DE-625)143608:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">VLSI testing</subfield><subfield code="c">ed. by T. W. Williams</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam <<[u.a.]>></subfield><subfield code="b">North Holland</subfield><subfield code="c">1986</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 275 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Advances in CAD for VLSI</subfield><subfield code="v">5</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">CAD</subfield><subfield code="0">(DE-588)4069794-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="2"><subfield code="a">CAD</subfield><subfield code="0">(DE-588)4069794-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Williams, T. W.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Advances in CAD for VLSI</subfield><subfield code="v">5</subfield><subfield code="w">(DE-604)BV001897464</subfield><subfield code="9">5</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018059636</subfield></datafield></record></collection> |
| id | DE-604.BV024648038 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:54:00Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018059636 |
| oclc_num | 636765825 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | IX, 275 S. Ill., graph. Darst. |
| publishDate | 1986 |
| publishDateSearch | 1986 |
| publishDateSort | 1986 |
| publisher | North Holland |
| record_format | marc |
| series | Advances in CAD for VLSI |
| series2 | Advances in CAD for VLSI |
| spelling | VLSI testing ed. by T. W. Williams Amsterdam <<[u.a.]>> North Holland 1986 IX, 275 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Advances in CAD for VLSI 5 CAD (DE-588)4069794-0 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s DE-604 Test (DE-588)4059549-3 s CAD (DE-588)4069794-0 s Williams, T. W. edt Advances in CAD for VLSI 5 (DE-604)BV001897464 5 |
| spellingShingle | VLSI testing Advances in CAD for VLSI CAD (DE-588)4069794-0 gnd Test (DE-588)4059549-3 gnd Prüftechnik (DE-588)4047610-8 gnd VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4069794-0 (DE-588)4059549-3 (DE-588)4047610-8 (DE-588)4117388-0 |
| title | VLSI testing |
| title_auth | VLSI testing |
| title_exact_search | VLSI testing |
| title_full | VLSI testing ed. by T. W. Williams |
| title_fullStr | VLSI testing ed. by T. W. Williams |
| title_full_unstemmed | VLSI testing ed. by T. W. Williams |
| title_short | VLSI testing |
| title_sort | vlsi testing |
| topic | CAD (DE-588)4069794-0 gnd Test (DE-588)4059549-3 gnd Prüftechnik (DE-588)4047610-8 gnd VLSI (DE-588)4117388-0 gnd |
| topic_facet | CAD Test Prüftechnik VLSI |
| volume_link | (DE-604)BV001897464 |
| work_keys_str_mv | AT williamstw vlsitesting |