Polymer microscopy:
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| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
London [u.a.]
Springer
2008
|
| Edition: | 3. ed. |
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | XIV, 540 S. Ill., graph. Darst. |
| ISBN: | 9780387726274 9780387726281 0387726276 |
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MARC
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| 100 | 1 | |a Sawyer, Linda C. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Polymer microscopy |c Linda C. Sawyer, David T. Grubb, Gregory F. Meyers |
| 250 | |a 3. ed. | ||
| 264 | 1 | |a London [u.a.] |b Springer |c 2008 | |
| 300 | |a XIV, 540 S. |b Ill., graph. Darst. | ||
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Record in the Search Index
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| adam_text | Contents
Color plates appear between pages 306 and 307.
Preface to the Third Edition v
1 Introduction to Polymer Morphology 1
1.1 POLYMER MATERIALS 1
1.1.1 Introduction 1
1.1.2 Definitions 2
1.2 POLYMER MORPHOLOGY 3
1.2.1 Amorphous Polymers 4
1.2.2 Semicrystalline Polymers 5
1.2.3 Liquid Crystalline Polymers 7
1.2.4 Multiphase Polymers 8
1.2.5 Composites 8
1.3 POLYMER PROCESSES 8
1.3.1 Fiber and Film Formation 9
1.3.2 Extrudates and Moldings 11
1.4 POLYMER CHARACTERIZATION 17
1.4.1 General Techniques 17
1.4.2 Microscopy Techniques 18
1.4.3 Specimen Preparation Methods 19
1.4.4 Applications of Microscopy to Polymers 20
1.4.5 Emerging Microscopy Techniques 21
References 21
2 Fundamentals of Microscopy 27
2.1 INTRODUCTION 28
2.1.1 Lens-Imaging Microscopes 29
2.1.2 Scanning-Imaging Microscopes 30
2.2 OPTICAL MICROSCOPY 31
2.2.1 Introduction 31
2.2.2 Objective Lenses 32
2.2.3 Imaging Modes 32
2.2.4 Measurement of Refractive Index 34
2.2.5 Polarizing Microscopy 34
x Contents
2.3 SCANNING ELECTRON MICROSCOPY 35
2.3.1 Introduction 35
2.3.2 Imaging Signals 37
2.3.3 Electron Sources 39
2.3.4 SEM Types 41
2.3.5 SEM Optimization 41
2.4 TRANSMISSION ELECTRON MICROSCOPY 42
2.4.1 Conventional TEM 42
2.4.2 Scanning TEM 43
2.4.3 Electron Diffraction 44
2.4.4 High Resolution Electron Microscopy 45
2.5 SCANNING PROBE MICROSCOPY 45
2.5.1 Introduction 45
2.5.2 Atomic Force Microscopy 47
2.5.3 SPM Probes 50
2.6 RADIATION SENSITIVE MATERIALS 51
2.6.1 SEM Operation 52
2.6.2 Low Dose TEM Operation 52
2.7 ANALYTICAL MICROSCOPY 53
2.7.1 X-ray Microanalysis 53
2.7.2 X-ray Analysis: SEM versus AEM 55
2.7.3 Elemental Mapping 55
2.8 QUANTITATIVE MICROSCOPY 56
2.8.1 Image Processing and Analysis 56
2.8.2 Three Dimensional Reconstruction 57
2.8.3 Calibration 57
2.9 DYNAMIC MICROSCOPY 59
2.9.1 Mechanical Deformation Stages 59
2.9.2 Hot and Cold Stages 60
References 60
3 Image Formation in the Microscope 67
3.1 IMAGING WITH LENSES 68
3.1.1 Basic Optics 68
3.1.2 Diffraction 68
3.1.3 Image Formation 71
