Physical principles of electron microscopy: an introduction to TEM, SEM, and AEM
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York, NY
Springer
2007
|
| Edition: | [2. print.] |
| Subjects: | |
| Online Access: | Inhaltstext |
| Physical Description: | XII, 202 S. Ill., graph. Darst. |
| ISBN: | 9780387258003 |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV022948792 | ||
| 003 | DE-604 | ||
| 005 | 20080721 | ||
| 007 | t | ||
| 008 | 071107s2007 gw ad|| |||| 00||| eng d | ||
| 020 | |a 9780387258003 |c Gb. : EUR 58.80, sfr 97.50 |9 978-0-387-25800-3 | ||
| 024 | 3 | |a 9780387258003 | |
| 035 | |a (OCoLC)171027618 | ||
| 035 | |a (DE-599)BVBBV022948792 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c XA-DE-BE | ||
| 049 | |a DE-19 |a DE-706 |a DE-91G |a DE-898 | ||
| 050 | 0 | |a QH212.E4 | |
| 082 | 1 | |a 502 |2 14 | |
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a WC 3100 |0 (DE-625)148081: |2 rvk | ||
| 084 | |a PHY 135f |2 stub | ||
| 084 | |a CHE 264f |2 stub | ||
| 084 | |a 530 |2 sdnb | ||
| 100 | 1 | |a Egerton, Ray F. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Physical principles of electron microscopy |b an introduction to TEM, SEM, and AEM |c Ray F. Egerton |
| 250 | |a [2. print.] | ||
| 264 | 1 | |a New York, NY |b Springer |c 2007 | |
| 300 | |a XII, 202 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Electron microscopy | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 856 | 4 | 2 | |q text/html |u http://deposit.dnb.de/cgi-bin/dokserv?id=2738011&prov=M&dok_var=1&dok_ext=htm |3 Inhaltstext |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-016153308 | ||
Record in the Search Index
| _version_ | 1804137191005224960 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Egerton, Ray F. |
| author_facet | Egerton, Ray F. |
| author_role | aut |
| author_sort | Egerton, Ray F. |
| author_variant | r f e rf rfe |
| building | Verbundindex |
| bvnumber | BV022948792 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.E4 |
| callnumber-search | QH212.E4 |
| callnumber-sort | QH 3212 E4 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 6300 WC 3100 |
| classification_tum | PHY 135f CHE 264f |
| ctrlnum | (OCoLC)171027618 (DE-599)BVBBV022948792 |
| dewey-full | 502 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502 |
| dewey-search | 502 |
| dewey-sort | 3502 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik Biologie Chemie |
| discipline_str_mv | Allgemeine Naturwissenschaft Physik Biologie Chemie |
| edition | [2. print.] |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01440nam a2200433 c 4500</leader><controlfield tag="001">BV022948792</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20080721 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">071107s2007 gw ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780387258003</subfield><subfield code="c">Gb. : EUR 58.80, sfr 97.50</subfield><subfield code="9">978-0-387-25800-3</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9780387258003</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)171027618</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV022948792</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-19</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-91G</subfield><subfield code="a">DE-898</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QH212.E4</subfield></datafield><datafield tag="082" ind1="1" ind2=" "><subfield code="a">502</subfield><subfield code="2">14</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">WC 3100</subfield><subfield code="0">(DE-625)148081:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 135f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">CHE 264f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">530</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Egerton, Ray F.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Physical principles of electron microscopy</subfield><subfield code="b">an introduction to TEM, SEM, and AEM</subfield><subfield code="c">Ray F. Egerton</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">[2. print.]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Springer</subfield><subfield code="c">2007</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 202 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="q">text/html</subfield><subfield code="u">http://deposit.dnb.de/cgi-bin/dokserv?id=2738011&prov=M&dok_var=1&dok_ext=htm</subfield><subfield code="3">Inhaltstext</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-016153308</subfield></datafield></record></collection> |
| id | DE-604.BV022948792 |
| illustrated | Illustrated |
| index_date | 2024-07-02T19:01:14Z |
| indexdate | 2024-07-09T21:08:22Z |
| institution | BVB |
| isbn | 9780387258003 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016153308 |
| oclc_num | 171027618 |
| open_access_boolean | |
| owner | DE-19 DE-BY-UBM DE-706 DE-91G DE-BY-TUM DE-898 DE-BY-UBR |
| owner_facet | DE-19 DE-BY-UBM DE-706 DE-91G DE-BY-TUM DE-898 DE-BY-UBR |
| physical | XII, 202 S. Ill., graph. Darst. |
| publishDate | 2007 |
| publishDateSearch | 2007 |
| publishDateSort | 2007 |
| publisher | Springer |
| record_format | marc |
| spelling | Egerton, Ray F. Verfasser aut Physical principles of electron microscopy an introduction to TEM, SEM, and AEM Ray F. Egerton [2. print.] New York, NY Springer 2007 XII, 202 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 text/html http://deposit.dnb.de/cgi-bin/dokserv?id=2738011&prov=M&dok_var=1&dok_ext=htm Inhaltstext |
| spellingShingle | Egerton, Ray F. Physical principles of electron microscopy an introduction to TEM, SEM, and AEM Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM |
| title_auth | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM |
| title_exact_search | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM |
| title_exact_search_txtP | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM |
| title_full | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM Ray F. Egerton |
| title_fullStr | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM Ray F. Egerton |
| title_full_unstemmed | Physical principles of electron microscopy an introduction to TEM, SEM, and AEM Ray F. Egerton |
| title_short | Physical principles of electron microscopy |
| title_sort | physical principles of electron microscopy an introduction to tem sem and aem |
| title_sub | an introduction to TEM, SEM, and AEM |
| topic | Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Electron microscopy Elektronenmikroskopie |
| url | http://deposit.dnb.de/cgi-bin/dokserv?id=2738011&prov=M&dok_var=1&dok_ext=htm |
| work_keys_str_mv | AT egertonrayf physicalprinciplesofelectronmicroscopyanintroductiontotemsemandaem |