Untersuchung der Strahlenschädigung in Tantal und Niob in einem Hochspannungselektronenmikroskop:
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Bibliographic Details
Main Author: Saile, Bernhard (Author)
Format: Microfilm Book
Language:Undetermined
Published: 1981
Subjects:
Item Description:Stuttgart, Univ., Diss.
Physical Description:81 S. graph. Darst.; 1 Mikrofiche 24x

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!