Revolution ideas in test: 2001 IEEE AUTOTESTCON proceedings ; IEEE Systemst Readiness Technology Conference ; [August 20 - 23, 2001, Valley Forge, Pennsylvania]
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Piscataway, NJ IEEE Service Center 2001
Subjects:
Physical Description:XXXVII, 1022 S. Ill., graph. Darst.
ISBN:0780370945
0780370953

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