Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie:
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | German |
| Published: |
Aachen
Mainz
1999
|
| Subjects: | |
| Physical Description: | III, 145 S. graph. Darst. |
| ISBN: | 3896534777 |
Staff View
MARC
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| 245 | 1 | 0 | |a Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie |c Jun Xu |
| 264 | 1 | |a Aachen |b Mainz |c 1999 | |
| 300 | |a III, 145 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
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| 502 | |a Zugl.: Aachen, Techn. Hochsch., Diss., 1999 | ||
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Record in the Search Index
| _version_ | 1804138965859565568 |
|---|---|
| any_adam_object | |
| author | Xu, Jun |
| author_facet | Xu, Jun |
| author_role | aut |
| author_sort | Xu, Jun |
| author_variant | j x jx |
| building | Verbundindex |
| bvnumber | BV023776239 |
| classification_rvk | UP 7570 |
| ctrlnum | (OCoLC)76036848 (DE-599)BVBBV023776239 |
| discipline | Physik |
| format | Thesis Book |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV023776239 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:36:34Z |
| institution | BVB |
| isbn | 3896534777 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017418453 |
| oclc_num | 76036848 |
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| owner | DE-634 |
| owner_facet | DE-634 |
| physical | III, 145 S. graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | Mainz |
| record_format | marc |
| spelling | Xu, Jun Verfasser aut Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie Jun Xu Aachen Mainz 1999 III, 145 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Zugl.: Aachen, Techn. Hochsch., Diss., 1999 Zinksulfid (DE-588)4190877-6 gnd rswk-swf Zinkselenid (DE-588)4190874-0 gnd rswk-swf Mischkristall (DE-588)4170112-4 gnd rswk-swf Halbleiterschicht (DE-588)4158812-5 gnd rswk-swf Epitaxieschicht (DE-588)4152546-2 gnd rswk-swf Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf Magnesiumselenid (DE-588)4414649-8 gnd rswk-swf Magnesiumsulfid (DE-588)4414648-6 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Halbleiterschicht (DE-588)4158812-5 s Epitaxieschicht (DE-588)4152546-2 s Röntgendiffraktometrie (DE-588)4336833-5 s DE-604 Zinkselenid (DE-588)4190874-0 s Zinksulfid (DE-588)4190877-6 s Magnesiumsulfid (DE-588)4414648-6 s Magnesiumselenid (DE-588)4414649-8 s Mischkristall (DE-588)4170112-4 s 1\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Xu, Jun Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie Zinksulfid (DE-588)4190877-6 gnd Zinkselenid (DE-588)4190874-0 gnd Mischkristall (DE-588)4170112-4 gnd Halbleiterschicht (DE-588)4158812-5 gnd Epitaxieschicht (DE-588)4152546-2 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd Magnesiumselenid (DE-588)4414649-8 gnd Magnesiumsulfid (DE-588)4414648-6 gnd |
| subject_GND | (DE-588)4190877-6 (DE-588)4190874-0 (DE-588)4170112-4 (DE-588)4158812-5 (DE-588)4152546-2 (DE-588)4336833-5 (DE-588)4414649-8 (DE-588)4414648-6 (DE-588)4113937-9 |
| title | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie |
| title_auth | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie |
| title_exact_search | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie |
| title_full | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie Jun Xu |
| title_fullStr | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie Jun Xu |
| title_full_unstemmed | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie Jun Xu |
| title_short | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie |
| title_sort | charakterisierung von movpe ii vi halbleiter schichten mittels rontgendiffraktometrie |
| topic | Zinksulfid (DE-588)4190877-6 gnd Zinkselenid (DE-588)4190874-0 gnd Mischkristall (DE-588)4170112-4 gnd Halbleiterschicht (DE-588)4158812-5 gnd Epitaxieschicht (DE-588)4152546-2 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd Magnesiumselenid (DE-588)4414649-8 gnd Magnesiumsulfid (DE-588)4414648-6 gnd |
| topic_facet | Zinksulfid Zinkselenid Mischkristall Halbleiterschicht Epitaxieschicht Röntgendiffraktometrie Magnesiumselenid Magnesiumsulfid Hochschulschrift |
| work_keys_str_mv | AT xujun charakterisierungvonmovpeiivihalbleiterschichtenmittelsrontgendiffraktometrie |