(2002). Post-issue patent "quality control": A comparative study of US patent re-examinations and European patent oppositions. National Bureau of Economic Research.
Chicago-Zitierstil (17. Ausg.)Post-issue Patent "Quality Control": A Comparative Study of US Patent Re-examinations and European Patent Oppositions. Cambridge, Mass: National Bureau of Economic Research, 2002.
MLA-Zitierstil (9. Ausg.)Post-issue Patent "Quality Control": A Comparative Study of US Patent Re-examinations and European Patent Oppositions. National Bureau of Economic Research, 2002.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.