3.1.4 Resolution and Contrast 72
3.1.5 Phase Contrast and Lattice Imaging 76
3.1.6 Illumination Systems 78
3.1.7 Polarized Light 80
3.2 IMAGING BY SCANNING ELECTRON BEAM 85
3.2.1 Probe Formation 85
3.2.2 Probe-Specimen Interactions 88
3.2.3 Image Formation in the SEM 92
3.2.4 Low Voltage SEM 94
3.2.5 Variable Pressure SEM 96
3.3 IMAGING IN THE ATOMIC FORCE MICROSCOPE 97
33.1 Microscope Components 97
33.2 Probe-Specimen Interaction 100
Contents xi
3.3.3 Contact Mode AFM 102
3.3.4 Intermittent Contact AFM 105
3.3.5 Noncontact AFM 112
3.3.6 Practical Considerations for AFM Imaging 113
3.3.7 Artifacts in SPM Imaging 114
3.4 SPECIMEN DAMAGE IN THE MICROSCOPE 118
3.4.1 Effect of Radiation on Polymers 118
3.4.2 Radiation Doses and Specimen Heating 120
3.4.3 Effects of Radiation Damage on the Image 121
3.4.4 Noise Limited Resolution 123
References 124
4 Specimen Preparation Methods 130
4.1 SIMPLE PREPARATION METHODS 132
4.1.1 Optical Preparations 132
4.1.2 SEM Preparations 133
4.1.3 TEM Preparations 133
4.1.4 SPM Preparations 140
4.2 POLISHING 142
4.2.1 Limiting Artifacts 142
4.2.2 Polishing Specimen Surfaces 143
4.3 MICROTOMY 146
4.3.1 Peelback of Fibers/Films for SEM 146
4.3.2 Microtomy for OM 147
4.3.3 Microtomy for SEM 150
4.3.4 Microtomy for TEM and SPM 150
4.3.5 Cryomicrotomy for TEM and SPM 154
4.3.6 Microtomy for SPM 158
4.3.7 Limiting Artifacts in Microtomy 160
4.4 STAINING 160
4.4.1 Introduction 160
4.4.2 Osmium Tetroxide 162
4.4.3 Ruthenium Tetroxide 166
4.4.4 Chlorosulfonic Acid and Uranyl Acetate 173
4.4.5 Phosphotungstic Acid 175
4.4.6 Ebonite 177
4.4.7 Silver Sulfide 178
4.4.8 Mercuric Trifluoroacetate 178
4.4.9 Iodine and Bromine 179
4.4.10 Summary 179
4.5 ETCHING 181
4.5.1 Solvent and Chemical Etching 181
4.5.2 Acid Etching: Overview 183
4.5.3 Permanganate Etching 184
4.5.4 Plasma and Ion Etching 188
4.5.5 Focused Ion Beam Etching 194
4.5.6 Summary 195
4.6 REPLICATION 196
4.6.1 Simple Replicas 197
4.6.2 Replication for TEM 198
xii Contents
4.7 CONDUCTIVE COATINGS 201
4.7.1 Coating Devices 202
4.7.2 Coatings for TEM 203
4.7.3 Coatings for SEM and STM 203
4.7.4 Artifacts 207
4.7.5 Gold Decoration 211
4.8 YIELDING AND FRACTURE 212
4.8.1 Fractography 212
4.8.2 Fracture: Standard Physical Testing 213
4.8.3 Crazing 217
4.8.4 In Situ Deformation 221
4.9 CRYOGENIC AND DRYING METHODS 226
4.9.1 Simple Freezing Methods 226
4.9.2 Freeze Drying 227
4.9.3 Critical Point Drying 230
4.9.4 Freeze Fracture-Etching 231
4.9.5 Cryomicroscopy 232
References 234
5 Applications of Microscopy to Polymers 248
5.1 FIBERS 250
5.1.1 Introduction 250
5.1.2 Textile Fibers 251
5.1.3 Problem Solving Applications 260
5.1.4 Industrial Fibers 267
5.1.5 High Performance Fibers 270
5.2 FILMS AND MEMBRANES 276
5.2.1 Introduction 276
5.2.2 Model Studies 278
5.2.3 Industrial Films 282
5.2.4 Flat Film Membranes 294
5.2.5 Hollow Fiber Membranes 305
