Efficient test generation for bridging faults in CMOS ICs based on layout analysis:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Sankt Augustin
GMD
1994
|
| Schriftenreihe: | Arbeitspapiere der GMD
878 |
| Schlagworte: | |
| Beschreibung: | 18 S. graph. Darst. |
Internformat
MARC
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| id | DE-604.BV023840802 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:37:48Z |
| institution | BVB |
| language | English |
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| physical | 18 S. graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
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| spelling | Efficient test generation for bridging faults in CMOS ICs based on layout analysis Marco Kley ... Sankt Augustin GMD 1994 18 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Arbeitspapiere der GMD 878 CMOS (DE-588)4010319-5 gnd rswk-swf Fehlersuche (DE-588)4016615-6 gnd rswk-swf CMOS (DE-588)4010319-5 s Fehlersuche (DE-588)4016615-6 s DE-604 Kley, Marco Sonstige oth Arbeitspapiere der GMD 878 (DE-604)BV000613796 878 |
| spellingShingle | Efficient test generation for bridging faults in CMOS ICs based on layout analysis Arbeitspapiere der GMD CMOS (DE-588)4010319-5 gnd Fehlersuche (DE-588)4016615-6 gnd |
| subject_GND | (DE-588)4010319-5 (DE-588)4016615-6 |
| title | Efficient test generation for bridging faults in CMOS ICs based on layout analysis |
| title_auth | Efficient test generation for bridging faults in CMOS ICs based on layout analysis |
| title_exact_search | Efficient test generation for bridging faults in CMOS ICs based on layout analysis |
| title_full | Efficient test generation for bridging faults in CMOS ICs based on layout analysis Marco Kley ... |
| title_fullStr | Efficient test generation for bridging faults in CMOS ICs based on layout analysis Marco Kley ... |
| title_full_unstemmed | Efficient test generation for bridging faults in CMOS ICs based on layout analysis Marco Kley ... |
| title_short | Efficient test generation for bridging faults in CMOS ICs based on layout analysis |
| title_sort | efficient test generation for bridging faults in cmos ics based on layout analysis |
| topic | CMOS (DE-588)4010319-5 gnd Fehlersuche (DE-588)4016615-6 gnd |
| topic_facet | CMOS Fehlersuche |
| volume_link | (DE-604)BV000613796 |
| work_keys_str_mv | AT kleymarco efficienttestgenerationforbridgingfaultsincmosicsbasedonlayoutanalysis |