Proceedings of the IFIP TC 6 Third International Workshop on Protocol Test Systems: McLean, Virginia, USA, 30 October - 1 November, 1990
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Bibliographic Details
Corporate Author: International Workshop on Protocol Test Systems McLean, Va (Author)
Other Authors: Davidson, Ian (Editor)
Format: Conference Proceeding Book
Language:English
Published: Amsterdam [u.a.] North-Holland 1991
Series:Protocol test systems 3
Subjects:
Physical Description:IX, 462 S. graph. Darst.
ISBN:0444891773

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