Quantitative strain analysis with image shearing speckle pattern interferometry (shearography):
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Bibliographic Details
Main Author: Waldner, Stephan Peter (Author)
Format: Thesis Microfilm Book
Language:English
Published: 2000
Edition:[Mikrofiche-Ausg.]
Subjects:
Physical Description:XIV, 126 Bl. Ill., graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!