(2008). Precision landmark location for machine vision and photogrammetry: Finding and achieving the maximum possible accuracy. Springer. https://doi.org/10.1007/978-1-84628-913-2
Chicago Style (17th ed.) CitationPrecision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy. London: Springer, 2008. https://doi.org/10.1007/978-1-84628-913-2.
MLA (9th ed.) CitationPrecision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy. Springer, 2008. https://doi.org/10.1007/978-1-84628-913-2.
Warning: These citations may not always be 100% accurate.