Proceedings of the Fifth International Conference on LEEM PEEM: Himeji, Japan, 15 - 19 October 2006
Gespeichert in:
Körperschaft: | |
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Weitere Verfasser: | |
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2007
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Schriftenreihe: | Surface science
601,20 |
Schlagworte: | |
Beschreibung: | Einzelaufnahme eines Zeitschr.-Heftes |
Beschreibung: | XVI S., S. 4664 - 4773 Ill., graph. Darst. |
Internformat
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689 | 1 | |5 DE-604 | |
700 | 1 | |a Altman, Michael |4 edt | |
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Datensatz im Suchindex
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id | DE-604.BV022959482 |
illustrated | Illustrated |
index_date | 2024-07-02T19:04:09Z |
indexdate | 2024-07-09T21:08:36Z |
institution | BVB |
institution_GND | (DE-588)10188595-7 |
language | English |
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physical | XVI S., S. 4664 - 4773 Ill., graph. Darst. |
publishDate | 2007 |
publishDateSearch | 2007 |
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publisher | Elsevier |
record_format | marc |
series2 | Surface science |
spelling | International Conference on LEEM PEEM 5 2006 Himeji Verfasser (DE-588)10188595-7 aut Proceedings of the Fifth International Conference on LEEM PEEM Himeji, Japan, 15 - 19 October 2006 LEEM PEEM 5. Ed. by Michael Altman ... LEEM PEEM 5 LEEM PEEM Amsterdam [u.a.] Elsevier 2007 XVI S., S. 4664 - 4773 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Surface science 601,20 Einzelaufnahme eines Zeitschr.-Heftes Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Photoemissionselektronenmikroskopie (DE-588)4174495-0 gnd rswk-swf Niedrige Energie (DE-588)4356330-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2006 Himeji gnd-content Photoemissionselektronenmikroskopie (DE-588)4174495-0 s DE-604 Niedrige Energie (DE-588)4356330-2 s Elektronenmikroskopie (DE-588)4014327-2 s Altman, Michael edt |
spellingShingle | Proceedings of the Fifth International Conference on LEEM PEEM Himeji, Japan, 15 - 19 October 2006 Elektronenmikroskopie (DE-588)4014327-2 gnd Photoemissionselektronenmikroskopie (DE-588)4174495-0 gnd Niedrige Energie (DE-588)4356330-2 gnd |
subject_GND | (DE-588)4014327-2 (DE-588)4174495-0 (DE-588)4356330-2 (DE-588)1071861417 |
title | Proceedings of the Fifth International Conference on LEEM PEEM Himeji, Japan, 15 - 19 October 2006 |
title_alt | LEEM PEEM 5 LEEM PEEM |
title_auth | Proceedings of the Fifth International Conference on LEEM PEEM Himeji, Japan, 15 - 19 October 2006 |
title_exact_search | Proceedings of the Fifth International Conference on LEEM PEEM Himeji, Japan, 15 - 19 October 2006 |
title_exact_search_txtP | Proceedings of the Fifth International Conference on LEEM PEEM Himeji, Japan, 15 - 19 October 2006 |
title_full | Proceedings of the Fifth International Conference on LEEM PEEM Himeji, Japan, 15 - 19 October 2006 LEEM PEEM 5. Ed. by Michael Altman ... |
title_fullStr | Proceedings of the Fifth International Conference on LEEM PEEM Himeji, Japan, 15 - 19 October 2006 LEEM PEEM 5. Ed. by Michael Altman ... |
title_full_unstemmed | Proceedings of the Fifth International Conference on LEEM PEEM Himeji, Japan, 15 - 19 October 2006 LEEM PEEM 5. Ed. by Michael Altman ... |
title_short | Proceedings of the Fifth International Conference on LEEM PEEM |
title_sort | proceedings of the fifth international conference on leem peem himeji japan 15 19 october 2006 |
title_sub | Himeji, Japan, 15 - 19 October 2006 |
topic | Elektronenmikroskopie (DE-588)4014327-2 gnd Photoemissionselektronenmikroskopie (DE-588)4174495-0 gnd Niedrige Energie (DE-588)4356330-2 gnd |
topic_facet | Elektronenmikroskopie Photoemissionselektronenmikroskopie Niedrige Energie Konferenzschrift 2006 Himeji |
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