Introduction to advanced system-on-chip test design and optimization:
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
New York
Springer
2005
|
| Series: | Frontiers in electronic testing
29 |
| Subjects: | |
| Online Access: | BTU01 FHR01 Volltext |
| Physical Description: | 1 Online-Ressource |
| ISBN: | 9780387256245 9781402032073 |
| DOI: | 10.1007/b135763 |
Staff View
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| id | DE-604.BV023186861 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T20:03:28Z |
| indexdate | 2024-07-09T21:12:35Z |
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| isbn | 9780387256245 9781402032073 |
| language | English |
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| physical | 1 Online-Ressource |
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| publishDate | 2005 |
| publishDateSearch | 2005 |
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| publisher | Springer |
| record_format | marc |
| series | Frontiers in electronic testing |
| series2 | Frontiers in electronic testing |
| spelling | Introduction to advanced system-on-chip test design and optimization by Erik Larsson New York Springer 2005 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Frontiers in electronic testing 29 Systems on a chip Testing Integrated circuits Design and construction Fehlererkennung (DE-588)4133764-5 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf System-on-Chip (DE-588)4740357-3 gnd rswk-swf System-on-Chip (DE-588)4740357-3 s Integrierte Schaltung (DE-588)4027242-4 s Fehlererkennung (DE-588)4133764-5 s Testen (DE-588)4367264-4 s 1\p DE-604 Larsson, Erik Sonstige oth Frontiers in electronic testing 29 (DE-604)BV010836129 29 https://doi.org/10.1007/b135763 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Introduction to advanced system-on-chip test design and optimization Frontiers in electronic testing Systems on a chip Testing Integrated circuits Design and construction Fehlererkennung (DE-588)4133764-5 gnd Testen (DE-588)4367264-4 gnd Integrierte Schaltung (DE-588)4027242-4 gnd System-on-Chip (DE-588)4740357-3 gnd |
| subject_GND | (DE-588)4133764-5 (DE-588)4367264-4 (DE-588)4027242-4 (DE-588)4740357-3 |
| title | Introduction to advanced system-on-chip test design and optimization |
| title_auth | Introduction to advanced system-on-chip test design and optimization |
| title_exact_search | Introduction to advanced system-on-chip test design and optimization |
| title_exact_search_txtP | Introduction to advanced system-on-chip test design and optimization |
| title_full | Introduction to advanced system-on-chip test design and optimization by Erik Larsson |
| title_fullStr | Introduction to advanced system-on-chip test design and optimization by Erik Larsson |
| title_full_unstemmed | Introduction to advanced system-on-chip test design and optimization by Erik Larsson |
| title_short | Introduction to advanced system-on-chip test design and optimization |
| title_sort | introduction to advanced system on chip test design and optimization |
| topic | Systems on a chip Testing Integrated circuits Design and construction Fehlererkennung (DE-588)4133764-5 gnd Testen (DE-588)4367264-4 gnd Integrierte Schaltung (DE-588)4027242-4 gnd System-on-Chip (DE-588)4740357-3 gnd |
| topic_facet | Systems on a chip Testing Integrated circuits Design and construction Fehlererkennung Testen Integrierte Schaltung System-on-Chip |
| url | https://doi.org/10.1007/b135763 |
| volume_link | (DE-604)BV010836129 |
| work_keys_str_mv | AT larssonerik introductiontoadvancedsystemonchiptestdesignandoptimization |