5.3 ENGINEERING RESINS AND PLASTICS 308
5.3.1 Introduction 308
5.3.2 Process-Structure Considerations 311
5.3.3 Single Phase Polymers 316
5.3.4 Multiphase Polymers 321
5.3.5 Failure or Competitive Analysis 349
5.4 COMPOSITES 354
5.4.1 Introduction 354
5.4.2 Literature Review 355
5.4.3 Composite Characterization 357
5.4.4 Carbon and Graphite Fiber Composites 365
5.4.5 Particle Filled Composites 366
5.4.6 Nanocomposites 370
5.5 EMULSIONS, COATINGS AND ADHESIVES 380
5.5.1 Introduction 380
5.5.2 Emulsions and Latexes 381
5.5.3 Particle Size Measurements 385
Contents xiii
5.5.4 Adhesives and Adhesion 386
5.5.5 Wettability and Coatings 388
5.6 HIGH PERFORMANCE POLYMERS 398
5.6.1 Introduction 398
5.6.2 Microstructure of LCPs 400
5.6.3 Molded Parts and Extrudates 403
5.6.4 High Modulus Fibers 409
5.6.5 Structure-Property Relations in LCPs 412
References 418
6 Emerging Techniques in Polymer Microscopy 435
6.1 INTRODUCTION 435
6.2 OPTICAL AND ELECTRON MICROSCOPY 436
6.2.1 Confocal Scanning Microscopy 436
6.2.2 Optical Profilometry 437
6.2.3 Birefringence Imaging 438
6.2.4 Aberration Corrected Electron Microscopy 438
6.2.5 Ion Microscopy 440
6.3 SCANNING PROBE MICROSCOPY 441
6.3.1 Chemical Force Microscopy 441
6.3.2 Harmonic Imaging 443
6.3.3 Fast Scanning SPM 444
6.3.4 Scanning Thermal Microscopy 445
6.3.5 Near Field Scanning Optical Microscopy 449
6.3.6 Automated SPM 449
6.4 THREE DIMENSIONAL IMAGING 451
6.4.1 Introduction 451
6.4.2 Physical Sectioning 452
6.4.3 Optical Sectioning 454
6.4.4 Tomography 455
6.5 ANALYTICAL IMAGING 459
6.5.1 FTIR Microscopy 459
6.5.2 Raman Microscopy 460
6.5.3 Electron Energy Loss Microscopy 461
6.5.4 X-ray Microscopy 462
6.5.5 Imaging Surface Analysis 464
References 468
7 Problem Solving Summary 478
7.1 WHERE TO START 479
7.1.1 Problem Solving Protocol 479
7.1.2 Polymer Structures 480
7.2 INSTRUMENTAL TECHNIQUES 480
7.2.1 Comparison of Techniques 480
7.2.2 Optical Techniques 484
7.2.3 SEM Techniques 485
7.2.4 TEM Techniques 486
7.2.5 SPM Techniques 487
7.2.6 Technique Selection 487
xiv Contents
7.3 INTERPRETATION 488
7.3.1 Artifacts 489
7.3.2 Summary 492
7.4 SUPPORTING CHARACTERIZATIONS 492
7.4.1 X-ray Diffraction 493
7.4.2 Thermal Analysis 495
7.4.3 Spectroscopy 496
7.4.4 Small Angle Scattering 499
7.4.5 Summary 500
References 501
Appendices 505
Appendix I Abbreviation of Polymer Names 505
Appendix II Acronyms of Techniques 506
Appendix III Manmade Polymer Fibers 507
Appendix IV Common Commercial Polymers and
Trade Names for Plastics, Films, and
Engineering Resins 508
Appendix V General Suppliers of Microscopy
Accessories 510
Appendix VI Suppliers of Optical and Electron
Microscopes, Microanalysis Equipment,
Image Analysis and Processing 512
Appendix VII Suppliers of Scanning Probe Microscopes
and Related Supplies 513
Index 515
|
| adam_txt |
Contents
Color plates appear between pages 306 and 307.
