Latchup:
080115
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Chichester
Wiley
2007
|
| Schlagworte: | |
| Zusammenfassung: | 080115 |
| Beschreibung: | XXII, 450 S. Ill., graph. Darst. |
| ISBN: | 0470016426 9780470016428 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV022553454 | ||
| 003 | DE-604 | ||
| 005 | 20080819 | ||
| 007 | t | ||
| 008 | 070810s2007 ad|| |||| 00||| eng d | ||
| 020 | |a 0470016426 |c (hbk.) : £70.00 |9 0-470-01642-6 | ||
| 020 | |a 9780470016428 |c (hbk.) : £70.00 |9 978-0-470-01642-8 | ||
| 035 | |a (OCoLC)175286373 | ||
| 035 | |a (DE-599)GBV529544849 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 |a DE-29T | ||
| 050 | 0 | |a TK7871.99.M44 | |
| 082 | 0 | |a 621.3815/2 |2 22 | |
| 084 | |a ZN 4960 |0 (DE-625)157426: |2 rvk | ||
| 100 | 1 | |a Voldman, Steven H. |e Verfasser |0 (DE-588)1046025996 |4 aut | |
| 245 | 1 | 0 | |a Latchup |c Steven H. Voldman |
| 264 | 1 | |a Chichester |b Wiley |c 2007 | |
| 300 | |a XXII, 450 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 520 | 1 | |a 080115 | |
| 650 | 4 | |a Metal oxide semiconductors, Complementary |x Defects | |
| 650 | 4 | |a Metal oxide semiconductors, Complementary |x Reliability | |
| 650 | 0 | 7 | |a CMOS-Schaltung |0 (DE-588)4148111-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Latch-up-Effekt |0 (DE-588)4254228-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Latch-up-Effekt |0 (DE-588)4254228-5 |D s |
| 689 | 0 | 1 | |a CMOS-Schaltung |0 (DE-588)4148111-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015759739 | ||
Datensatz im Suchindex
| _version_ | 1804136672234831872 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Voldman, Steven H. |
| author_GND | (DE-588)1046025996 |
| author_facet | Voldman, Steven H. |
| author_role | aut |
| author_sort | Voldman, Steven H. |
| author_variant | s h v sh shv |
| building | Verbundindex |
| bvnumber | BV022553454 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.99.M44 |
| callnumber-search | TK7871.99.M44 |
| callnumber-sort | TK 47871.99 M44 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4960 |
| ctrlnum | (OCoLC)175286373 (DE-599)GBV529544849 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01324nam a2200397 c 4500</leader><controlfield tag="001">BV022553454</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20080819 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">070810s2007 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0470016426</subfield><subfield code="c">(hbk.) : £70.00</subfield><subfield code="9">0-470-01642-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780470016428</subfield><subfield code="c">(hbk.) : £70.00</subfield><subfield code="9">978-0-470-01642-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)175286373</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBV529544849</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.99.M44</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/2</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4960</subfield><subfield code="0">(DE-625)157426:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Voldman, Steven H.</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1046025996</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Latchup</subfield><subfield code="c">Steven H. Voldman</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Chichester</subfield><subfield code="b">Wiley</subfield><subfield code="c">2007</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXII, 450 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1="1" ind2=" "><subfield code="a">080115</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Metal oxide semiconductors, Complementary</subfield><subfield code="x">Defects</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Metal oxide semiconductors, Complementary</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">CMOS-Schaltung</subfield><subfield code="0">(DE-588)4148111-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Latch-up-Effekt</subfield><subfield code="0">(DE-588)4254228-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Latch-up-Effekt</subfield><subfield code="0">(DE-588)4254228-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">CMOS-Schaltung</subfield><subfield code="0">(DE-588)4148111-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015759739</subfield></datafield></record></collection> |
| id | DE-604.BV022553454 |
| illustrated | Illustrated |
| index_date | 2024-07-02T18:14:20Z |
| indexdate | 2024-07-09T21:00:07Z |
| institution | BVB |
| isbn | 0470016426 9780470016428 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015759739 |
| oclc_num | 175286373 |
| open_access_boolean | |
| owner | DE-703 DE-29T |
| owner_facet | DE-703 DE-29T |
| physical | XXII, 450 S. Ill., graph. Darst. |
| publishDate | 2007 |
| publishDateSearch | 2007 |
| publishDateSort | 2007 |
| publisher | Wiley |
| record_format | marc |
| spelling | Voldman, Steven H. Verfasser (DE-588)1046025996 aut Latchup Steven H. Voldman Chichester Wiley 2007 XXII, 450 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier 080115 Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability CMOS-Schaltung (DE-588)4148111-2 gnd rswk-swf Latch-up-Effekt (DE-588)4254228-5 gnd rswk-swf Latch-up-Effekt (DE-588)4254228-5 s CMOS-Schaltung (DE-588)4148111-2 s DE-604 |
| spellingShingle | Voldman, Steven H. Latchup Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability CMOS-Schaltung (DE-588)4148111-2 gnd Latch-up-Effekt (DE-588)4254228-5 gnd |
| subject_GND | (DE-588)4148111-2 (DE-588)4254228-5 |
| title | Latchup |
| title_auth | Latchup |
| title_exact_search | Latchup |
| title_exact_search_txtP | Latchup |
| title_full | Latchup Steven H. Voldman |
| title_fullStr | Latchup Steven H. Voldman |
| title_full_unstemmed | Latchup Steven H. Voldman |
| title_short | Latchup |
| title_sort | latchup |
| topic | Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability CMOS-Schaltung (DE-588)4148111-2 gnd Latch-up-Effekt (DE-588)4254228-5 gnd |
| topic_facet | Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability CMOS-Schaltung Latch-up-Effekt |
| work_keys_str_mv | AT voldmanstevenh latchup |