High-resolution electron microscopy:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Oxford [u.a.]
Oxford Univ. Press
2009
|
| Edition: | 3. ed. |
| Series: | Monographs on the physics and chemistry of materials
|
| Subjects: | |
| Item Description: | Bis 2. Aufl. u.d.T.: Spence, John C.: Experimental high-resolution electron microscopy |
| Physical Description: | XVI, 401 S. Ill., graph. Darst. |
| ISBN: | 9780199552757 |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV024621175 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 090924s2009 ad|| |||| 00||| eng d | ||
| 020 | |a 9780199552757 |9 978-0-19-955275-7 | ||
| 035 | |a (OCoLC)812182211 | ||
| 035 | |a (DE-599)BVBBV024621175 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-83 |a DE-19 | ||
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 100 | 1 | |a Spence, John C. H. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a High-resolution electron microscopy |c John C. H. Spence |
| 250 | |a 3. ed. | ||
| 264 | 1 | |a Oxford [u.a.] |b Oxford Univ. Press |c 2009 | |
| 300 | |a XVI, 401 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Monographs on the physics and chemistry of materials | |
| 500 | |a Bis 2. Aufl. u.d.T.: Spence, John C.: Experimental high-resolution electron microscopy | ||
| 650 | 0 | 7 | |a Hochauflösendes Verfahren |0 (DE-588)4287503-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Struktur |0 (DE-588)4058125-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Festkörper |0 (DE-588)4016918-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenbeugung |0 (DE-588)4151862-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 1 | 1 | |a Hochauflösendes Verfahren |0 (DE-588)4287503-1 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 689 | 2 | 0 | |a Struktur |0 (DE-588)4058125-1 |D s |
| 689 | 2 | |8 2\p |5 DE-604 | |
| 689 | 3 | 0 | |a Festkörper |0 (DE-588)4016918-2 |D s |
| 689 | 3 | |8 3\p |5 DE-604 | |
| 689 | 4 | 0 | |a Elektronenbeugung |0 (DE-588)4151862-7 |D s |
| 689 | 4 | |8 4\p |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018593144 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 4\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Record in the Search Index
| _version_ | 1804140641906589696 |
|---|---|
| any_adam_object | |
| author | Spence, John C. H. |
| author_facet | Spence, John C. H. |
| author_role | aut |
| author_sort | Spence, John C. H. |
| author_variant | j c h s jch jchs |
| building | Verbundindex |
| bvnumber | BV024621175 |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)812182211 (DE-599)BVBBV024621175 |
| discipline | Physik |
| edition | 3. ed. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02239nam a2200553 c 4500</leader><controlfield tag="001">BV024621175</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">090924s2009 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780199552757</subfield><subfield code="9">978-0-19-955275-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)812182211</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024621175</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield><subfield code="a">DE-19</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Spence, John C. H.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">High-resolution electron microscopy</subfield><subfield code="c">John C. H. Spence</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">3. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Oxford [u.a.]</subfield><subfield code="b">Oxford Univ. Press</subfield><subfield code="c">2009</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVI, 401 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Monographs on the physics and chemistry of materials</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Bis 2. Aufl. u.d.T.: Spence, John C.: Experimental high-resolution electron microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Hochauflösendes Verfahren</subfield><subfield code="0">(DE-588)4287503-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Struktur</subfield><subfield code="0">(DE-588)4058125-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Festkörper</subfield><subfield code="0">(DE-588)4016918-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenbeugung</subfield><subfield code="0">(DE-588)4151862-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Hochauflösendes Verfahren</subfield><subfield code="0">(DE-588)4287503-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Struktur</subfield><subfield code="0">(DE-588)4058125-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Festkörper</subfield><subfield code="0">(DE-588)4016918-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Elektronenbeugung</subfield><subfield code="0">(DE-588)4151862-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018593144</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV024621175 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:03:13Z |
| institution | BVB |
| isbn | 9780199552757 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018593144 |
| oclc_num | 812182211 |
| open_access_boolean | |
| owner | DE-83 DE-19 DE-BY-UBM |
| owner_facet | DE-83 DE-19 DE-BY-UBM |
| physical | XVI, 401 S. Ill., graph. Darst. |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | Oxford Univ. Press |
| record_format | marc |
| series2 | Monographs on the physics and chemistry of materials |
| spelling | Spence, John C. H. Verfasser aut High-resolution electron microscopy John C. H. Spence 3. ed. Oxford [u.a.] Oxford Univ. Press 2009 XVI, 401 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Monographs on the physics and chemistry of materials Bis 2. Aufl. u.d.T.: Spence, John C.: Experimental high-resolution electron microscopy Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Struktur (DE-588)4058125-1 gnd rswk-swf Festkörper (DE-588)4016918-2 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s DE-604 Elektronenmikroskopie (DE-588)4014327-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s 1\p DE-604 Struktur (DE-588)4058125-1 s 2\p DE-604 Festkörper (DE-588)4016918-2 s 3\p DE-604 Elektronenbeugung (DE-588)4151862-7 s 4\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Spence, John C. H. High-resolution electron microscopy Hochauflösendes Verfahren (DE-588)4287503-1 gnd Struktur (DE-588)4058125-1 gnd Festkörper (DE-588)4016918-2 gnd Elektronenbeugung (DE-588)4151862-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| subject_GND | (DE-588)4287503-1 (DE-588)4058125-1 (DE-588)4016918-2 (DE-588)4151862-7 (DE-588)4014327-2 (DE-588)4215608-7 |
| title | High-resolution electron microscopy |
| title_auth | High-resolution electron microscopy |
| title_exact_search | High-resolution electron microscopy |
| title_full | High-resolution electron microscopy John C. H. Spence |
| title_fullStr | High-resolution electron microscopy John C. H. Spence |
| title_full_unstemmed | High-resolution electron microscopy John C. H. Spence |
| title_short | High-resolution electron microscopy |
| title_sort | high resolution electron microscopy |
| topic | Hochauflösendes Verfahren (DE-588)4287503-1 gnd Struktur (DE-588)4058125-1 gnd Festkörper (DE-588)4016918-2 gnd Elektronenbeugung (DE-588)4151862-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| topic_facet | Hochauflösendes Verfahren Struktur Festkörper Elektronenbeugung Elektronenmikroskopie Durchstrahlungselektronenmikroskopie |
| work_keys_str_mv | AT spencejohnch highresolutionelectronmicroscopy |