Proceedings: 25 - 27 October 2000, Yamanashi, Japan
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Bibliographic Details
Corporate Author: International Symposium on Defect and Fault Tolerance in VLSI Systems Yamanashi (Author)
Format: Conference Proceeding Book
Language:English
Published: LosAlamitos, Calif. <<[u.a.]>> IEEE Computer Soc. 2000
Subjects:
Physical Description:XII, 422 S. Ill., graph. Darst.
ISBN:0769507190
0769507204

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