Verfügbarkeit: Proceedings :: THWS Bibkatalog

Proceedings: [September 10 - 14, 1990, Washington, DC]

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Bibliographische Detailangaben
Körperschaft:	International Test Conference Washington, DC (VerfasserIn)
Format:	Tagungsbericht Buch
Sprache:	Undetermined
Veröffentlicht:	Los Alamitos, Calif. IEEE Computer Soc. Press 1990
Schlagworte:	Prüftechnik Integrierte Schaltung Datennetz Computerunterstütztes Verfahren Telekommunikation Entwurf Telekommunikationsnetz VLSI Datenverarbeitungssystem Computersimulation Medizin Testen Mikroelektronik Elektronik Konferenzschrift > 1983 > San Diego Calif.
Beschreibung:	Nebent.: The changing philosophy of test
Beschreibung:	XVI, 1083 S. Ill., graph. Darst.
ISBN:	081869064X 0818620641

Internformat

MARC


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Datensatz im Suchindex

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discipline	Elektrotechnik / Elektronik / Nachrichtentechnik
format	Conference Proceeding Book
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genre_facet	Konferenzschrift 1983 San Diego Calif.
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indexdate	2024-07-09T21:58:15Z
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publisher	IEEE Computer Soc. Press
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spelling	International Test Conference 21 1990 Washington, DC Verfasser (DE-588)5059514-3 aut Proceedings [September 10 - 14, 1990, Washington, DC] International Test Conference 1990 ; [IEEE] The changing philosophy of test Los Alamitos, Calif. IEEE Computer Soc. Press 1990 XVI, 1083 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Nebent.: The changing philosophy of test Prüftechnik (DE-588)4047610-8 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Datennetz (DE-588)4011130-1 gnd rswk-swf Computerunterstütztes Verfahren (DE-588)4139030-1 gnd rswk-swf Telekommunikation (DE-588)4059360-5 gnd rswk-swf Entwurf (DE-588)4121208-3 gnd rswk-swf Telekommunikationsnetz (DE-588)4133586-7 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Datenverarbeitungssystem (DE-588)4125229-9 gnd rswk-swf Computersimulation (DE-588)4148259-1 gnd rswk-swf Medizin (DE-588)4038243-6 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1983 San Diego Calif. gnd-content Datennetz (DE-588)4011130-1 s DE-604 Telekommunikationsnetz (DE-588)4133586-7 s Integrierte Schaltung (DE-588)4027242-4 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Datenverarbeitungssystem (DE-588)4125229-9 s Computersimulation (DE-588)4148259-1 s 2\p DE-604 Telekommunikation (DE-588)4059360-5 s 3\p DE-604 Mikroelektronik (DE-588)4039207-7 s 4\p DE-604 Elektronik (DE-588)4014346-6 s Testen (DE-588)4367264-4 s 5\p DE-604 VLSI (DE-588)4117388-0 s Entwurf (DE-588)4121208-3 s 6\p DE-604 Computerunterstütztes Verfahren (DE-588)4139030-1 s Medizin (DE-588)4038243-6 s 7\p DE-604 8\p DE-604 Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 8\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Proceedings [September 10 - 14, 1990, Washington, DC] Prüftechnik (DE-588)4047610-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Datennetz (DE-588)4011130-1 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Telekommunikation (DE-588)4059360-5 gnd Entwurf (DE-588)4121208-3 gnd Telekommunikationsnetz (DE-588)4133586-7 gnd VLSI (DE-588)4117388-0 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Computersimulation (DE-588)4148259-1 gnd Medizin (DE-588)4038243-6 gnd Testen (DE-588)4367264-4 gnd Mikroelektronik (DE-588)4039207-7 gnd Elektronik (DE-588)4014346-6 gnd
subject_GND	(DE-588)4047610-8 (DE-588)4027242-4 (DE-588)4011130-1 (DE-588)4139030-1 (DE-588)4059360-5 (DE-588)4121208-3 (DE-588)4133586-7 (DE-588)4117388-0 (DE-588)4125229-9 (DE-588)4148259-1 (DE-588)4038243-6 (DE-588)4367264-4 (DE-588)4039207-7 (DE-588)4014346-6 (DE-588)1071861417
title	Proceedings [September 10 - 14, 1990, Washington, DC]
title_alt	The changing philosophy of test
title_auth	Proceedings [September 10 - 14, 1990, Washington, DC]
title_exact_search	Proceedings [September 10 - 14, 1990, Washington, DC]
title_full	Proceedings [September 10 - 14, 1990, Washington, DC] International Test Conference 1990 ; [IEEE]
title_fullStr	Proceedings [September 10 - 14, 1990, Washington, DC] International Test Conference 1990 ; [IEEE]
title_full_unstemmed	Proceedings [September 10 - 14, 1990, Washington, DC] International Test Conference 1990 ; [IEEE]
title_short	Proceedings
title_sort	proceedings september 10 14 1990 washington dc
title_sub	[September 10 - 14, 1990, Washington, DC]
topic	Prüftechnik (DE-588)4047610-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Datennetz (DE-588)4011130-1 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Telekommunikation (DE-588)4059360-5 gnd Entwurf (DE-588)4121208-3 gnd Telekommunikationsnetz (DE-588)4133586-7 gnd VLSI (DE-588)4117388-0 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Computersimulation (DE-588)4148259-1 gnd Medizin (DE-588)4038243-6 gnd Testen (DE-588)4367264-4 gnd Mikroelektronik (DE-588)4039207-7 gnd Elektronik (DE-588)4014346-6 gnd
topic_facet	Prüftechnik Integrierte Schaltung Datennetz Computerunterstütztes Verfahren Telekommunikation Entwurf Telekommunikationsnetz VLSI Datenverarbeitungssystem Computersimulation Medizin Testen Mikroelektronik Elektronik Konferenzschrift 1983 San Diego Calif.
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