Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices: [Chicago, Ill., USA, October 1988]
Gespeichert in:
| Körperschaft: | |
|---|---|
| Weitere Verfasser: | |
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Pennington, NJ
1988
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| Schriftenreihe: | Proceedings / Electrochemical Society
88,20 |
| Schlagworte: | |
| Beschreibung: | VI, 289 S. |
Internformat
MARC
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| 111 | 2 | |a Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |n 1 |d 1988 |c Chicago, Ill. |j Verfasser |0 (DE-588)5050759-X |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |b [Chicago, Ill., USA, October 1988] |c ed. by Thomas J. Shaffner ... |
| 264 | 1 | |a Pennington, NJ |c 1988 | |
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| 490 | 1 | |a Proceedings / Electrochemical Society |v 88,20 | |
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Datensatz im Suchindex
| _version_ | 1804140369372250112 |
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| author2 | Shaffner, Thomas J. |
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| author_corporate | Symposium on Diagnostic Techniques for Semiconductor Materials and Devices Chicago, Ill |
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| author_facet | Shaffner, Thomas J. Symposium on Diagnostic Techniques for Semiconductor Materials and Devices Chicago, Ill |
| author_sort | Symposium on Diagnostic Techniques for Semiconductor Materials and Devices Chicago, Ill |
| building | Verbundindex |
| bvnumber | BV024403318 |
| ctrlnum | (OCoLC)916466433 (DE-599)BVBBV024403318 |
| format | Conference Proceeding Book |
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| id | DE-604.BV024403318 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T21:58:53Z |
| institution | BVB |
| institution_GND | (DE-588)5050759-X |
| language | Undetermined |
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| physical | VI, 289 S. |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| record_format | marc |
| series2 | Proceedings / Electrochemical Society |
| spelling | Symposium on Diagnostic Techniques for Semiconductor Materials and Devices 1 1988 Chicago, Ill. Verfasser (DE-588)5050759-X aut Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices [Chicago, Ill., USA, October 1988] ed. by Thomas J. Shaffner ... Pennington, NJ 1988 VI, 289 S. txt rdacontent n rdamedia nc rdacarrier Proceedings / Electrochemical Society 88,20 Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Halbleiterwerkstoff (DE-588)4158817-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Halbleiterbauelement (DE-588)4113826-0 s Werkstoffprüfung (DE-588)4037934-6 s 1\p DE-604 Halbleiterwerkstoff (DE-588)4158817-4 s 2\p DE-604 Shaffner, Thomas J. edt Electrochemical Society Proceedings 88,20 (DE-604)BV001900941 88,20 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices [Chicago, Ill., USA, October 1988] Werkstoffprüfung (DE-588)4037934-6 gnd Halbleiterbauelement (DE-588)4113826-0 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd |
| subject_GND | (DE-588)4037934-6 (DE-588)4113826-0 (DE-588)4158817-4 (DE-588)1071861417 |
| title | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices [Chicago, Ill., USA, October 1988] |
| title_auth | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices [Chicago, Ill., USA, October 1988] |
| title_exact_search | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices [Chicago, Ill., USA, October 1988] |
| title_full | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices [Chicago, Ill., USA, October 1988] ed. by Thomas J. Shaffner ... |
| title_fullStr | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices [Chicago, Ill., USA, October 1988] ed. by Thomas J. Shaffner ... |
| title_full_unstemmed | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices [Chicago, Ill., USA, October 1988] ed. by Thomas J. Shaffner ... |
| title_short | Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices |
| title_sort | proceedings of the symposium on diagnostic techniques for semiconductor materials and devices chicago ill usa october 1988 |
| title_sub | [Chicago, Ill., USA, October 1988] |
| topic | Werkstoffprüfung (DE-588)4037934-6 gnd Halbleiterbauelement (DE-588)4113826-0 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd |
| topic_facet | Werkstoffprüfung Halbleiterbauelement Halbleiterwerkstoff Konferenzschrift |
| volume_link | (DE-604)BV001900941 |
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