Jong, A. F. d. (1990). Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces.
Chicago Style (17th ed.) CitationJong, Alan F. de. Image Interpretation for Transmission Electron Microscopy of Thin Semiconductor Layers and Interfaces. 1990.
MLA (9th ed.) CitationJong, Alan F. de. Image Interpretation for Transmission Electron Microscopy of Thin Semiconductor Layers and Interfaces. 1990.
Warning: These citations may not always be 100% accurate.