Preface to the Third Edition v
1 Introduction to Polymer Morphology 1
1.1 POLYMER MATERIALS 1
1.1.1 Introduction 1
1.1.2 Definitions 2
1.2 POLYMER MORPHOLOGY 3
1.2.1 Amorphous Polymers 4
1.2.2 Semicrystalline Polymers 5
1.2.3 Liquid Crystalline Polymers 7
1.2.4 Multiphase Polymers 8
1.2.5 Composites 8
1.3 POLYMER PROCESSES 8
1.3.1 Fiber and Film Formation 9
1.3.2 Extrudates and Moldings 11
1.4 POLYMER CHARACTERIZATION 17
1.4.1 General Techniques 17
1.4.2 Microscopy Techniques 18
1.4.3 Specimen Preparation Methods 19
1.4.4 Applications of Microscopy to Polymers 20
1.4.5 Emerging Microscopy Techniques 21
References 21
2 Fundamentals of Microscopy 27
2.1 INTRODUCTION 28
2.1.1 Lens-Imaging Microscopes 29
2.1.2 Scanning-Imaging Microscopes 30
2.2 OPTICAL MICROSCOPY 31
2.2.1 Introduction 31
2.2.2 Objective Lenses 32
2.2.3 Imaging Modes 32
2.2.4 Measurement of Refractive Index 34
2.2.5 Polarizing Microscopy 34
x Contents
2.3 SCANNING ELECTRON MICROSCOPY 35
2.3.1 Introduction 35
2.3.2 Imaging Signals 37
2.3.3 Electron Sources 39
2.3.4 SEM Types 41
2.3.5 SEM Optimization 41
2.4 TRANSMISSION ELECTRON MICROSCOPY 42
2.4.1 Conventional TEM 42
2.4.2 Scanning TEM 43
2.4.3 Electron Diffraction 44
2.4.4 High Resolution Electron Microscopy 45
2.5 SCANNING PROBE MICROSCOPY 45
2.5.1 Introduction 45
2.5.2 Atomic Force Microscopy 47
2.5.3 SPM Probes 50
2.6 RADIATION SENSITIVE MATERIALS 51
2.6.1 SEM Operation 52
2.6.2 Low Dose TEM Operation 52
2.7 ANALYTICAL MICROSCOPY 53
2.7.1 X-ray Microanalysis 53
2.7.2 X-ray Analysis: SEM versus AEM 55
2.7.3 Elemental Mapping 55
2.8 QUANTITATIVE MICROSCOPY 56
2.8.1 Image Processing and Analysis 56
2.8.2 Three Dimensional Reconstruction 57
2.8.3 Calibration 57
2.9 DYNAMIC MICROSCOPY 59
2.9.1 Mechanical Deformation Stages 59
2.9.2 Hot and Cold Stages 60
References 60
3 Image Formation in the Microscope 67
3.1 IMAGING WITH LENSES 68
3.1.1 Basic Optics 68
3.1.2 Diffraction 68
3.1.3 Image Formation 71
3.1.4 Resolution and Contrast 72
3.1.5 Phase Contrast and Lattice Imaging 76
3.1.6 Illumination Systems 78
3.1.7 Polarized Light 80
3.2 IMAGING BY SCANNING ELECTRON BEAM 85
3.2.1 Probe Formation 85
3.2.2 Probe-Specimen Interactions 88
3.2.3 Image Formation in the SEM 92
3.2.4 Low Voltage SEM 94
3.2.5 Variable Pressure SEM 96
3.3 IMAGING IN THE ATOMIC FORCE MICROSCOPE 97
33.1 Microscope Components 97
33.2 Probe-Specimen Interaction 100
Contents xi
3.3.3 Contact Mode AFM 102
3.3.4 Intermittent Contact AFM 105
3.3.5 Noncontact AFM 112
3.3.6 Practical Considerations for AFM Imaging 113
3.3.7 Artifacts in SPM Imaging 114
3.4 SPECIMEN DAMAGE IN THE MICROSCOPE 118
3.4.1 Effect of Radiation on Polymers 118
3.4.2 Radiation Doses and Specimen Heating 120
3.4.3 Effects of Radiation Damage on the Image 121
3.4.4 Noise Limited Resolution 123
References 124
4 Specimen Preparation Methods 130
4.1 SIMPLE PREPARATION METHODS 132
4.1.1 Optical Preparations 132
4.1.2 SEM Preparations 133
4.1.3 TEM Preparations 133
4.1.4 SPM Preparations 140
4.2 POLISHING 142
4.2.1 Limiting Artifacts 142
4.2.2 Polishing Specimen Surfaces 143
4.3 MICROTOMY 146
4.3.1 Peelback of Fibers/Films for SEM 146
4.3.2 Microtomy for OM 147
4.3.3 Microtomy for SEM 150
4.3.4 Microtomy for TEM and SPM 150
4.3.5 Cryomicrotomy for TEM and SPM 154
4.3.6 Microtomy for SPM 158
4.3.7 Limiting Artifacts in Microtomy 160
4.4 STAINING 160
4.4.1 Introduction 160
4.4.2 Osmium Tetroxide 162
4.4.3 Ruthenium Tetroxide 166
4.4.4 Chlorosulfonic Acid and Uranyl Acetate 173
