Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces:
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
1990
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| Subjects: | |
| Physical Description: | 185 S. Ill., graph. Darst. |
Staff View
MARC
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| 100 | 1 | |a Jong, Alan F. de |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |c by Alan Frank de Jong |
| 264 | 1 | |c 1990 | |
| 300 | |a 185 S. |b Ill., graph. Darst. | ||
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Record in the Search Index
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| author | Jong, Alan F. de |
| author_facet | Jong, Alan F. de |
| author_role | aut |
| author_sort | Jong, Alan F. de |
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| building | Verbundindex |
| bvnumber | BV024397960 |
| ctrlnum | (OCoLC)916445784 (DE-599)BVBBV024397960 |
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| illustrated | Illustrated |
| indexdate | 2024-07-09T21:58:46Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018376807 |
| oclc_num | 916445784 |
| open_access_boolean | |
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| physical | 185 S. Ill., graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| record_format | marc |
| spelling | Jong, Alan F. de Verfasser aut Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces by Alan Frank de Jong 1990 185 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Delft, Univ., Diss., 1990 Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Bildverstehen (DE-588)4202022-0 gnd rswk-swf Halbleiterschicht (DE-588)4158812-5 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s Halbleiterschicht (DE-588)4158812-5 s Bildverstehen (DE-588)4202022-0 s DE-604 |
| spellingShingle | Jong, Alan F. de Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Bildverstehen (DE-588)4202022-0 gnd Halbleiterschicht (DE-588)4158812-5 gnd |
| subject_GND | (DE-588)4215608-7 (DE-588)4202022-0 (DE-588)4158812-5 (DE-588)4113937-9 |
| title | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |
| title_auth | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |
| title_exact_search | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |
| title_full | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces by Alan Frank de Jong |
| title_fullStr | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces by Alan Frank de Jong |
| title_full_unstemmed | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces by Alan Frank de Jong |
| title_short | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |
| title_sort | image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |
| topic | Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Bildverstehen (DE-588)4202022-0 gnd Halbleiterschicht (DE-588)4158812-5 gnd |
| topic_facet | Durchstrahlungselektronenmikroskopie Bildverstehen Halbleiterschicht Hochschulschrift |
| work_keys_str_mv | AT jongalanfde imageinterpretationfortransmissionelectronmicroscopyofthinsemiconductorlayersandinterfaces |