4.4.5 Phosphotungstic Acid 175
4.4.6 Ebonite 177
4.4.7 Silver Sulfide 178
4.4.8 Mercuric Trifluoroacetate 178
4.4.9 Iodine and Bromine 179
4.4.10 Summary 179
4.5 ETCHING 181
4.5.1 Solvent and Chemical Etching 181
4.5.2 Acid Etching: Overview 183
4.5.3 Permanganate Etching 184
4.5.4 Plasma and Ion Etching 188
4.5.5 Focused Ion Beam Etching 194
4.5.6 Summary 195
4.6 REPLICATION 196
4.6.1 Simple Replicas 197
4.6.2 Replication for TEM 198
xii Contents
4.7 CONDUCTIVE COATINGS 201
4.7.1 Coating Devices 202
4.7.2 Coatings for TEM 203
4.7.3 Coatings for SEM and STM 203
4.7.4 Artifacts 207
4.7.5 Gold Decoration 211
4.8 YIELDING AND FRACTURE 212
4.8.1 Fractography 212
4.8.2 Fracture: Standard Physical Testing 213
4.8.3 Crazing 217
4.8.4 In Situ Deformation 221
4.9 CRYOGENIC AND DRYING METHODS 226
4.9.1 Simple Freezing Methods 226
4.9.2 Freeze Drying 227
4.9.3 Critical Point Drying 230
4.9.4 Freeze Fracture-Etching 231
4.9.5 Cryomicroscopy 232
References 234
5 Applications of Microscopy to Polymers 248
5.1 FIBERS 250
5.1.1 Introduction 250
5.1.2 Textile Fibers 251
5.1.3 Problem Solving Applications 260
5.1.4 Industrial Fibers 267
5.1.5 High Performance Fibers 270
5.2 FILMS AND MEMBRANES 276
5.2.1 Introduction 276
5.2.2 Model Studies 278
5.2.3 Industrial Films 282
5.2.4 Flat Film Membranes 294
5.2.5 Hollow Fiber Membranes 305
5.3 ENGINEERING RESINS AND PLASTICS 308
5.3.1 Introduction 308
5.3.2 Process-Structure Considerations 311
5.3.3 Single Phase Polymers 316
5.3.4 Multiphase Polymers 321
5.3.5 Failure or Competitive Analysis 349
5.4 COMPOSITES 354
5.4.1 Introduction 354
5.4.2 Literature Review 355
5.4.3 Composite Characterization 357
5.4.4 Carbon and Graphite Fiber Composites 365
5.4.5 Particle Filled Composites 366
5.4.6 Nanocomposites 370
5.5 EMULSIONS, COATINGS AND ADHESIVES 380
5.5.1 Introduction 380
5.5.2 Emulsions and Latexes 381
5.5.3 Particle Size Measurements 385
Contents xiii
5.5.4 Adhesives and Adhesion 386
5.5.5 Wettability and Coatings 388
5.6 HIGH PERFORMANCE POLYMERS 398
5.6.1 Introduction 398
5.6.2 Microstructure of LCPs 400
5.6.3 Molded Parts and Extrudates 403
5.6.4 High Modulus Fibers 409
5.6.5 Structure-Property Relations in LCPs 412
References 418
6 Emerging Techniques in Polymer Microscopy 435
6.1 INTRODUCTION 435
6.2 OPTICAL AND ELECTRON MICROSCOPY 436
6.2.1 Confocal Scanning Microscopy 436
6.2.2 Optical Profilometry 437
6.2.3 Birefringence Imaging 438
6.2.4 Aberration Corrected Electron Microscopy 438
6.2.5 Ion Microscopy 440
6.3 SCANNING PROBE MICROSCOPY 441
6.3.1 Chemical Force Microscopy 441
6.3.2 Harmonic Imaging 443
6.3.3 Fast Scanning SPM 444
6.3.4 Scanning Thermal Microscopy 445
6.3.5 Near Field Scanning Optical Microscopy 449
6.3.6 Automated SPM 449
6.4 THREE DIMENSIONAL IMAGING 451
6.4.1 Introduction 451
6.4.2 Physical Sectioning 452
6.4.3 Optical Sectioning 454
6.4.4 Tomography 455
6.5 ANALYTICAL IMAGING 459
6.5.1 FTIR Microscopy 459
6.5.2 Raman Microscopy 460
6.5.3 Electron Energy Loss Microscopy 461
6.5.4 X-ray Microscopy 462
6.5.5 Imaging Surface Analysis 464
References 468
7 Problem Solving Summary 478
7.1 WHERE TO START 479
7.1.1 Problem Solving Protocol 479
7.1.2 Polymer Structures 480
7.2 INSTRUMENTAL TECHNIQUES 480
7.2.1 Comparison of Techniques 480
7.2.2 Optical Techniques 484
7.2.3 SEM Techniques 485
7.2.4 TEM Techniques 486
7.2.5 SPM Techniques 487
7.2.6 Technique Selection 487
xiv Contents
7.3 INTERPRETATION 488
7.3.1 Artifacts 489
7.3.2 Summary 492
7.4 SUPPORTING CHARACTERIZATIONS 492
7.4.1 X-ray Diffraction 493
7.4.2 Thermal Analysis 495
7.4.3 Spectroscopy 496
7.4.4 Small Angle Scattering 499
7.4.5 Summary 500
References 501
Appendices 505
Appendix I Abbreviation of Polymer Names 505
Appendix II Acronyms of Techniques 506
Appendix III Manmade Polymer Fibers 507
Appendix IV Common Commercial Polymers and
Trade Names for Plastics, Films, and
Engineering Resins 508
Appendix V General Suppliers of Microscopy
Accessories 510
Appendix VI Suppliers of Optical and Electron
Microscopes, Microanalysis Equipment,
Image Analysis and Processing 512
Appendix VII Suppliers of Scanning Probe Microscopes
and Related Supplies 513
Index 515 |
| any_adam_object | 1 |
| any_adam_object_boolean | 1 |
| author | Sawyer, Linda C. Grubb, David T. |
| author_facet | Sawyer, Linda C. Grubb, David T. |
| author_role | aut aut |
| author_sort | Sawyer, Linda C. |
| author_variant | l c s lc lcs d t g dt dtg |
| building | Verbundindex |
| bvnumber | BV022881666 |
| classification_rvk | UV 5400 ZM 3700 ZM 5100 |
| classification_tum | WER 550f WER 089f |
| ctrlnum | (OCoLC)255665556 (DE-599)DNB983877467 |
| discipline | Physik Werkstoffwissenschaften Werkstoffwissenschaften / Fertigungstechnik |
| discipline_str_mv | Physik Werkstoffwissenschaften Werkstoffwissenschaften / Fertigungstechnik |
| edition | 3. ed. |
| format | Book |
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| id | DE-604.BV022881666 |
| illustrated | Illustrated |
| index_date | 2024-07-02T18:50:42Z |
| indexdate | 2024-07-09T21:07:39Z |
| institution | BVB |
| isbn | 9780387726274 9780387726281 0387726276 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016086632 |
| oclc_num | 255665556 |
| open_access_boolean | |
| owner | DE-703 DE-91G DE-BY-TUM DE-11 DE-29T |
| owner_facet | DE-703 DE-91G DE-BY-TUM DE-11 DE-29T |
| physical | XIV, 540 S. Ill., graph. Darst. |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Springer |
| record_format | marc |
| spelling | Sawyer, Linda C. Verfasser aut Polymer microscopy Linda C. Sawyer, David T. Grubb, Gregory F. Meyers 3. ed. London [u.a.] Springer 2008 XIV, 540 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Polymere (DE-588)4046699-1 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Polymere (DE-588)4046699-1 s Mikroskopie (DE-588)4039238-7 s DE-604 Grubb, David T. Verfasser aut Meyers, Gregory F. Sonstige oth HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016086632&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Sawyer, Linda C. Grubb, David T. Polymer microscopy Polymere (DE-588)4046699-1 gnd Mikroskopie (DE-588)4039238-7 gnd |
| subject_GND | (DE-588)4046699-1 (DE-588)4039238-7 |
| title | Polymer microscopy |
| title_auth | Polymer microscopy |
| title_exact_search | Polymer microscopy |
| title_exact_search_txtP | Polymer microscopy |
| title_full | Polymer microscopy Linda C. Sawyer, David T. Grubb, Gregory F. Meyers |
| title_fullStr | Polymer microscopy Linda C. Sawyer, David T. Grubb, Gregory F. Meyers |
| title_full_unstemmed | Polymer microscopy Linda C. Sawyer, David T. Grubb, Gregory F. Meyers |
| title_short | Polymer microscopy |
| title_sort | polymer microscopy |
| topic | Polymere (DE-588)4046699-1 gnd Mikroskopie (DE-588)4039238-7 gnd |
| topic_facet | Polymere Mikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016086632&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT sawyerlindac polymermicroscopy AT grubbdavidt polymermicroscopy AT meyersgregoryf polymermicroscopy |